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book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
Number of records 1, displaying
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keyword
103
1.
RISC processor testing
2.
RISC-V Processor
3.
processor core testing
4.
processor testing
5.
RISC processors
6.
RISC-V
7.
RISC-V processors
8.
RISC-V Security Verification
9.
ARM processor
10.
crypto processor
11.
digital signal processor (DSP)
12.
multicore processor
13.
multi-processor
14.
multi-processor system-on-chip
15.
multi-processor system-on-chips (MPSoCs)
16.
Muti-Processor System on Chip (MPSoC)
17.
processor architecture
18.
processor designs
19.
processor-centric board
20.
processor-centric board test
21.
accelerated testing
22.
acoustomechanical testing
23.
anaerobic testing
24.
aspect-oriented testing
25.
assessment and testing
26.
at-speed testing
27.
benchmark testing
28.
Berridge testing
29.
burst testing
30.
cancer genomic testing
31.
compliance testing
32.
compositional testing
33.
computer aided testing
34.
cone heater testing
35.
conformance testing
36.
courses on electronic testing and design
37.
cybersecurity testing
38.
D. non-destructive testing
39.
deformation testing
40.
design field testing
41.
destructive testing
42.
eddy current testing
43.
eddy current testing (ECT)
44.
erosion testing
45.
fabric testing
46.
fatigue testing
47.
fire testing
48.
hierarchical testing
49.
hypotheses testing
50.
Implementation-Independent Testing of Microprocessors
51.
integration testing
52.
laboratory scale testing
53.
load testing
54.
macro mechanical testing and green surface tribology
55.
material testing
56.
materials testing
57.
measurement and testing
58.
mechanical testing
59.
memory testing
60.
metamorphic testing
61.
microprocessor testing
62.
model based testing
63.
model-based mutation testing
64.
model-based testing
65.
mutation testing
66.
network-testing
67.
non destructive testing
68.
nondestructive testing
69.
non-destructive testing
70.
non-destructive testing (NDT)
71.
On-site drug testing
72.
on-site testing
73.
pin on disc wear testing
74.
PMU calibration testing
75.
PMU testing
76.
point-of-care testing
77.
real-time HiL testing
78.
regression testing
79.
robustness testing
80.
safety and security testing
81.
scenario testing
82.
scratch testing
83.
security testing
84.
shear testing
85.
small-scale fire testing
86.
software testing
87.
software-in-the-loop (SIL) testing
88.
stand-alone testing
89.
stress-testing
90.
substation testing methods
91.
system testing
92.
tensile testing
93.
testing
94.
testing methods
95.
testing of digital devices
96.
testing of generator
97.
testing of phasor measurement units
98.
two-dimensional array testing
99.
ultrasonic testing
100.
wafer testing
101.
wear testing
102.
vibration testing
103.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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