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book article
High-level functional test generation for microprocessor modules
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
Proceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 2019
2019
/
p. 356-361 : ill
https://doi.org/10.23919/MIXDES.2019.8787131
book article
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keyword
86
1.
RISC processor testing
2.
processor core testing
3.
processor testing
4.
RISC processors
5.
RISC-V
6.
RISC-V Security Verification
7.
crypto processor
8.
digital signal processor (DSP)
9.
multicore processor
10.
multi-processor
11.
multi-processor system-on-chip
12.
multi-processor system-on-chips (MPSoCs)
13.
Muti-Processor System on Chip (MPSoC)
14.
processor designs
15.
processor-centric board
16.
processor-centric board test
17.
accelerated testing
18.
acoustomechanical testing
19.
anaerobic testing
20.
aspect-oriented testing
21.
at-speed testing
22.
benchmark testing
23.
Berridge testing
24.
cancer genomic testing
25.
compliance testing
26.
compositional testing
27.
computer aided testing
28.
conformance testing
29.
courses on electronic testing and design
30.
cybersecurity testing
31.
D. non-destructive testing
32.
design field testing
33.
eddy current testing
34.
erosion testing
35.
fatigue testing
36.
fire testing
37.
hierarchical testing
38.
hypotheses testing
39.
integration testing
40.
laboratory scale testing
41.
load testing
42.
macro mechanical testing and green surface tribology
43.
material testing
44.
materials testing
45.
measurement and testing
46.
mechanical testing
47.
memory testing
48.
metamorphic testing
49.
microprocessor testing
50.
model based testing
51.
model-based mutation testing
52.
model-based testing
53.
mutation testing
54.
network-testing
55.
non destructive testing
56.
nondestructive testing
57.
non-destructive testing
58.
on-site testing
59.
pin on disc wear testing
60.
PMU calibration testing
61.
PMU testing
62.
point-of-care testing
63.
real-time HiL testing
64.
regression testing
65.
robustness testing
66.
scenario testing
67.
scratch testing
68.
security testing
69.
small-scale fire testing
70.
software testing
71.
software-in-the-loop (SIL) testing
72.
stand-alone testing
73.
stress-testing
74.
substation testing methods
75.
system testing
76.
tensile testing
77.
testing
78.
testing methods
79.
testing of digital devices
80.
testing of generator
81.
testing of phasor measurement units
82.
two-dimensional array testing
83.
wafer testing
84.
wear testing
85.
vibration testing
86.
virtual testing
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