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Combining functional and structural approaches in test generation for digital systems (title)
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journal article
Combining functional and structural approaches in test generation for digital systems
Ubar, Raimund-Johannes
Microelectronics reliability
1998
/
p. 317-329 : ill
https://doi.org/10.1016/S0026-2714(97)00192-3
journal article
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keyword
22
1.
functional test generation
2.
functional self-test
3.
Structural Decision Diagrams for Modeling Digital Circuits
4.
adaptive test strategy generation
5.
automated test pattern generation
6.
automatic test case generation
7.
automatic test pattern generation
8.
automatic test program generation
9.
behaviour level test generation
10.
Hierarchical Multi-level Test Generation
11.
high-level test data generation
12.
highlevel test generation
13.
implementation-independent test generation
14.
offline test generation
15.
provably correct test generation
16.
test generation
17.
test generation and fault diagnosis
18.
Test Group Generation for Detecting Multiple Faults
19.
test program generation
20.
digital test
21.
Digital test and testable design
22.
distributed generation systems
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