Otsing - TalTech teadusportaal

kuva

reasta

1

artikkel kogumikus

A global methodology for test program generation starting from high level specificationsStorojev, Sergei; Leveugle, Regis; Saucier, GabrieleBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 305-311: ill https://www.ester.ee/record=b2150914*est

artikkel kogumikus

2

artikkel ajakirjas

A knowledge-based approach to the specification-based program testingTepandi, JaakComputers and artificial intelligence = Вычислительные машины и искуственный интеллект = Pocitace a umela inteligencia1988 / p. 39-48 https://www.ester.ee/record=b1482459*est

artikkel ajakirjas

3

artikkel kogumikus

A new measure for calculating multiple fault coverage of microprocessor self-testOyeniran, Adeboye Stephen; Odozi, Uzochukwu Eddie; Ubar, Raimund-JohannesBEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia2016 / p. 75-78 : ill http://www.ester.ee/record=b2150914*est

artikkel kogumikus

4

artikkel ajakirjas

A new testability calculation method to guide RTL test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2005 / p. 71-82 : ill https://doi.org/10.1007/s10836-005-5288-5

artikkel ajakirjas

5

artikkel kogumikus

A PC-based CAD system for training digital testUbar, Raimund-Johannes; Buldas, Ahto; Paomets, Priidu; Raik, Jaan; Tulit, ViljarThe Fifth EUROCHIP Workshop on VLSI Design Training, 17-18-19 October 1994, Dresden, Germany1994 / p. 152-157: ill

artikkel kogumikus

6

artikkel kogumikus

A proposal for optimisation of low-powered FSM testingBrik, Marina; Fomina, Jelena; Ubar, Raimund-JohannesProceedings of IEEE East-West Design & Test Workshop (EWDTW'05) : Odessa, Ukraine, September 15-19, 20052005 / p. 15-20

artikkel kogumikus

7

artikkel kogumikus

A study of the toxicity of the ozonation products of phenols and chlorophenols by daphnia magna testTrapido, Marina; Veressinina, Jelena23rd Estonian Chemistry Days : abstracts of scientific conference1997 / p. 152

artikkel kogumikus

8

artikkel kogumikus

A synthesis-agnostic behavioral fault model for high gate-level fault coverageKarputkin, Anton; Raik, JaanProceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE) : 14-18 March 2016, ICC, Dresden, Germany2016 / p. 1124-1127 : ill https://ieeexplore.ieee.org/document/7459477/figures#figures

artikkel kogumikus

9

artikkel kogumikus

A testing strategy for interacting finite state machinesYevtushenko, Nina; Petrenko, Alexandre; Trenkaev, VadimBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 137-140: ill

artikkel kogumikus

10

artikkel kogumikus

Abrasivity study of materials used at abrasive testsKulu, Priit; Veinthal, Renno; Käerdi, Helmo; Tarbe, RihoTribology 2008 : proceedings of the 9th International Tribology Conference : University of Pretoria, South Africa, 2-4 April 20082008 / p. 3.4(1)-3.4(10)

artikkel kogumikus

11

artikkel ajakirjas EST / artikkel ajakirjas ENG

Adaptive Extended Kalman Filter position estimation based on Ultra-Wideband Active-Passive Ranging ProtocolLaadung, Taavi; Ulp, Sander; Fjodorov, Aleksei; Alam, Muhammad Mahtab; Le Moullec, YannickIEEE Access2023 / p. 92575-92588 https://doi.org/10.1109/ACCESS.2023.3308696 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

12

artikkel kogumikus

Advances in moving speaker acoustic localization for operation in distributed systemsAstapov, Sergei; Berdnikova, Julia; Preden, Jürgo-SörenInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 9-12 : ill

artikkel kogumikus

13

artikkel kogumikus

AG-model for design of testable controllersKasirova, LiliaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 303-306: ill

artikkel kogumikus

14

artikkel kogumikus EST / artikkel kogumikus ENG

Air change efficiency of room ventilation unitsMikola, Alo; Rehand, Juhan; Kurnitski, JarekE3S Web of Conferences : CLIMA 2019 Congress, Bucharest, Romania, May 26-29, 20192019 / art. 01017, 8 p https://doi.org/10.1051/e3sconf/201911101017 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

Seotud publikatsioonid 1

Ventilation performance in deep renovation of multifamily apartment buildings = Terviklikult renoveeritud korterelamute ventilatsioonisüsteemide toimivus

15

artikkel ajakirjas

Algorithms of functional level testability analysis for digital circuitsUbar, Raimund-Johannes; Kuchcinski, KtzysztofPeriodica polytechnica. Electrical engineering1992 / 3/4, p. 295-308

artikkel ajakirjas

16

artikkel kogumikus

Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill

artikkel kogumikus

17

artikkel kogumikus

An approach for PSL assertion coverage analysis with high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Shchenova, TatjanaProceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 20102010 / p. 13-16 : ill https://ieeexplore.ieee.org/document/5742048

artikkel kogumikus

18

artikkel ajakirjas

An approach for verification assertions reuse 2 in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi; Fujiwara, HideoJournal of Shanghai Normal University : Natural Sciences2010 / p. 441-447 : ill https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation

artikkel ajakirjas

19

artikkel kogumikus

An approach for verification assertions reuse in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Viilukas, TaaviDigest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China2010 / p. 107-110 : ill

artikkel kogumikus

20

artikkel kogumikus

An approach to model development for embedded testingTimohovich, E.BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 353-358

artikkel kogumikus

21

artikkel kogumikus

An aspect-oriented technique to model-based test designSarna, KülliInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kuuenda aastakonverentsi artiklite kogumik : 3.-5. oktoobril 2012, Laulasmaa2012 / p. 77-80

artikkel kogumikus

22

artikkel kogumikus

An educational environment for digital testing : hardware, tools, and web-based runtime platformJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, VladislavProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 412-419 : ill https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf

artikkel kogumikus

23

artikkel kogumikus

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

artikkel kogumikus

24

artikkel kogumikus

An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-Johannes2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 185-190 : ill

artikkel kogumikus

25

artikkel kogumikus

An overview of expert system testing with remarks on distributed architectureParmakson, Priit; Tepandi, JaakProc. of the 11th Int. Scientific School on Distributed Information Systems Architecture, Wroclaw, 28.Jan.-1.Feb., 19901990

artikkel kogumikus

testimine (märksõna)

teaviku laadid

märksõna 1

võtmesõna 1