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Ubar, Raimund-Johannes (TTÜ autor)

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126

artikkel kogumikus

Constraint-based hierarchical untestability identification for syncronous sequential circuitsViilukas, Taavi; Raik, Jaan; Ubar, Raimund-Johannes; Rannaste, Anna; Jenihhin, Maksim; Fujiwara, HideoInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve2011 / p. 139-142 : ill

artikkel kogumikus
127

artikkel kogumikus

Constraint-based test pattern generation at the register-transfer levelViilukas, Taavi; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-Johannes; Krivenko, AnnaProceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria2010 / p. 352-357 : ill http://dx.doi.org/10.1109/DDECS.2010.5491752

artikkel kogumikus
128

artikkel kogumikus

A constraint-driven gate-level test generatorRaik, Jaan; Ubar, Raimund-Johannes; Jervan, Gert; Krupnova, HelenaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 237-240: ill

artikkel kogumikus
129

artikkel kogumikus

Constraints analysis in hierarchical test generation for digital systemsUbar, Raimund-Johannes; Krupnova, HelenaBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 313-318: ill

artikkel kogumikus
130

artikkel ajakirjas

Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphsMatrosova, A.Yu.; Pleshkov, A.G.; Ubar, Raimund-JohannesAutomation and remote control2005 / p. 313-327 : ill http://dx.doi.org/10.1007/s10513-005-0054-9

artikkel ajakirjas
131

artikkel kogumikus

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, JaanProceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere2014 / p. 61-66 : ill

artikkel kogumikus
132

artikkel kogumikus

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

artikkel kogumikus
133

artikkel kogumikus

Cycle-based simulation algorithms for digital systems using high-level decision diagramsMorawiec, Adam; Ubar, Raimund-Johannes; Raik, JaanDesign, Automation and Test in Europe : Conference and Exhibition 2000 : Paris, France, March 27-30, 2000 : proceedings2000 / p. 743

artikkel kogumikus
134

artikkel kogumikus

Cycle-based simulation with decision diagramsUbar, Raimund-Johannes; Morawiec, Adam; Raik, JaanDesign, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings1999 / p. 454-458: ill

artikkel kogumikus
135

artikkel kogumikus

DECIDER : a decision diagram based hierarchical test generation systemJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 19981998 / p. 269-273 https://www.ida.liu.se/labs/eslab/publications/pap/db/DDECS98.pdf

artikkel kogumikus
136

artikkel ajakirjas

DECIDER : a system for hierarchical test pattern generationRaik, Jaan; Ubar, Raimund-JohannesRadioelectronics and informatics2003 / p. 40-45 : ill https://www.researchgate.net/publication/250395975_DECIDER_A_System_for_Hierarchical_Test_Pattern_Generation

artikkel ajakirjas
137

artikkel kogumikus

A decision diagram based hierarchical test pattern generatorJervan, Gert; Markus, Antti; Raik, Jaan; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 159-162: ill

artikkel kogumikus
138

artikkel ajakirjas

Decision diagrams - from a mathematical notion to engineering applicationsStankovic, Radomir S.; Ubar, Raimund-Johannes; Astola, JaakkoFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 281-301 : ill http://dx.doi.org/10.2298/FUEE1103281S

artikkel ajakirjas
139

artikkel kogumikus

Decision diagrams and digital testUbar, Raimund-JohannesECMS 2003 : 6th International Workshop on Electronics, Control, Measurment and Signals : Liberec, Czechia, June 2-4, 20032003 / p. 266-273 : ill http://www.midem-drustvo.si/Journal%20papers/MIDEM_35(2005)4p187.pdf

artikkel kogumikus
140

artikkel kogumikus

Decision diagrams and digital testUbar, Raimund-Johannes41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper2005 / p. 15-26

artikkel kogumikus
141

artikkel kogumikus

Decision diagrams for diagnostic modelingUbar, Raimund-JohannesMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 43

artikkel kogumikus
142

artikkel kogumikus

Deductive fault simulation on structurally synthesized BDDsAarna, Margit; Ubar, Raimund-Johannes; Raik, JaanBEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia2004 / p. 11 : ill

artikkel kogumikus
143

artikkel kogumikus

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill

artikkel kogumikus
144

artikkel kogumikus

Defect-oriented BIST quality analysisKruus, Helena; Ubar, Raimund-Johannes; Raik, JaanBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 153-156 : ill

artikkel kogumikus
145

artikkel kogumikus

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

artikkel kogumikus
146

artikkel kogumikus

Defect-oriented library builder and hierarchical test generationCibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 163-168 : ill

artikkel kogumikus
147

artikkel ajakirjas

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

artikkel ajakirjas
148

artikkel kogumikus

Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

artikkel kogumikus
149

artikkel kogumikus

Defect-oriented test- and layout-generation for standard-cell ASIC designsSudbrock, Joachim; Raik, Jaan; Ubar, Raimund-Johannes; Kuzmicz, Wieslaw; Pleskacz, Witold A.Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 79-82 : ill https://ieeexplore.ieee.org/document/1559781

artikkel kogumikus
150

artikkel kogumikus

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

artikkel kogumikus

Kirjeid leitud 831, kuvan 126 - 150

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järgmine

1. Ubar, Raimund-Johannes
2. Palm, Raimund
3. Räämet, Raimund 1918-2004
4. Aare, Johannes 1915-2000
5. Aavik, Eduard-Johannes
6. Ahrenschild, Johannes (-1936)
7. Alaots, Johannes
8. Aljak, Arnold Johannes
9. Allik, Erich-Johannes
10. Avik, Eduard Johannes 1891-1942
11. Drechsler, Wolfgang Johannes Max
12. Ehala, Johannes
13. Hint, Johannes 1914-1985
14. Johannes, Ille
15. Johannson, Johannes
16. Johanson, Johannes
17. Juhans, Johannes 1874-1956
18. Kajander, Aleksi Oskar Johannes
19. Kiiwet, Johannes
20. Kiivet, Johannes 1879-1967
21. Kivit, Johannes
22. Kollist, Johannes 1884-1937
23. Kollist, Johannes Theodor
24. Korv, August Johannes 1911-1981
25. Krimmer, Robert Johannes
26. Käpp, Martin Johannes
27. Langel, Johannes 1900-1985
28. Langell, Johannes
29. Livländer, Robert Johannes
30. Lutsar, Richard-Johannes
31. Madise, Johannes 1920-?
32. Maltenek, Evald Leonhard Johannes
33. Matsulevitš, Johannes
34. Meitre, Johannes 1906-1978
35. Messer, Johannes
36. Muru, Johannes
37. Mäll, Johannes 1911-1981
38. Mühlman, Johannes
39. Mühlmann, Johannes 1888-1936
40. Notermans, Antonius Johannes Hubertus
41. Nuudi, Johannes 1895-1975
42. Palo, Johannes 1925-1960
43. Pals, Johannes 1903-1941
44. Pello, Johannes
45. Pervik, Johannes 1892-1958
46. Pervik, Johannes-Eduard
47. Presmann, Johannes 1942-2013
48. Putk, Aksel-Johannes 1928-1999
49. Püümann, Mait Johannes
50. Renter, Olav-Johannes
51. Roes, Johannes
52. Russwurm, Johannes
53. Russvurm, Johannes 1855-1939
54. Russvurm, Johannes Carl Gysbert Immanuel
55. Sakeus, Johannes 1880-1934
56. Taimsalu, Johannes 1891-1942
57. Teiman, Johannes
58. Teimann, Johannes Rudolf (kuni 22.05.1935)
59. Tomson, Johannes
60. Tuulre, Feliks Johannes 1908-1987
61. Veerus, Johannes Voldemar 1897-1972
62. Verus, Johannes Voldemar
63. Vuhk, Oskar Johannes

1. Ubar, Raimund-Johannes, 1941-
2. Hagelberg, Raimund, 1927-2012
3. Räämet, Raimund, 1918-2004
4. Aare, Johannes, 1915-2000
5. Aavik, Johannes, 1880-1973
6. Avik, Eduard Johannes, 1891-1942
7. Bender, Naatan Johannes
8. Erm, Johannes, 1998-
9. Granö, Johannes Gabriel
10. Hint, Johannes, 1914-1985
11. Johannes Paulus II, paavst, 1920-2005
12. Kert, Johannes
13. Kiivet, Johannes, 1879-1967
14. Kollist, Johannes
15. Käis, Johannes
16. Lang, Johannes
17. Maide, Johannes Voldemar
18. Mossov, Johannes
19. Pals, Johannes, 1903-1941
20. Pello, Johannes
21. Putk, Aksel-Johannes
22. Rammul, Aleksander Johannes, 1875-1949
23. Steinbrunn, Johannes
24. Taimsalu, Johannes, 1891-1942
25. Talu, Martin Johannes
26. Veerus, Johannes Voldemar, 1897-1972
27. Veski, Johannes Voldemar, 1873-1968
28. Voll, Johannes

1. Johannes Mittus, vasevalamise tööstus

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