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test generation (võtmesõna)

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Kirjeid leitud 17
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artikkel kogumikus

Aspect-oriented testing of a rehabilitation systemSarna, Külli; Vain, JüriVALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France2014 / p. 73-78 : ill

artikkel kogumikus
2

artikkel kogumikus

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

artikkel kogumikus
3

artikkel kogumikus

Exploiting aspects in model-based testingSarna, Külli; Vain, JüriFOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German2012 / p. 45-47 : ill https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing

artikkel kogumikus
4

artikkel kogumikus EST / artikkel kogumikus ENG

GUARD: An ABC-GA hybrid approach utilizing mAchine LeaRning and dimensionality reduction for hardware Trojan detectionHosseini, Mostafa; Azarpeyvand, Ali; Bagheri, Foad; Ghasempouri, Tara2025 IEEE East-West Design & Test Symposium (EWDTS)2025 / 8 p http://doi.org/10.1109/EWDTS67441.2025.11303691 Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG
5

artikkel kogumikus

High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

artikkel kogumikus
6

artikkel kogumikus

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

artikkel kogumikus
7

artikkel kogumikus

Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105

artikkel kogumikus
8

artikkel kogumikus

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

artikkel kogumikus
9

artikkel kogumikus

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

artikkel kogumikus
10

artikkel kogumikus

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

artikkel kogumikus
11

artikkel kogumikus EST / artikkel kogumikus ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG
12

artikkel kogumikus EST / artikkel kogumikus ENG

PATROL: an evolutionary APproach to Automatic Test Pattern Generation for hardware TROjan detection leveraging PSO-GA hybrid techniquesHosseini, Mostafa; Azarpeyvand, Ali; Ghasempouri, TaraProceedings of the 2024 IEEE 33rd Asian Test Symposium : ATS 2024 : Ahmedabad, India, 17-20 December 20242024 / 6 p. https://doi.org/10.1109/ATS64447.2024.10915294 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG
13

artikkel kogumikus EST / artikkel kogumikus ENG

SHIELD: PSO-based hardware trojan detection for efficient and low-cost defenseHosseini, Mostafa; Azarpeyvand, Ali; Taheri, Mahdi; Ghasempouri, Tara; Jenihhin, MaksimProceedings 2025 IEEE 31st International Symposium on on Line Testing and Robust System Design (IOLTS)2025 / 4 p. : ill https://doi.org/10.1109/IOLTS65288.2025.11116879 Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG
14

artikkel kogumikus

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

artikkel kogumikus
15

artikkel kogumikus

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

artikkel kogumikus
16

artikkel kogumikus

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

artikkel kogumikus
17

artikkel kogumikus

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

artikkel kogumikus

Kirjeid leitud 17, kuvan 1 - 17

1. behaviour level test generation
2. functional test generation
3. Hierarchical Multi-level Test Generation
4. highlevel test generation
5. implementation-independent test generation
6. offline test generation
7. provably correct test generation
8. test generation
9. test generation and fault diagnosis
10. adaptive test strategy generation
11. automated test pattern generation
12. automatic test case generation
13. automatic test pattern generation
14. automatic test program generation
15. high-level test data generation
16. Test Group Generation for Detecting Multiple Faults
17. test program generation
18. Activity-based demand generation
19. automated code generation
20. automatic code generation
21. Automatic generation control
22. automatic GUI model generation
23. building and urban form generation
24. business model generation
25. code generation
26. data set generation
27. decentralized key generation
28. disaster alert generation
29. distributed electricity generation
30. distributed generation
31. Distributed Generation (DG)
32. distributed generation systems
33. distributed power generation
34. distrubuted power generation
35. droplet generation
36. droplet generation rate control
37. electric power generation
38. electricity generation
39. energy generation
40. extreme penetration level of non synchronous generation
41. feasible path generation
42. fifth generation computer
43. food waste generation
44. fourth generation district heating
45. frequent item generation
46. generation
47. generation and transmission expansion planning
48. Generation Costs
49. generation of electric energy
50. generation scheduling
51. generation succession
52. heat generation
53. hydroelectric power generation
54. hydrogen generation
55. I–III generation
56. job generation
57. knowledge generation
58. multisine generation
59. next generation 4D printing
60. next generation sequencing
61. Next-generation probiotics
62. next-generation sequencing
63. oil-shale power generation
64. pattern Generation
65. photovoltaic (PV) generation
66. photovoltaic generation dispatch
67. power generation
68. power generation dispatch
69. power generation economics
70. power generation planning
71. PV generation
72. PV power generation
73. real-time alert generation
74. Renewable energy generation
75. renewable generation
76. residual generation
77. retrieval-augmented generation (RAG)
78. rule generation
79. Scenario Generation
80. Second generation bioethanol
81. second generation of tribology models
82. second generation sequencing
83. signal generation
84. silver generation
85. sixth-generation (6G)
86. solar power generation
87. space generation advisory council
88. template based sql generation
89. trajectory generation
90. waste generation
91. wave generation
92. WEEE generation
93. white light generation
94. wind energy generation
95. wind generation
96. wind power generation
97. 16S rRNA gene amplicon next-generation sequencing
98. 4GDH (4th generation district heating)
99. 4th generation district heating
100. 5th generation district heating (5GDH)
101. accelerated shelf-life test
102. antigen test
103. Applications in Test Engineering
104. ASTM G65 dry sand rubber wheel abrasion test
105. Automated Synthesis of Software-based Self-test
106. automated test environment
107. Auvergne test-bed
108. battery test
109. behavioral test
110. bending test
111. bit-error rate test
112. Board and System Test
113. board test
114. bounds test
115. built-in self-test
116. capillary condensation redistribution test
117. chi-square test
118. closed bottle test
119. cognitive screening test
120. compartment fire test
121. compartment test
122. cone penetration test (CPT)
123. COVID-19 antigen test
124. cutting test
125. cybersecurity test bed
126. DDR4 interconnect test
127. design and test
128. design-for-test
129. deterministic test sequences
130. diagnostic test
131. digital test
132. Digital test and testable design
133. double-pulse test
134. drawing test
135. dry droplet antimicrobial test
136. Embedded figures test
137. embedded test
138. fan pressurisation test
139. final test result prediction
140. four-point bending test
141. FPGA based test
142. FPGA-Assisted Test
143. FPGA-centric test
144. functional self-test
145. Granger causality test
146. hardness test
147. high-level synthesis for test
148. high-speed serial link test
149. IEEE 9 bus test system
150. in situ tensile test in SEM
151. industrial field test
152. in-situ tensile test in SEM
153. Johansen cointegration test
154. Kolmogorov-Smirnov test
155. load test
156. logic built-in self-test
157. Luria alternating series test
158. Mann–Kendall test
159. Mann-Kendall trend test
160. memory interconnect test
161. microprocessor test
162. Model test
163. multiplier test
164. orthogonal test
165. package test analysis
166. parallel design and test
167. performance test
168. piezocone penetration test (CPTu)
169. Point Load Test index
170. pressurisation test
171. processor-centric board test
172. progressive damage test
173. Provably Correct Test Development
174. pseudo-exhaustive test
175. purity test
176. real-time room temperature test
177. rolling thin film oven test
178. rtioco-based timed test sequences
179. seasonal Mann Kendall test
180. seismic piezocone penetration test
181. self-test
182. self-test architectures
183. sentence writing test
184. serial sevens test
185. ship towing test tank
186. similar material simulation test
187. small-scale fire test
188. small‐scale test
189. software based self-test
190. software-based self-test
191. software-based self-test (SBST)
192. soil phosphorus (P) test
193. standard test method
194. static load test
195. static-dynamic probing test (SDT)
196. stress test
197. system level test
198. teaching design and test of systems
199. tensile test
200. tensile test
201. test
202. Test Adapters
203. test and evaluation platform
204. test automation
205. test bench
206. test coverage
207. test driven development
208. test driven modelling
209. test embankment
210. test equipment
211. test groups
212. test model design
213. test optimization
214. test packets
215. test path synthesis
216. test patterns
217. test point insertion
218. test reference year
219. test replication
220. test scenario description language
221. test-bed
222. test-chips
223. test-house
224. test-pattern
225. test-suite reduction
226. Three-point bending test
227. unit root test
228. usability platform test
229. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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