Fault-aware performance assessment approach for embedded networks

author
statement of authorship
Jan Malburg, Karl Janson, Jaan Raik, Frank Dannemann
location of publication
Danvers
publisher
year of publication
pages
4 p. : ill
conference name, date
22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 24-26 April 2019
conference location
Cluj-Napoca, Romania
keyword
embedded networks/NoC
fault effects
ISSN
2473-2117
ISBN
978-1-7281-0073-9
notes
Bibliogr.: 12 ref
TTÜ department
language
inglise
Malburg, J., Janson, K., Raik, J., Dannemann, F. Fault-aware performance assessment approach for embedded networks // 2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings. Danvers : IEEE, 2019. 4 p. : ill. https://doi.org/10.1109/DDECS.2019.8724670