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1

book article

Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2

journal article EST / journal article ENG

Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
3

book article

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
4

book article

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
5

book article

Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6

journal article EST / journal article ENG

EFIC-ME : a fast emulation based fault injection control and monitoring enhancementAbideen, Zain Ul; Rashid, Muhammad HaroonIEEE Access2020 / p. 207705-207716 https://doi.org/10.1109/ACCESS.2020.3038198 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
7

book article

Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423

book article
8

book article

On the estimation of complex circuits functional failure rate by machine learning techniquesLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings2019 / p. 35-41 : ill https://doi.org/10.1109/DSN-S.2019.00021

book article
Seotud publikatsioonid 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
9

book article

Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
10

journal article

SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201

journal article
Seotud publikatsioonid 1
- On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseks
11

journal article EST / journal article ENG

A systematic literature review on hardware reliability assessment methods for deep neural networksAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimACM Computing Surveys2024 / art. 141 https://doi.org/10.1145/3638242 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

journal article EST / journal article ENG
12

book article

Use of formal methods for verification and optimization of fault lists in the scope of ISO26262Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce

book article
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

Number of records 12, displaying 1 - 12

1. fault injection
2. Fault Injection Simulation
3. fault-injection attack
4. false data injection attack
5. fiber-reinforced composites and injection molding
6. Gate Injection Transistor (GIT)
7. gating-aware error injection
8. ghost injection attack
9. injection molding
10. injection of technical water
11. manual hydrodynamic injection
12. reactive power injection
13. zero injection phase
14. asynchronous fault detection
15. automatic fault diagnosis
16. bearing fault diagnosis
17. bi-directional fault monitoring devices
18. conditional fault collapsing
19. control fault models
20. critical path fault tracing
21. cross-layer fault tolerance
22. cross-layered fault management
23. extended fault class
24. fault currents
25. fault analysis
26. fault analysis model
27. fault classification
28. fault classification
29. fault collapsing
30. fault compensation
31. fault coverage
32. fault current and voltage measurements
33. Fault current limite
34. fault current limiter
35. fault detection
36. fault detection and diagnoses
37. fault detection and diagnosis
38. fault diagnosis
39. fault diagnostic
40. fault diagnostic resolution
41. fault diagnostics
42. fault dignosis
43. fault effects
44. fault emulation
45. fault equivalence and dominance
46. fault handling
47. fault handling strategy
48. fault indicator
49. fault Interruption
50. fault localization
51. fault location
52. fault management
53. fault masking
54. fault modeling
55. fault models
56. fault monitoring
57. fault prediction
58. fault protection
59. fault redundancy
60. fault resilience
61. fault ride through
62. Fault ride through enhancement
63. fault signal
64. fault simulastion
65. fault simulation
66. fault simulation with critical path tracing
67. fault tolerance
68. fault tolerant
69. fault tolerant control
70. fault tolerant operation
71. fault tolerant router design
72. fault tolerant systems
73. Fault Tree Analysis
74. fault-plane solution
75. fault-resilience
76. fault-resistant
77. fault-ride-through (FRT)
78. fault-tolerance
79. fault-tolerant
80. Fault-tolerant (FT) converters
81. fault-tolerant control
82. fault-tolerant converter
83. functional fault model
84. high-level control fault model
85. high-level fault coverage
86. high-level fault model
87. high-level fault simulation
88. high-level functional fault model
89. Katun fault
90. low-level fault redundancy
91. no fault found
92. No-Fault-Found
93. open circuit fault
94. parallel fault-simulation
95. short circuit fault
96. spectrum-based fault localization
97. stacking fault
98. stuck-at fault model
99. test generation and fault diagnosis
100. transient fault mitigation
101. transmission lines fault

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