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Jenihhin, Maksim (TTÜ author)
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101
book article
Modeling soft-error reliability under variability
Balakrishnan, Aneesh
;
Cardoso Medeiros, Guilherme
;
Gürsoy, Cemil Cem
;
Hamdioui, Said
;
Jenihhin, Maksim
;
Alexandrescu, Dan
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
2021
/
p. 1-6
https://doi.org/10.1109/DFT52944.2021.9568295
book article
Seotud publikatsioonid
1
A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
102
book article
Multi-view modeling for MPSoC design aspects [Online resource]
Vain, Jüri
;
Apneet Kaur
;
Tsiopoulos, Leonidas
;
Raik, Jaan
;
Jenihhin, Maksim
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600986
book article
103
book article
Mutation analysis for systemC designs at TLM
Guarnieri, Valerio
;
Bombieri, Nicola
;
Pravadelli, Graziano
;
Fummi, Franco
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011
2011
/
[6] p
https://ieeexplore.ieee.org/document/5985925
book article
104
book article
Mutation analysis with high-level decision diagrams
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
;
Guglielmo, Giuseppe di
;
Fummi, Franco
LATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay
2010
/
[6] p. [CD-ROM]
https://ieeexplore.ieee.org/document/5550336
book article
105
book article
Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors
Ubar, Raimund-Johannes
;
Vargas, Fabian
;
Jenihhin, Maksim
;
Raik, Jaan
MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013
2013
/
[1] p
book article
106
book article
New categories of Safe Faults in a processor-based Embedded System
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
;
Oyeniran, Adeboye Stephen
;
Piumatti, Davide
;
Raik, Jaan
;
Sonza Reorda, Matteo
;
Ubar, Raimund-Johannes
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
4 p. : ill
https://doi.org/10.1109/DDECS.2019.8724642
book article
107
book article
A novel fault-tolerant logic style with self-checking capability
Taheri, Mahdi
;
Sheikhpour, Saeideh
;
Mahani, Ali
;
Jenihhin, Maksim
Proceedings - 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design, IOLTS 2022
2022
/
art. 183305 : ill
https://doi.org/10.1109/IOLTS56730.2022.9897818
book article
108
book article
On antagonism between side-channel security and soft-error reliability in BNN inference engines
Lai, Xinhui
;
Lange, Thomas
;
Balakrishnan, Aneesh
;
Alexandrescu, Dan
;
Jenihhin, Maksim
IFIP/IEEE 29th International Conference on Very Large Scale Integration (VLSI-SoC)
2021
/
p. 1-6
https://doi.org/10.1109/VLSI-SoC53125.2021.9606981
book article
Seotud publikatsioonid
1
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
109
book article
On BTI aging rejuvenation in memory address decoders
Gürsoy, Cemil Cem
;
Kraak, Daniel
;
Ahmed, Foisal
;
Taouil, Mottaqiallah
;
Jenihhin, Maksim
;
Hamdioui, Said
2022 IEEE 23rd Latin American Test Symposium, LATS 2022
2022
/
Code 184360
https://doi.org/10.1109/LATS57337.2022.9936940
book article
110
book article
On NBTI-induced aging analysis in IEEE 1687 reconfigurable scan networks
Damljanovic, Aleksa
;
Squillero, Giovanni
;
Gürsoy, Cemil Cem
;
Jenihhin, Maksim
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 335-340 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920313
book article
111
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Tšepurov, Anton
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 151-154 : ill
book article
112
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 43-46 : ill
book article
113
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
114
book article
On the combined use of HLDDs and EFSMs for functional ATPG
Di Guglielmo, Giuseppe
;
Fummi, Franco
;
Jenihhin, Maksim
;
Pravadelli, Graziano
;
Raik, Jaan
;
Ubar, Raimund-Johannes
5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia
2007
/
p. 503-508 : ill
book article
115
journal article
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
journal article
116
book article
On-chip sensors data collection and analysis for SoC health management
Shibin, Konstantin
;
Jenihhin, Maksim
;
Jutman, Artur
;
Devadze, Sergei
;
Tsertov, Anton
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
2023
/
6 p
https://doi.org/10.1109/DFT59622.2023.10313562
book article
117
book article
Open-source framework and practical considerations for translating RTL VHDL to SystemC
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
IP-SoC 2012 : IP Embedded System Conference & Exhibition : Grenoble, France, Dec. 4-5, 2012
2012
book article
118
book article
Optimization methodologies for Cycle-Accurate SystemC models converted from RTL VHDL
Saif Abrar, Syed
;
Jenihhin, Maksim
;
Raik, Jaan
IP-SoC 2013 : IP embbeded system conference and exhibition : Grenoble, France, November 6-7, 2013
2013
book article
119
book article
PASCAL : timing SCA resistant design and verification flow
Lai, Xinhui
;
Jenihhin, Maksim
;
Raik, Jaan
;
Paul, Kolin
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 239-242 : ill
https://doi.org/10.1109/IOLTS.2019.8854458
book article
Seotud publikatsioonid
1
Approaches to extra-functional verification of security and reliability aspects in hardware designs = Riistvaraprojektide turva- ja töökindlusaspektide ekstrafunktsionaalse verifitseerimise lähenemisviisid
120
book article
Performance analysis of cosimulating processor core in VHDL and SystemC
Saif Abrar, Syed
;
Shyam Kiran A.
;
Jenihhin, Maksim
;
Raik, Jaan
;
Babu, C.
Proceedings of the 2013 International Conference on Advances in Computing, Communications and Informatics (ICACCI) : 22–25 August 2013, Mysore, India
2013
/
p. 563-568 : ill
book article
121
book
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
http://www.ester.ee/record=b2777270*est
book
122
book article
PSL assertion checkers synthesis with ASM based HLS tool ABELITE
Jenihhin, Maksim
;
Baranov, Samary
;
Raik, Jaan
;
Tihhomirov, Valentin
LATW 2012 : 13th IEEE Latin-American Test Workshop proceedings : April 10th-13th, 2012, Quito, Ecuador
2012
/
[6 p.] : ill
https://ieeexplore.ieee.org/document/6261251
book article
123
journal article
PSL assertion checking using temporally extended high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2009
/
6, p. 289-300 : ill
https://pld.ttu.ee/home/maksim/phd_papers/%5B11%5D%20latw%2708.pdf
journal article
124
book article
PSL assertion checking with temporally extended high-level decision diagrams
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
2008
/
p. 49-54 : ill
https://pld.ttu.ee/~maksim/phd_papers/%5B11%5D%20latw%2708.pdf
book article
125
book article
PSL assertions based verification with HLDD tools
Jenihhin, Maksim
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 17-20 : ill
book article
Number of records 170, displaying
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author
14
1.
Jenihhin, Maksim
2.
Andrijaškin, Maksim
3.
Antonov, Maksim
4.
Butsenko, Maksim
5.
Gorev, Maksim
6.
Maksim, I.
7.
Maksim, Tiit
8.
Mõttus, Maksim
9.
Ošeka, Maksim
10.
Radzvilovits, Maksim
11.
Ruchkin, Maksim
12.
Saat, Maksim
13.
Säkki, Maksim
14.
Zelenski, Maksim
CV
9
1.
Jenihhin, Maksim 1981
2.
Antonov, Maksim 1978
3.
Butsenko, Maksim
4.
Gazizov, Maksim 1918-?
5.
Oseka, Maksim
6.
Osheka, Maksim
7.
Ošeka, Maksim 1988
8.
Saat, Maksim 1944
9.
Säkki, Maksim 1977
name of the person
7
1.
Jenihhin, Maksim
2.
Antonov, Maksim
3.
Butsenko, Maksim
4.
Gorev, Maksim
5.
Gorki, Maksim, pseud., 1868-1936
6.
Ošeka, Maksim
7.
Saat, Maksim
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