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An automatic test generation system for microprocessor VLSI (title)
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book article
An automatic test generation system for microprocessor VLSI
Kont, Toomas
Машинное проектирование электронных устройств и систем
1989
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p. 104-113
book article
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keyword
32
1.
automatic test case generation
2.
automatic test pattern generation
3.
automatic test program generation
4.
microprocessor test
5.
automatic code generation
6.
Automatic generation control
7.
automatic GUI model generation
8.
Automatic identification system
9.
automatic identification system (AIS)
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
behaviour level test generation
13.
functional test generation
14.
Hierarchical Multi-level Test Generation
15.
high-level test data generation
16.
highlevel test generation
17.
implementation-independent test generation
18.
offline test generation
19.
provably correct test generation
20.
test generation
21.
test generation and fault diagnosis
22.
Test Group Generation for Detecting Multiple Faults
23.
test program generation
24.
Board and System Test
25.
IEEE 9 bus test system
26.
system level test
27.
microprocessor
28.
microprocessor architecture
29.
microprocessor chips
30.
microprocessor systems
31.
microprocessor testing
32.
shakti microprocessor
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