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Synthesis of high-level decision diagrams for functional test pattern generation (title)
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book article
Synthesis of high-level decision diagrams for functional test pattern generation
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Karputkin, Anton
;
Tombak, Mati
Proceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 2009
2009
/
p. 519-524 : ill
book article
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keyword
42
1.
high-level decision diagrams (HLDD) synthesis
2.
high-level decision diagrams
3.
High-level Decision Diagrams for Modeling Digital Systems
4.
high-level test data generation
5.
high-level synthesis for test
6.
automated test pattern generation
7.
automatic test pattern generation
8.
functional test generation
9.
high-level functional fault model
10.
behaviour level test generation
11.
Hierarchical Multi-level Test Generation
12.
high-level decision diagram
13.
high level synthesis
14.
high-level synthesis
15.
High-Level Synthesis (HLS)
16.
logic level and high level BDDs
17.
Binary Decision Diagrams
18.
binary decision diagrams (BDD)
19.
decision diagrams
20.
highlevel decision diagrams
21.
pattern Generation
22.
shared structurally synthesized Binary Decision Diagrams
23.
Structural Decision Diagrams for Modeling Digital Circuits
24.
test-pattern
25.
functional self-test
26.
register transfer level modeling decision diagams
27.
strategic level decision makers
28.
extreme penetration level of non synchronous generation
29.
adaptive test strategy generation
30.
automatic test case generation
31.
automatic test program generation
32.
highlevel test generation
33.
implementation-independent test generation
34.
offline test generation
35.
provably correct test generation
36.
test generation
37.
test generation and fault diagnosis
38.
Test Group Generation for Detecting Multiple Faults
39.
test program generation
40.
Automated Synthesis of Software-based Self-test
41.
system level test
42.
test path synthesis
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