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Fault modeling and test generation with low- and high-level decision diagrams (title)
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book article
Fault modeling and test generation with low- and high-level decision diagrams
Ubar, Raimund-Johannes
24. GI/GMM/ITG-Workshop : Testmethoden und Zuverlässigkeit von Schaltungen und Systemen
2012
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p. 1-12
book article
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keyword
56
1.
High-level Decision Diagrams for Modeling Digital Systems
2.
high-level decision diagrams
3.
high-level decision diagrams (HLDD) synthesis
4.
high-level test data generation
5.
Structural Decision Diagrams for Modeling Digital Circuits
6.
low-level fault redundancy
7.
register transfer level modeling decision diagams
8.
test generation and fault diagnosis
9.
behaviour level test generation
10.
Hierarchical Multi-level Test Generation
11.
high-level decision diagram
12.
high-level control fault model
13.
high-level fault coverage
14.
high-level fault model
15.
high-level fault simulation
16.
high-level functional fault model
17.
high-level synthesis for test
18.
logic level and high level BDDs
19.
Binary Decision Diagrams
20.
binary decision diagrams (BDD)
21.
decision diagrams
22.
highlevel decision diagrams
23.
shared structurally synthesized Binary Decision Diagrams
24.
fault modeling
25.
strategic level decision makers
26.
extreme penetration level of non synchronous generation
27.
adaptive test strategy generation
28.
automated test pattern generation
29.
automatic test case generation
30.
automatic test pattern generation
31.
automatic test program generation
32.
Cross-level Modeling of Faults in Digital Systems
33.
functional test generation
34.
highlevel test generation
35.
implementation-independent test generation
36.
low-level control system transportation
37.
low-level radiation
38.
Low-level RF EMF
39.
multi-level modeling
40.
offline test generation
41.
provably correct test generation
42.
test generation
43.
Test Group Generation for Detecting Multiple Faults
44.
test program generation
45.
transaction-level modeling
46.
high context and low context cultures
47.
high-frequency machine modeling
48.
low-context and high-context
49.
system level test
50.
high level DD (HLDD)
51.
high level of security
52.
high level synthesis
53.
high-level control faults
54.
high-level expert group on AI
55.
high-level synthesis
56.
High-Level Synthesis (HLS)
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