Toggle navigation
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English
Intranet
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
English
Intranet
Andmebaasid
Publikatsioonid
Otsing
Valitud kirjed
0
built-in self-test (võtmesõna)
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Lisa tingimus
Liitotsing
filter
Tühista
×
teaviku laadid
raamat
..
artikkel ajakirjas
..
artikkel ajalehes
..
artikkel kogumikus
..
dissertatsioon
..
Open Access
..
Teaduspublikatsioon
..
aasta
ilmumisaasta
Toon andmeid..
autor
Toon andmeid..
TTÜ struktuuriüksus
Toon andmeid..
märksõna
Toon andmeid..
seeria-sari
Toon andmeid..
tema kohta
Toon andmeid..
võtmesõna
Toon andmeid..
Tühista
Kirjeid leitud
7
Vaata veel..
(2/258)
Ekspordi
ekspordi kõik päringu tulemused
(7)
Salvesta TXT fail
prindi
Märgitud kirjetega toimetamiseks ava
valitud kirjed
kuva
Bibliokirje
Lühikirje
reasta
autor kasvavalt
autor kahanevalt
ilmumisaasta kasvavalt
ilmumisaasta kahanevalt
pealkiri kasvavalt
pealkiri kahanevalt
1
artikkel kogumikus
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
artikkel kogumikus
2
artikkel kogumikus
Bringing research issues into lab scenarios on the example of SoC testing [Electronic resource]
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
;
Wuttke, Heinz-Dietrich
International Conference on Engineering Education - ICEE 2007 : September 3-7, 2007, Coimbra, Portugal
2007
/
[7] p. : ill. [CD-ROM]
http://icee2007.dei.uc.pt/proceedings/papers/429.pdf
artikkel kogumikus
3
artikkel ajakirjas EST
/
artikkel ajakirjas ENG
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
https://doi.org/10.1016/j.micpro.2014.11.002
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
artikkel ajakirjas EST
/
artikkel ajakirjas ENG
4
artikkel kogumikus EST
/
artikkel kogumikus ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
5
artikkel kogumikus
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
artikkel kogumikus
6
artikkel kogumikus
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
artikkel kogumikus
7
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 7, kuvan
1 - 7
võtmesõna
256
1.
built-in self-test
2.
logic built-in self-test
3.
Automated Synthesis of Software-based Self-test
4.
functional self-test
5.
self-test
6.
self-test architectures
7.
software based self-test
8.
software-based self-test
9.
software-based self-test (SBST)
10.
Self-assembly and Self-organization
11.
As-built
12.
as-built model
13.
as-built survey
14.
built environment
15.
built environment and architecture
16.
built environment investment
17.
built environment skills needs
18.
Built Heritage
19.
built in moisture
20.
built-in moisture
21.
Built-in transformer (BIT)
22.
cultural built heritage
23.
hand-built pottery
24.
sustainable built environment
25.
adolescent self-efficacy
26.
association of local-self government
27.
association of local-self governments
28.
corporate energy self-sufficiency
29.
covalent self-assembly in solid state
30.
desired self-identity
31.
diffusion and self-trapping of charge carriers
32.
digital self-determination
33.
digital self-efficacy
34.
digital self-interference cancellation
35.
European charter of local self-government
36.
European self-sovereign identity framework
37.
high strength self-compacting concrete
38.
income of self-employed
39.
increased self-consumption
40.
local self-government
41.
nikel-based self-fluxing alloy
42.
NiP self-lubricating coating
43.
open self‐ventilated machines
44.
optical self-mixing
45.
OSV (open self‐ventilated) machines
46.
perceived general self-efficacy
47.
renewables self consumption
48.
renewables self-consumption
49.
Self assessment tool
50.
self aware
51.
self learning software
52.
self learning system
53.
Self organization
54.
self organizing map
55.
self organizing network
56.
self regulating heating
57.
self regulation
58.
self-analysis
59.
self-assembled monolayers
60.
self-assembly
61.
self-assessed quality of life
62.
self-assessment
63.
self-assessment tool
64.
self-attribution
65.
self-aware
66.
self-aware contracts
67.
self-aware systems
68.
self-awareness
69.
self-checking
70.
self-cleaning surfaces
71.
self-consistent channels
72.
self-consumption
73.
self-costs
74.
self-defence
75.
self-determination
76.
self-determination theory
77.
self-determination theory of work motivation
78.
self-development
79.
self-driving car
80.
self-driving cars
81.
self-driving minibus
82.
self-driving vehicle
83.
self-driving vehicles
84.
self-efficacy
85.
self-efficacy development
86.
self-employed
87.
self-employment
88.
self-evaluation
89.
self-fluxing alloy
90.
self-governance
91.
self-healing
92.
self-heating phenomenon
93.
self-identification
94.
self-identity
95.
self-improvement
96.
self-insurance
97.
self-learning
98.
self-lubrication
99.
self-management
100.
self‐management
101.
self-mixing
102.
self-organisation
103.
self-organised teams
104.
self-organization
105.
self-organized criticality
106.
self-organized teams
107.
self-perforating dowel
108.
self-propagating high temperature synthesized (SHS)
109.
Self-Propagating High-Temperature Synthesis
110.
self-propulsion
111.
self-regulated learning
112.
self-regulation
113.
self-reported musculoskeletal disorders
114.
self-rolling
115.
self-shading envelopes
116.
self-sovereign
117.
self-study
118.
self-study courses
119.
self-training
120.
social self-development
121.
solo self-employment
122.
accelerated shelf-life test
123.
adaptive test strategy generation
124.
antigen test
125.
Applications in Test Engineering
126.
ASTM G65 dry sand rubber wheel abrasion test
127.
automated test environment
128.
automated test pattern generation
129.
automatic test case generation
130.
automatic test pattern generation
131.
automatic test program generation
132.
Auvergne test-bed
133.
battery test
134.
behavioral test
135.
behaviour level test generation
136.
bending test
137.
bit-error rate test
138.
Board and System Test
139.
board test
140.
bounds test
141.
capillary condensation redistribution test
142.
chi-square test
143.
closed bottle test
144.
cognitive screening test
145.
compartment fire test
146.
compartment test
147.
cone penetration test (CPT)
148.
COVID-19 antigen test
149.
cutting test
150.
cybersecurity test bed
151.
DDR4 interconnect test
152.
design and test
153.
design-for-test
154.
deterministic test sequences
155.
diagnostic test
156.
digital test
157.
Digital test and testable design
158.
double-pulse test
159.
drawing test
160.
dry droplet antimicrobial test
161.
Embedded figures test
162.
embedded test
163.
fan pressurisation test
164.
final test result prediction
165.
four-point bending test
166.
FPGA based test
167.
FPGA-Assisted Test
168.
FPGA-centric test
169.
functional test generation
170.
Granger causality test
171.
hardness test
172.
Hierarchical Multi-level Test Generation
173.
high-level synthesis for test
174.
high-level test data generation
175.
highlevel test generation
176.
high-speed serial link test
177.
IEEE 9 bus test system
178.
implementation-independent test generation
179.
in situ tensile test in SEM
180.
industrial field test
181.
in-situ tensile test in SEM
182.
Johansen cointegration test
183.
Kolmogorov-Smirnov test
184.
load test
185.
Luria alternating series test
186.
Mann–Kendall test
187.
Mann-Kendall trend test
188.
memory interconnect test
189.
microprocessor test
190.
Model test
191.
multiplier test
192.
offline test generation
193.
orthogonal test
194.
package test analysis
195.
parallel design and test
196.
performance test
197.
piezocone penetration test (CPTu)
198.
Point Load Test index
199.
pressurisation test
200.
processor-centric board test
201.
progressive damage test
202.
provably correct test generation
203.
pseudo-exhaustive test
204.
purity test
205.
real-time room temperature test
206.
rolling thin film oven test
207.
rtioco-based timed test sequences
208.
seasonal Mann Kendall test
209.
seismic piezocone penetration test
210.
sentence writing test
211.
serial sevens test
212.
ship towing test tank
213.
similar material simulation test
214.
small-scale fire test
215.
small‐scale test
216.
soil phosphorus (P) test
217.
standard test method
218.
static load test
219.
static-dynamic probing test (SDT)
220.
stress test
221.
system level test
222.
teaching design and test of systems
223.
tensile test
224.
tensile test
225.
test
226.
test and evaluation platform
227.
test automation
228.
test bench
229.
test coverage
230.
test driven development
231.
test driven modelling
232.
test embankment
233.
test equipment
234.
test generation
235.
test generation and fault diagnosis
236.
Test Group Generation for Detecting Multiple Faults
237.
test groups
238.
test model design
239.
test optimization
240.
test packets
241.
test path synthesis
242.
test patterns
243.
test point insertion
244.
test program generation
245.
test reference year
246.
test replication
247.
test scenario description language
248.
test-bed
249.
test-chips
250.
test-house
251.
test-pattern
252.
test-suite reduction
253.
Three-point bending test
254.
unit root test
255.
usability platform test
256.
1995 ECC benchmark test
märksõna
2
1.
European Test Symposium (ETS)
2.
16PF (test)
×
vaste
algab
lõpeb
sisaldab
reasta
Relevantsuse alusel
kasvavalt
kahanevalt
ilmumisaasta
autor
TTÜ struktuuriüksus
märksõna
seeria-sari
tema kohta
võtmesõna
Otsing
Valikud
0
ilmumisaasta
AND
OR
NOT
autor
AND
OR
NOT
TTÜ struktuuriüksus
AND
OR
NOT
märksõna
AND
OR
NOT
seeria-sari
AND
OR
NOT
tema kohta
AND
OR
NOT
võtmesõna
AND
OR
NOT