Toggle navigation
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English
Intranet
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
English
Intranet
Andmebaasid
Publikatsioonid
Otsing
Valitud kirjed
0
test generation (võtmesõna)
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Lisa tingimus
Liitotsing
filter
Tühista
×
teaviku laadid
raamat
..
artikkel ajakirjas
..
artikkel ajalehes
..
artikkel kogumikus
..
dissertatsioon
..
Open Access
..
Teaduspublikatsioon
..
aasta
ilmumisaasta
Toon andmeid..
autor
Toon andmeid..
TTÜ struktuuriüksus
Toon andmeid..
märksõna
Toon andmeid..
seeria-sari
Toon andmeid..
tema kohta
Toon andmeid..
võtmesõna
Toon andmeid..
Tühista
Kirjeid leitud
14
Vaata veel..
(2/215)
Ekspordi
ekspordi kõik päringu tulemused
(14)
Salvesta TXT fail
Salvesta PDF fail
prindi
Märgitud kirjetega toimetamiseks ava
valitud kirjed
kuva
Bibliokirje
Lühikirje
reasta
autor kasvavalt
autor kahanevalt
ilmumisaasta kasvavalt
ilmumisaasta kahanevalt
pealkiri kasvavalt
pealkiri kahanevalt
1
artikkel kogumikus
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
artikkel kogumikus
2
artikkel kogumikus
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
artikkel kogumikus
3
artikkel kogumikus
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
artikkel kogumikus
4
artikkel kogumikus
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
artikkel kogumikus
5
artikkel kogumikus
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
artikkel kogumikus
6
artikkel kogumikus
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
artikkel kogumikus
7
artikkel kogumikus
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
artikkel kogumikus
8
artikkel kogumikus
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
artikkel kogumikus
9
artikkel kogumikus
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
artikkel kogumikus
10
artikkel kogumikus EST
/
artikkel kogumikus ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
artikkel kogumikus EST
/
artikkel kogumikus ENG
11
artikkel kogumikus
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
artikkel kogumikus
12
artikkel kogumikus
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
artikkel kogumikus
13
artikkel kogumikus
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
artikkel kogumikus
14
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 14, kuvan
1 - 14
võtmesõna
213
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automatic code generation
20.
Automatic generation control
21.
automatic GUI model generation
22.
building and urban form generation
23.
business model generation
24.
code generation
25.
data set generation
26.
decentralized key generation
27.
disaster alert generation
28.
distributed electricity generation
29.
distributed generation
30.
Distributed Generation (DG)
31.
distributed generation systems
32.
distributed power generation
33.
distrubuted power generation
34.
droplet generation
35.
droplet generation rate control
36.
electric power generation
37.
electricity generation
38.
energy generation
39.
extreme penetration level of non synchronous generation
40.
feasible path generation
41.
fifth generation computer
42.
fourth generation district heating
43.
frequent item generation
44.
generation
45.
generation and transmission expansion planning
46.
Generation Costs
47.
generation of electric energy
48.
generation succession
49.
heat generation
50.
hydroelectric power generation
51.
hydrogen generation
52.
I–III generation
53.
job generation
54.
multisine generation
55.
next generation 4D printing
56.
next generation sequencing
57.
Next-generation probiotics
58.
next-generation sequencing
59.
oil-shale power generation
60.
pattern Generation
61.
photovoltaic (PV) generation
62.
photovoltaic generation dispatch
63.
power generation
64.
power generation dispatch
65.
power generation economics
66.
power generation planning
67.
PV generation
68.
PV power generation
69.
Renewable energy generation
70.
renewable generation
71.
residual generation
72.
Second generation bioethanol
73.
second generation of tribology models
74.
second generation sequencing
75.
signal generation
76.
silver generation
77.
solar power generation
78.
space generation advisory council
79.
template based sql generation
80.
trajectory generation
81.
waste generation
82.
wave generation
83.
white light generation
84.
wind energy generation
85.
wind generation
86.
wind power generation
87.
16S rRNA gene amplicon next-generation sequencing
88.
4GDH (4th generation district heating)
89.
4th generation district heating
90.
5th generation district heating
91.
accelerated shelf-life test
92.
antigen test
93.
Applications in Test Engineering
94.
ASTM G65 dry sand rubber wheel abrasion test
95.
Automated Synthesis of Software-based Self-test
96.
automated test environment
97.
Auvergne test-bed
98.
battery test
99.
behavioral test
100.
bending test
101.
bit-error rate test
102.
Board and System Test
103.
board test
104.
bounds test
105.
built-in self-test
106.
capillary condensation redistribution test
107.
chi-square test
108.
closed bottle test
109.
cognitive screening test
110.
compartment fire test
111.
compartment test
112.
cone penetration test (CPT)
113.
COVID-19 antigen test
114.
cutting test
115.
cybersecurity test bed
116.
DDR4 interconnect test
117.
design and test
118.
design-for-test
119.
deterministic test sequences
120.
diagnostic test
121.
digital test
122.
Digital test and testable design
123.
double-pulse test
124.
drawing test
125.
dry droplet antimicrobial test
126.
embedded test
127.
fan pressurisation test
128.
final test result prediction
129.
four-point bending test
130.
FPGA based test
131.
FPGA-Assisted Test
132.
FPGA-centric test
133.
functional self-test
134.
Granger causality test
135.
hardness test
136.
high-level synthesis for test
137.
high-speed serial link test
138.
IEEE 9 bus test system
139.
in situ tensile test in SEM
140.
industrial field test
141.
in-situ tensile test in SEM
142.
Johansen cointegration test
143.
Kolmogorov-Smirnov test
144.
load test
145.
logic built-in self-test
146.
Luria alternating series test
147.
Mann–Kendall test
148.
memory interconnect test
149.
microprocessor test
150.
Model test
151.
multiplier test
152.
orthogonal test
153.
package test analysis
154.
parallel design and test
155.
performance test
156.
piezocone penetration test (CPTu)
157.
Point Load Test index
158.
pressurisation test
159.
processor-centric board test
160.
progressive damage test
161.
pseudo-exhaustive test
162.
purity test
163.
rolling thin film oven test
164.
rtioco-based timed test sequences
165.
seasonal Mann Kendall test
166.
seismic piezocone penetration test
167.
self-test
168.
self-test architectures
169.
sentence writing test
170.
serial sevens test
171.
ship towing test tank
172.
similar material simulation test
173.
small-scale fire test
174.
small‐scale test
175.
software based self-test
176.
software-based self-test
177.
software-based self-test (SBST)
178.
soil phosphorus (P) test
179.
standard test method
180.
static load test
181.
static-dynamic probing test (SDT)
182.
stress test
183.
system level test
184.
teaching design and test of systems
185.
tensile test
186.
test
187.
test and evaluation platform
188.
test automation
189.
test bench
190.
test coverage
191.
test driven development
192.
test driven modelling
193.
test embankment
194.
test equipment
195.
test groups
196.
test model design
197.
test optimization
198.
test packets
199.
test path synthesis
200.
test patterns
201.
test point insertion
202.
test reference year
203.
test replication
204.
test scenario description language
205.
test-bed
206.
test-chips
207.
test-house
208.
test-pattern
209.
test-suite reduction
210.
Three-point bending test
211.
unit root test
212.
usability platform test
213.
1995 ECC benchmark test
märksõna
2
1.
European Test Symposium (ETS)
2.
16PF (test)
×
vaste
algab
lõpeb
sisaldab
reasta
Relevantsuse alusel
kasvavalt
kahanevalt
ilmumisaasta
autor
TTÜ struktuuriüksus
märksõna
seeria-sari
tema kohta
võtmesõna
Otsing
Valikud
0
ilmumisaasta
AND
OR
NOT
autor
AND
OR
NOT
TTÜ struktuuriüksus
AND
OR
NOT
märksõna
AND
OR
NOT
seeria-sari
AND
OR
NOT
tema kohta
AND
OR
NOT
võtmesõna
AND
OR
NOT