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test generation (võtmesõna)
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1
artikkel kogumikus
Aspect-oriented testing of a rehabilitation system
Sarna, Külli
;
Vain, Jüri
VALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France
2014
/
p. 73-78 : ill
artikkel kogumikus
2
artikkel kogumikus
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
artikkel kogumikus
3
artikkel kogumikus
Exploiting aspects in model-based testing
Sarna, Külli
;
Vain, Jüri
FOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German
2012
/
p. 45-47 : ill
https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing
artikkel kogumikus
4
artikkel kogumikus EST
/
artikkel kogumikus ENG
GUARD: An ABC-GA hybrid approach utilizing mAchine LeaRning and dimensionality reduction for hardware Trojan detection
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Bagheri, Foad
;
Ghasempouri, Tara
2025 IEEE East-West Design & Test Symposium (EWDTS)
2025
/
8 p
http://doi.org/10.1109/EWDTS67441.2025.11303691
artikkel kogumikus EST
/
artikkel kogumikus ENG
5
artikkel kogumikus
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
artikkel kogumikus
6
artikkel kogumikus
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
artikkel kogumikus
7
artikkel kogumikus
Implementation-independent functional test for transition delay faults in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia
2020
/
p. 646-650
https://doi.org/10.1109/DSD51259.2020.00105
artikkel kogumikus
8
artikkel kogumikus
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
artikkel kogumikus
9
artikkel kogumikus
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
artikkel kogumikus
10
artikkel kogumikus
A novel random approach to diagnostic test generation
Osimiry, Emmanuel Ovie
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
2016
/
[4] p. : ill
https://doi.org/10.1109/NORCHIP.2016.7792915
artikkel kogumikus
11
artikkel kogumikus EST
/
artikkel kogumikus ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
artikkel kogumikus EST
/
artikkel kogumikus ENG
12
artikkel kogumikus EST
/
artikkel kogumikus ENG
PATROL: an evolutionary APproach to Automatic Test Pattern Generation for hardware TROjan detection leveraging PSO-GA hybrid techniques
Hosseini, Mostafa
;
Azarpeyvand, Ali
;
Ghasempouri, Tara
Proceedings of the 2024 IEEE 33rd Asian Test Symposium : ATS 2024 : Ahmedabad, India, 17-20 December 2024
2024
/
6 p.
https://doi.org/10.1109/ATS64447.2024.10915294
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
13
artikkel kogumikus
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
artikkel kogumikus
14
artikkel kogumikus
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
artikkel kogumikus
15
artikkel kogumikus
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
artikkel kogumikus
16
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 16, kuvan
1 - 16
võtmesõna
221
1.
behaviour level test generation
2.
functional test generation
3.
Hierarchical Multi-level Test Generation
4.
highlevel test generation
5.
implementation-independent test generation
6.
offline test generation
7.
provably correct test generation
8.
test generation
9.
test generation and fault diagnosis
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
high-level test data generation
16.
Test Group Generation for Detecting Multiple Faults
17.
test program generation
18.
Activity-based demand generation
19.
automated code generation
20.
automatic code generation
21.
Automatic generation control
22.
automatic GUI model generation
23.
building and urban form generation
24.
business model generation
25.
code generation
26.
data set generation
27.
decentralized key generation
28.
disaster alert generation
29.
distributed electricity generation
30.
distributed generation
31.
Distributed Generation (DG)
32.
distributed generation systems
33.
distributed power generation
34.
distrubuted power generation
35.
droplet generation
36.
droplet generation rate control
37.
electric power generation
38.
electricity generation
39.
energy generation
40.
extreme penetration level of non synchronous generation
41.
feasible path generation
42.
fifth generation computer
43.
fourth generation district heating
44.
frequent item generation
45.
generation
46.
generation and transmission expansion planning
47.
Generation Costs
48.
generation of electric energy
49.
generation scheduling
50.
generation succession
51.
heat generation
52.
hydroelectric power generation
53.
hydrogen generation
54.
I–III generation
55.
job generation
56.
knowledge generation
57.
multisine generation
58.
next generation 4D printing
59.
next generation sequencing
60.
Next-generation probiotics
61.
next-generation sequencing
62.
oil-shale power generation
63.
pattern Generation
64.
photovoltaic (PV) generation
65.
photovoltaic generation dispatch
66.
power generation
67.
power generation dispatch
68.
power generation economics
69.
power generation planning
70.
PV generation
71.
PV power generation
72.
Renewable energy generation
73.
renewable generation
74.
residual generation
75.
rule generation
76.
Second generation bioethanol
77.
second generation of tribology models
78.
second generation sequencing
79.
signal generation
80.
silver generation
81.
sixth-generation (6G)
82.
solar power generation
83.
space generation advisory council
84.
template based sql generation
85.
trajectory generation
86.
waste generation
87.
wave generation
88.
white light generation
89.
wind energy generation
90.
wind generation
91.
wind power generation
92.
16S rRNA gene amplicon next-generation sequencing
93.
4GDH (4th generation district heating)
94.
4th generation district heating
95.
5th generation district heating
96.
accelerated shelf-life test
97.
antigen test
98.
Applications in Test Engineering
99.
ASTM G65 dry sand rubber wheel abrasion test
100.
Automated Synthesis of Software-based Self-test
101.
automated test environment
102.
Auvergne test-bed
103.
battery test
104.
behavioral test
105.
bending test
106.
bit-error rate test
107.
Board and System Test
108.
board test
109.
bounds test
110.
built-in self-test
111.
capillary condensation redistribution test
112.
chi-square test
113.
closed bottle test
114.
cognitive screening test
115.
compartment fire test
116.
compartment test
117.
cone penetration test (CPT)
118.
COVID-19 antigen test
119.
cutting test
120.
cybersecurity test bed
121.
DDR4 interconnect test
122.
design and test
123.
design-for-test
124.
deterministic test sequences
125.
diagnostic test
126.
digital test
127.
Digital test and testable design
128.
double-pulse test
129.
drawing test
130.
dry droplet antimicrobial test
131.
embedded test
132.
fan pressurisation test
133.
final test result prediction
134.
four-point bending test
135.
FPGA based test
136.
FPGA-Assisted Test
137.
FPGA-centric test
138.
functional self-test
139.
Granger causality test
140.
hardness test
141.
high-level synthesis for test
142.
high-speed serial link test
143.
IEEE 9 bus test system
144.
in situ tensile test in SEM
145.
industrial field test
146.
in-situ tensile test in SEM
147.
Johansen cointegration test
148.
Kolmogorov-Smirnov test
149.
load test
150.
logic built-in self-test
151.
Luria alternating series test
152.
Mann–Kendall test
153.
Mann-Kendall trend test
154.
memory interconnect test
155.
microprocessor test
156.
Model test
157.
multiplier test
158.
orthogonal test
159.
package test analysis
160.
parallel design and test
161.
performance test
162.
piezocone penetration test (CPTu)
163.
Point Load Test index
164.
pressurisation test
165.
processor-centric board test
166.
progressive damage test
167.
pseudo-exhaustive test
168.
purity test
169.
real-time room temperature test
170.
rolling thin film oven test
171.
rtioco-based timed test sequences
172.
seasonal Mann Kendall test
173.
seismic piezocone penetration test
174.
self-test
175.
self-test architectures
176.
sentence writing test
177.
serial sevens test
178.
ship towing test tank
179.
similar material simulation test
180.
small-scale fire test
181.
small‐scale test
182.
software based self-test
183.
software-based self-test
184.
software-based self-test (SBST)
185.
soil phosphorus (P) test
186.
standard test method
187.
static load test
188.
static-dynamic probing test (SDT)
189.
stress test
190.
system level test
191.
teaching design and test of systems
192.
tensile test
193.
tensile test
194.
test
195.
test and evaluation platform
196.
test automation
197.
test bench
198.
test coverage
199.
test driven development
200.
test driven modelling
201.
test embankment
202.
test equipment
203.
test groups
204.
test model design
205.
test optimization
206.
test packets
207.
test path synthesis
208.
test patterns
209.
test point insertion
210.
test reference year
211.
test replication
212.
test scenario description language
213.
test-bed
214.
test-chips
215.
test-house
216.
test-pattern
217.
test-suite reduction
218.
Three-point bending test
219.
unit root test
220.
usability platform test
221.
1995 ECC benchmark test
märksõna
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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