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autor kasvavalt
autor kahanevalt
ilmumisaasta kasvavalt
ilmumisaasta kahanevalt
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1
artikkel kogumikus
Accelerating transient fault injection campaigns by using Dynamic HDL Slicing
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p. : ill
https://doi.org/10.1109/NORCHIP.2019.8906932
artikkel kogumikus
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
artikkel kogumikus
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
artikkel kogumikus
3
artikkel kogumikus
DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN accelerators
Taheri, Mahdi
;
Riazati, Mohamad
;
Ahmadilivani, Mohammad Hasan
;
Jenihhin, Maksim
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Sjödin, Mikael
;
Lisper, Björn
2023 24th International Symposium on Quality Electronic Design (ISQED)
2023
/
8 p. : ill
https://doi.org/10.1109/ISQED57927.2023.10129353
artikkel kogumikus
Seotud publikatsioonid
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
4
artikkel ajakirjas
Distributed approach for parallel exact critical path tracing fault simulation
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
International journal of microelectronics and computer science
2010
/
p. 165-174 : ill
artikkel ajakirjas
5
artikkel ajakirjas
Distributed fault simulation with collaborative load balancing for VLSI circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Scalable computing : practice and experience
2011
/
p. 153-163 : ill
artikkel ajakirjas
6
artikkel kogumikus
Efficient fault injection based on dynamic HDL slicing technique
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 52-53 : ill
https://doi.org/10.1109/IOLTS.2019.8854419
artikkel kogumikus
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
7
artikkel kogumikus EST
/
artikkel kogumikus ENG
Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
Taheri, Mahdi
;
Cherezova, Natalia
;
Ansari, Mohammad Saeed
;
Jenihhin, Maksim
;
Mahani, Ali
;
Daneshtalab, Masoud
;
Raik, Jaan
Proceedings of the Twenty Fifth International Symposium on Quality ElectronicDesign : ISQED 2024
2024
/
8 p. : ill
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372
https://doi.org/10.1109/ISQED60706.2024.10528372
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
Seotud publikatsioonid
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
8
artikkel kogumikus
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
artikkel kogumikus
9
artikkel ajakirjas
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
artikkel ajakirjas
10
artikkel kogumikus
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
artikkel kogumikus
11
artikkel kogumikus
Modeling sequential circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Marenkov, Mihhail
;
Mironov, Dmitri
;
Viies, Vladimir
Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014
2014
/
p. 130-135 : ill
artikkel kogumikus
12
artikkel kogumikus
SAFFIRA: a Framework for Assessing the Reliability of Systolic-Array-Based DNN Accelerators
Taheri, Mahdi
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Jenihhin, Maksim
;
Pappalardo, Salvatore
;
Jimenez, Paul
;
Deveautour, Bastien
;
Bosio, Alberto
2024 27th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS) : 03-05 April 2024, Kielce, Poland
2024
/
p. 19–24 : ill
https://doi.org/10.1109/DDECS60919.2024.10508925
Article at Scopus
Article at WOS
artikkel kogumikus
Seotud publikatsioonid
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
13
artikkel kogumikus
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
artikkel kogumikus
14
artikkel kogumikus EST
/
artikkel kogumikus ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024 : proceedings
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
Seotud publikatsioonid
1
Methods for reliability assessment and enhancement of deep neural networks hardware accelerators = Süvanärvivõrkude riistvara kiirendite töökindluse hindamine ja täiustamine
15
artikkel kogumikus
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
artikkel kogumikus
16
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 16, kuvan
1 - 16
võtmesõna
203
1.
fault simulation
2.
fault simulation with critical path tracing
3.
high-level fault simulation
4.
Parallel Fault Simulation with Critical Path Backtracing
5.
parallel fault-simulation
6.
Fault Injection Simulation
7.
AI-based fault detection
8.
asynchronous fault detection
9.
automatic fault diagnosis
10.
bearing fault diagnosis
11.
bi-directional fault monitoring devices
12.
conditional fault collapsing
13.
control fault models
14.
critical path fault tracing
15.
cross-layer fault tolerance
16.
cross-layered fault management
17.
extended fault class
18.
fault currents
19.
fault analysis
20.
fault analysis model
21.
fault classification
22.
fault classification
23.
fault collapsing
24.
fault compensation
25.
fault coverage
26.
fault current and voltage measurements
27.
Fault current limite
28.
fault current limiter
29.
fault detection
30.
fault detection and classification
31.
fault detection and diagnoses
32.
fault detection and diagnosis
33.
fault detection and diagnostics (FDD)
34.
fault diagnosis
35.
fault diagnostic
36.
fault diagnostic resolution
37.
fault diagnostics
38.
fault dignosis
39.
fault effects
40.
fault emulation
41.
fault equivalence and dominance
42.
fault handling
43.
fault handling strategy
44.
fault indicator
45.
fault injection
46.
fault Interruption
47.
fault localization
48.
fault location
49.
fault management
50.
fault masking
51.
fault modeling
52.
fault models
53.
fault monitoring
54.
fault prediction
55.
fault protection
56.
fault redundancy
57.
fault resilience
58.
fault ride through
59.
Fault ride through enhancement
60.
fault seeding
61.
fault signal
62.
fault simulastion
63.
fault tolerance
64.
fault tolerant
65.
fault tolerant computer systems
66.
fault tolerant control
67.
fault tolerant operation
68.
fault tolerant router design
69.
fault tolerant systems
70.
fault tree analysis
71.
fault-injection attack
72.
fault-plane solution
73.
fault-resilience
74.
fault-resistant
75.
fault-ride-through (FRT)
76.
fault-tolerance
77.
fault-tolerant
78.
Fault-tolerant (FT) converters
79.
fault-tolerant control
80.
fault-tolerant converter
81.
functional fault model
82.
high-level control fault model
83.
high-level fault coverage
84.
high-level fault model
85.
high-level functional fault model
86.
hybrid fault detection
87.
Katun fault
88.
low-level fault redundancy
89.
no fault found
90.
No-Fault-Found
91.
open circuit fault
92.
photovoltaic fault detection algorithms
93.
PV fault classification
94.
short circuit fault
95.
spectrum-based fault localization
96.
stacking fault
97.
stuck-at fault model
98.
test generation and fault diagnosis
99.
transient fault mitigation
100.
transmission lines fault
101.
annual energy simulation
102.
back traced simulation
103.
building energy performance simulation
104.
building energy simulation
105.
building performance simulation
106.
building simulation
107.
casting simulation
108.
CFD simulation
109.
circuit simulation
110.
CoCoViLa simulation environment
111.
computer simulation
112.
computer simulation environments
113.
cooling simulation
114.
co-simulation
115.
data simulation
116.
digital real time simulation
117.
digital shipping simulation
118.
dynamic simulation
119.
dynamic thermal simulation
120.
electric field simulation
121.
emergency simulation
122.
energy simulation
123.
energy simulation software
124.
environmental performance assessment and simulation
125.
finite element method (FEM) simulation
126.
finite element simulation
127.
fluid flow simulation
128.
FMS modelling and simulation
129.
fullscale simulation
130.
gait simulation
131.
hardware-in-the loop simulation
132.
Hardware-in-the-Loop simulation
133.
hospital simulation
134.
hot/cold pressing and finite element model simulation
135.
hygrothermal simulation
136.
impact scenario simulation
137.
impact-abrasive simulation
138.
intelligent simulation
139.
intelligent simulation environment
140.
LES (large eddy simulation) method
141.
logic models and simulation
142.
logic simulation
143.
long-term simulation
144.
magnetics field simulation
145.
Mathematical simulation
146.
MATLAB simulation
147.
medical simulation
148.
meso-scale simulation
149.
MICA2 simulation
150.
model building and simulation
151.
modeling and simulation
152.
modelling and simulation
153.
Monte Carlo simulation
154.
Monte Carlo simulation (MCS)
155.
multi agent simulation
156.
multiscale simulation
157.
Multi-valued Simulation for Hazard Detection in Digital Circuits
158.
numerical simulation
159.
parallel simulation
160.
phase diagram simulation
161.
power system simulation
162.
process simulation
163.
ray-tracing simulation
164.
real time simulation
165.
real-time simulation
166.
register transfer and gate level simulation
167.
response simulation
168.
rheology simulation
169.
Siemens Tecnomatix Plant Simulation (STPS) platform
170.
signal simulation
171.
signal simulation and modeling
172.
similar material simulation test
173.
simulation
174.
simulation analysis
175.
simulation and analysis
176.
simulation applications
177.
simulation based static optimization
178.
simulation based TMY
179.
simulation model
180.
simulation modeling
181.
simulation models
182.
simulation of air change
183.
simulation of energy consumption
184.
simulation software "Delphin"
185.
simulation trace
186.
simulation training
187.
simulationbased decision support
188.
simulation-based verification
189.
spinach simulation
190.
SUMO simulation
191.
supply chain simulation
192.
system level simulation
193.
systems simulation
194.
TD-DFT simulation
195.
urban simulation
196.
validation of simulation model
197.
wear simulation
198.
vehicle simulation
199.
whole building simulation
200.
visual simulation
201.
3D simulation
202.
5G New Radio simulation
203.
(co-)simulation
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