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Alternatiivsete graafide mudel loogikalülituste funktsioonide kirjeldamiseks ja analüüsiksAnton, E.; Ubar, Raimund-JohannesXXIX vabariiklik üliõpilaste teaduslik- tehniline konverents 30. märtsist - 1. aprillini 1977 : ettekannete teesid1977 / lk. 42-43 https://www.ester.ee/record=b2449987*est

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Alternative graph based test design in digital systemsUbar, Raimund-JohannesProceedings of 11. NORCHIP seminar, Trondheim, Nov. 9-10, 19931993 / p. 48-62

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28

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Alternative graphs and test pattern design in digital systemsUbar, Raimund-JohannesProc. of the 6th Workshop on New Directions for Testing, Montreal, Canada, May 20-22, 19921992

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Alternative graphs as a mathematical tool and knowledge representation for diagnosis purposes in digital systemsUbar, Raimund-JohannesBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 285-292: ill

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An approach for PSL assertion coverage analysis with high-level decision diagramsJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Shchenova, TatjanaProceedings of IEEE East-West Design & Test Symposium (EWDTS'10) : St. Petersburg, Russia, September 17-20, 20102010 / p. 13-16 : ill https://ieeexplore.ieee.org/document/5742048

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31

journal article

An approach for verification assertions reuse 2 in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi; Fujiwara, HideoJournal of Shanghai Normal University : Natural Sciences2010 / p. 441-447 : ill https://www.researchgate.net/publication/240613999_An_Approach_for_Verification_Assertions_Reuse_in_RTL_Test_Pattern_Generation

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An approach for verification assertions reuse in RTL test pattern generationJenihhin, Maksim; Raik, Jaan; Fujiwara, Hideo; Ubar, Raimund-Johannes; Viilukas, TaaviDigest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China2010 / p. 107-110 : ill

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An educational environment for digital testing : hardware, tools, and web-based runtime platformJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, VladislavProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 412-419 : ill https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf

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An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-Johannes2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium2011 / p. 185-190 : ill

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An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

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36

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An improved test generation approach for sequential circuits using decision diagramsBrik, Marina; Ubar, Raimund-JohannesBEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings1998 / p. 155-158: ill

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37

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Analysis of a test method for delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Ubar, Raimund-Johannes; Peng, ZeboProceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 20062006 / p. 42-46 : ill

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Applets for learning digital design and test [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Wuttke, Heinz-Dietrich1st International Conference on Interactive Mobile and Computer Aided Learning (IMCL2006) : Amman, Jordan, April 19-21, 20062006 / p. 1-4 : ill. [CD-ROM]

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journal article

Application of high-level decision diagrams for simulation-based verification tasksJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Ubar, Raimund-JohannesEstonian journal of engineering2010 / 1, p. 56-77 : ill

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Application of sequential test set compaction to LFSR reseedingAleksejev, Igor; Jutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 102-107 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738292

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Application of structurally synthesized binary decision diagrams for timing simulation of digital circuitsJutman, Artur; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2001 / 4, p. 269-288 : ill

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42

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Application specific true critical paths identification in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Oyeniran, Adeboye Stephen2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 299-304 : ill https://doi.org/10.1109/IOLTS.2019.8854442

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An approach to system-level design for testJervan, Gert; Ubar, Raimund-Johannes; Peng, Z.; Eles, PetruSystem-level test and validation of hardware/software systems2005 / p. 121-149 : ill

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44

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APRICOT : a framework for teaching digital systems verificationRaik, Jaan; Jenihhin, Maksim; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-Johannes19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings2008 / p. 172-177 : ill http://dx.doi.org/10.1109/EAEEIE.2008.4610181

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Arvamusi akadeemikutelt : teadustulemused, hinnangud ja ettepanekud : [arvamust avaldavad Jüri Engelbrecht, Ülo Lille, Boris Tamm, Mihkel Veiderma, Valdek Kulbach, Rein Küttner, Raimund-Johannes Ubar jt.]Engelbrecht, Jüri; Lille, Ülo; Tamm, Boris, inform.; Veiderma, Mihkel; Kulbach, Valdek; Küttner, Rein; Ubar, Raimund-JohannesEesti Teaduste Akadeemia aastaraamat 19971998 / lk. 121-143

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Arvamusi akadeemikutelt ["kuumade teemade" kohta oma erialal]Küttner, Rein; Lille, Ülo; Saarma, Mart; Tamm, Boris, inform.; Ubar, Raimund-Johannes; Veiderma, Mihkel; Engelbrecht, JüriEesti Teaduste Akadeemia aastaraamat 19981999 / lk. 148-171

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Arvamusi akadeemikutelt [oluliste teadusprobleemide kohta]Küttner, Rein; Lille, Ülo; Ubar, Raimund-Johannes; Veiderma, Mihkel; Öpik, Ilmar; Engelbrecht, JüriEesti Teaduste Akadeemia aastaraamat 19992000 / lk. 137-174

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Arvamusi akadeemikutelt [oluliste teadusprobleemide kohta]Engelbrecht, Jüri; Kaljo, Dimitri; Krumm, Lembit; Mõtus, Leo; Tõugu, Enn; Ubar, Raimund-JohannesEesti Teaduste Akadeemia aastaraamat 20052006 / lk. 177-204. (Arvamusi akadeemikutelt)

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Arvamusi akadeemikutelt [oluliste teadusprobleemide kohta]Engelbrecht, Jüri; Kaljo, Dimitri; Ubar, Raimund-JohannesEesti Teaduste Akadeemia aastaraamat = Annales academiae scientarum Estonicae 20132014 / lk. 258-273

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journal article

Arvutid diagnoosivad arvuteidUbar, Raimund-JohannesSide. Raadio. Televisioon : infoseeria 101985 / lk. 6-10 https://www.ester.ee/record=b1232303*est

journal article

Ubar, Raimund-Johannes (author)

types of item

CV 61

author 57

name of the person 28

subject term 1