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Ubar, Raimund-Johannes (author)
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126
book article
Constraint-based hierarchical untestability identification for synchronous sequential circuits
Raik, Jaan
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Viilukas, Taavi
;
Ubar, Raimund-Johannes
;
Fujiwara, Hideo
Sixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim
2011
/
p. 147-152
book article
127
book article
Constraint-based hierarchical untestability identification for syncronous sequential circuits
Viilukas, Taavi
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Rannaste, Anna
;
Jenihhin, Maksim
;
Fujiwara, Hideo
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 139-142 : ill
book article
128
book article
Constraint-based test pattern generation at the register-transfer level
Viilukas, Taavi
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Krivenko, Anna
Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria
2010
/
p. 352-357 : ill
http://dx.doi.org/10.1109/DDECS.2010.5491752
book article
129
book article
A constraint-driven gate-level test generator
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Krupnova, Helena
BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings
1996
/
p. 237-240: ill
book article
130
book article
Constraints analysis in hierarchical test generation for digital systems
Ubar, Raimund-Johannes
;
Krupnova, Helena
BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1
1994
/
p. 313-318: ill
book article
131
journal article
Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphs
Matrosova, A.Yu.
;
Pleshkov, A.G.
;
Ubar, Raimund-Johannes
Automation and remote control
2005
/
p. 313-327 : ill
http://dx.doi.org/10.1007/s10513-005-0054-9
journal article
132
book article
Critical path tracing based simulation of transition delay faults
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings
2014
/
p. 108-113 : ill
book article
133
book article
Critical path tracing based simulation of transition delay faults
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Devadze, Sergei
;
Raik, Jaan
Proceedings of the 8th Annual Conference of the Estonian National Doctoral School in Information and Communication Technologies : December 5-6, 2014, Rakvere
2014
/
p. 61-66 : ill
book article
134
book article
Cycle-based simulation algorithms for digital systems using high-level decision diagrams
Morawiec, Adam
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Design, Automation and Test in Europe : Conference and Exhibition 2000 : Paris, France, March 27-30, 2000 : proceedings
2000
/
p. 743
book article
135
book article
Cycle-based simulation with decision diagrams
Ubar, Raimund-Johannes
;
Morawiec, Adam
;
Raik, Jaan
Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings
1999
/
p. 454-458: ill
book article
136
book article
DECIDER : a decision diagram based hierarchical test generation system
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 2nd International Workshop on Design and Diagnostics of Electronic Circuits and Systems, Szczyrk, Poland, September 2-4, 1998
1998
/
p. 269-273
book article
137
journal article
DECIDER : a system for hierarchical test pattern generation
Raik, Jaan
;
Ubar, Raimund-Johannes
Radioelectronics and informatics
2003
/
p. 40-45 : ill
https://www.researchgate.net/publication/250395975_DECIDER_A_System_for_Hierarchical_Test_Pattern_Generation
journal article
138
book article
A decision diagram based hierarchical test pattern generator
Jervan, Gert
;
Markus, Antti
;
Raik, Jaan
;
Ubar, Raimund-Johannes
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
1998
/
p. 159-162: ill
book article
139
journal article
Decision diagrams - from a mathematical notion to engineering applications
Stankovic, Radomir S.
;
Ubar, Raimund-Johannes
;
Astola, Jaakko
Facta Universitatis [Niš]. Series electronics and energetics
2011
/
p. 281-301 : ill
http://dx.doi.org/10.2298/FUEE1103281S
journal article
140
book article
Decision diagrams and digital test
Ubar, Raimund-Johannes
ECMS 2003 : 6th International Workshop on Electronics, Control, Measurment and Signals : Liberec, Czechia, June 2-4, 2003
2003
/
p. 266-273 : ill
http://www.midem-drustvo.si/Journal%20papers/MIDEM_35(2005)4p187.pdf
book article
141
book article
Decision diagrams and digital test
Ubar, Raimund-Johannes
41th International Conference on Microelectronics, Devices and Materials : MIDEM 2005 : Ribno at Bled, Slovenia : invited plenary paper
2005
/
p. 15-26
book article
142
book article
Decision diagrams for diagnostic modeling
Ubar, Raimund-Johannes
MEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia
2015
/
p. 43
book article
143
book article
Deductive fault simulation on structurally synthesized BDDs
Aarna, Margit
;
Ubar, Raimund-Johannes
;
Raik, Jaan
BEC 2004 : Baltic Electronics Conference : Post-Graduate Student Session : Tallinn University of Technology, October 3-6, 2004, Tallinn, Estonia
2004
/
p. 11 : ill
book article
144
book article
Defect oriented fault coverage of 100stuck-at fault test sets
Blyzniuk, M.
;
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Lobur, M.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
2000
/
p. 511-516 : ill
book article
145
book article
Defect-oriented BIST quality analysis
Kruus, Helena
;
Ubar, Raimund-Johannes
;
Raik, Jaan
BEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia
2010
/
p. 153-156 : ill
book article
146
book article
Defect-oriented fault simulation and test generation in digital circuits
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California
2001
/
p. 365-371
https://ieeexplore.ieee.org/document/915257
book article
147
book article
Defect-oriented library builder and hierarchical test generation
Cibakova, Tatiana
;
Gramatova, Elena
;
Kuzmicz, W.
;
Pleskacz, Witold A.
;
Raik, Jaan
;
Ubar, Raimund-Johannes
IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001
2001
/
p. 163-168 : ill
book article
148
journal article
Defect-oriented mixed-level fault simulation in digital systems
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Ivask, Eero
;
Brik, Marina
Facta Universitatis [Niš]. Series electronics and energetics
2002
/
1, April, p. 123-136 : ill
journal article
149
book article
Defect-oriented modul-level fault diagnosis in digital circuits
Kostin, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
Proceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany
2011
/
p. 81-86
book article
150
book article
Defect-oriented test- and layout-generation for standard-cell ASIC designs
Sudbrock, Joachim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Kuzmicz, Wieslaw
;
Pleskacz, Witold A.
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 79-82 : ill
https://ieeexplore.ieee.org/document/1559781
book article
Number of records 834, displaying
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CV
61
1.
Ubar, Raimund-Johannes 1941
2.
Räämet, Raimund 1918-2004
3.
Aare, Johannes 1915-2000
4.
Aavik, Eduard-Johannes
5.
Ahrenschild, Johannes (-1936)
6.
Alaots, Johannes
7.
Aljak, Arnold Johannes
8.
Allik, Erich-Johannes
9.
Avik, Eduard Johannes 1891-1942
10.
Drechsler, Wolfgang Johannes Max
11.
Ehala, Johannes 1986
12.
Hint, Johannes 1914-1985
13.
Johannes, Ille 1939
14.
Johannson, Johannes
15.
Johanson, Johannes
16.
Juhans, Johannes 1874-1956
17.
Kajander, Aleksi Oskar Johannes 1994
18.
Kiiwet, Johannes
19.
Kiivet, Johannes 1879-1967
20.
Kivit, Johannes
21.
Kollist, Johannes 1884-1937
22.
Kollist, Johannes Theodor
23.
Korv, August Johannes 1911-1981
24.
Krimmer, Robert Johannes
25.
Käpp, Martin Johannes
26.
Langel, Johannes 1900-1985
27.
Langell, Johannes
28.
Livländer, Robert Johannes
29.
Lutsar, Richard-Johannes
30.
Madise, Johannes 1920-?
31.
Maltenek, Evald Leonhard Johannes
32.
Matsulevitš, Johannes
33.
Meitre, Johannes 1906-1978
34.
Messer, Johannes
35.
Muru, Johannes 1995
36.
Mäll, Johannes 1911-1981
37.
Mühlman, Johannes
38.
Mühlmann, Johannes 1888-1936
39.
Notermans, Antonius Johannes Hubertus 1959
40.
Nuudi, Johannes 1895-1975
41.
Palo, Johannes 1925-1960
42.
Pals, Johannes 1903-1941
43.
Pello, Johannes 1958
44.
Pervik, Johannes 1892-1958
45.
Presmann, Johannes 1942
46.
Putk, Aksel-Johannes 1928-1999
47.
Püümann, Mait Johannes
48.
Renter, Olav-Johannes
49.
Roes, Johannes 1914
50.
Russwurm, Johannes
51.
Russvurm, Johannes 1855-1939
52.
Russvurm, Johannes Carl Gysbert Immanuel
53.
Sakeus, Johannes 1880-1934
54.
Taimsalu, Johannes 1891-1942
55.
Teiman, Johannes
56.
Teimann, Johannes Rudolf (kuni 22.05.1935)
57.
Tomson, Johannes
58.
Tuulre, Feliks Johannes 1908-1987
59.
Veerus, Johannes Voldemar 1897-1972
60.
Verus, Johannes Voldemar
61.
Vuhk, Oskar Johannes
author
57
1.
Ubar, Raimund-Johannes
2.
Hagelberg, Raimund
3.
Räämet, Raimund
4.
Aare, Johannes
5.
Allas, Johannes-Emmanuel
6.
Avik, Eduard Johannes
7.
Bauer, Johannes
8.
Bender, Naatan Johannes
9.
Buchmann, Johannes
10.
Deelstra, Johannes
11.
Ehala, Johannes
12.
Engelmayer, Johannes
13.
Gotzmann, Johannes
14.
Helander, Johannes
15.
Hint, Johannes
16.
Hüsse, Johannes
17.
Johannes, Anu
18.
Johannes, Ellen
19.
Johannes, Ille
20.
Johannes, Kaljo-Mihkel
21.
Järv, Johannes
22.
Kadak, Johannes
23.
Kajander, Aleksi Oskar Johannes
24.
Karstensen, Johannes
25.
Kerkhoven, Eduard Johannes
26.
Kiivet, Johannes
27.
Krimmer, Robert Johannes
28.
Kukebal, Johannes
29.
Meitre, Johannes
30.
Miller, Johannes
31.
Mühlman, Johannes
32.
Norberg, Johannes
33.
Notermans, Antonius Johannes Hubertus
34.
Ortlepp, Johannes
35.
Parikas, Johannes
36.
Pello, Johannes
37.
Pervik, Johannes-Eduard
38.
Piiper, Johannes
39.
Presmann, Johannes
40.
Putk, Aksel-Johannes
41.
Pätsch, Johannes
42.
Saar, Johannes
43.
Sautter, Johannes
44.
Sinisalo, Touko Johannes
45.
Steinbrunn, Johannes
46.
Sutt, Johannes
47.
Zeiringer, Johannes Paul
48.
Taimsalu, Johannes
49.
Talu, Martin Johannes
50.
Tammekänd, Johannes
51.
Tilk, Johannes
52.
Tralla, Johannes
53.
Veerus, Johannes
54.
Vibur, Johannes Ferdinand
55.
Vind, Johannes
56.
Voll, Johannes
57.
Voltri, Johannes
name of the person
28
1.
Ubar, Raimund-Johannes, 1941-
2.
Hagelberg, Raimund, 1927-2012
3.
Räämet, Raimund, 1918-2004
4.
Aare, Johannes, 1915-2000
5.
Aavik, Johannes, 1880-1973
6.
Avik, Eduard Johannes, 1891-1942
7.
Bender, Naatan Johannes
8.
Erm, Johannes, 1998-
9.
Granö, Johannes Gabriel
10.
Hint, Johannes, 1914-1985
11.
Johannes Paulus II, paavst, 1920-2005
12.
Kert, Johannes
13.
Kiivet, Johannes, 1879-1967
14.
Kollist, Johannes
15.
Käis, Johannes
16.
Lang, Johannes
17.
Maide, Johannes Voldemar
18.
Mossov, Johannes
19.
Pals, Johannes, 1903-1941
20.
Pello, Johannes
21.
Putk, Aksel-Johannes
22.
Rammul, Aleksander Johannes, 1875-1949
23.
Steinbrunn, Johannes
24.
Taimsalu, Johannes, 1891-1942
25.
Talu, Martin Johannes
26.
Veerus, Johannes Voldemar, 1897-1972
27.
Veski, Johannes Voldemar, 1873-1968
28.
Voll, Johannes
subject term
1
1.
Johannes Mittus, vasevalamise tööstus
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