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Elektroonika kompetentsuskeskus avas uksed kasutajatele Tallinna TehnikaülikoolisUbar, Raimund-JohannesTallinna Ülikoolid1996 / 1. veebr., lk. 2-3: ill

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227

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Elektroonika kompetentsuskeskus Tallinna Tehnikaülikooli juuresUbar, Raimund-JohannesArvutustehnika ja Andmetöötlus1994 / 2, lk. 33-36 ; 3, lk. 28-33

journal article

228

journal article

Elektroonika kompetentsuskeskus Tallinna TehnikaülikoolisUbar, Raimund-JohannesSõnumileht1996 / 13. veebr., lk. 17

journal article

229

journal article

Elektroonika kompetentsuskeskusest Tallinna Tehnikaülikooli juuresUbar, Raimund-JohannesArvutustehnika ja Andmetöötlus1996 / 1, lk. 2-4

journal article

230

book article

Elektroonika kui Eesti innovatsioonisüsteemi infrastruktuurMin, Mart; Rang, Toomas; Ubar, Raimund-JohannesEesti teadlaste kongress, 11.-15. augustini 1996. a. Tallinnas : ettekannete kokkuvõtted1996 / lk. 265 https://www.ester.ee/record=b1052731*est

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231

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Elektroonikadisaini uued paradigmadUbar, Raimund-JohannesA & A1998 / 5, lk. 5-10

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232

journal article

Elektroonikatööstuse 50 miljonitUbar, Raimund-JohannesLuup1999 / 1, lk. 23-25: ill

journal article

233

book article

Embedded diagnosis in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2008 26th International Conference on Microelectronics : Niš, Serbia, 11-14 May 2008 : proceedings. Vol. 22008 / p. 421-424 : ill

book article

234

journal article

Embedded fault diagnosis in digital systems with BISTUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanMicroprocessors and microsystems2008 / 5/6, p. 279-287 : ill

journal article

235

book article

Energy minimization for hybrid BIST in a system-on-chip test environmentUbar, Raimund-Johannes; Shchenova, Tatjana; Jervan, Gert; Peng, ZeboEuropean Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings2005 / p. 2-7 : ill

book article

236

book article

Enhancing hierarchical ATPG with a functional fault model for multiplexers [Electronic resource]Raik, Jaan; Ubar, Raimund-Johannes7th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 18-21, 2004, Stará Lesná, Slovakia : proceedings2004 / p. 219-222 : ill. [CD-ROM]

book article

237

journal article

Environment for FPGA-based fault emulationEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesProceedings of the Estonian Academy of Sciences. Engineering2006 / 3-2, p. 323-335 : ill

journal article

238

book article

Environment for innovative university research training in the field of digital testOyeniran, Adeboye Stephen; Ademilua, Tolulope; Kruus, Margus; Ubar, Raimund-Johannes2021 30th Annual Conference of the European Association for Education in Electrical and Information Engineering (EAEEIE)2021 https://doi.org/10.1109/EAEEIE50507.2021.9531003

book article

239

journal article

Environment for the analysis of functional self-test quality in digital systemsUbar, Raimund-Johannes; Kostin, Sergei; Kruus, Helena; Aarna, Margit; Devadze, SergeiProceedings of the Estonian Academy of Sciences2014 / p. 151-162 : ill https://artiklid.elnet.ee/record=b2673964*est

journal article

240

book article

Equivalent transformations of structurally synthesized BDDs and applicationsJürimägi, Lembit; Ubar, Raimund-Johannes; Viies, Vladimir2019 8th Mediterranean Conference on Embedded Computing (MECO)2019 / 6 p. : ill https://doi.org/10.1109/MECO.2019.8760283

book article

241

book article

Evolutionary approach to test generation for functional BISTSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-Johannes; Raik, JaanInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. 151-155 : ill https://artiklid.elnet.ee/record=b1018764*est

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242

book article

Evolutionary approach to the functional test generation for digital circuitsSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 229-232 : ill

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243

journal article

Exact parallel critical path fault tracing to speed-up fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanInternational journal of microelectronics and computer science2018 / p. 9−18 https://ijmcs.dmcs.pl/web/guest/vol.-9-no.-1 https://ijmcs.dmcs.pl/documents/10630/345460/IJMCS_1_2018_2.pdf

journal article

244

book article

Exact static compaction of independent test sequencesRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 315-318 : ill

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245

book article

Exact static compaction of sequential circuit tests using branch-and-bound and search state registrationRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesETW'02 : 7th IEEE European Test Workshop, Gorfu Greece, May 26-29, 2002 : informal digest2002 / p. 19-20 https://www.researchgate.net/publication/250423148_Exact_Static_Compaction_of_Sequential_Circuit_Tests_Using_Branch_and-Bound_and_Search_State_Registration

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246

book article

Experimental comparison of different diagnosis algorithms in the BIST environmentUbar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan; Kruus, MargusProceedings of the 16th IASTED International Conference on Applied Simulation and Modelling : August 29-31, 2007, Palma de Mallorca, Spain2007 / p. 271-276 : ill

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247

book article

Exploiting high-level descriptions for circuits fault tolerance assessmentsBenso, A.; Prinetto, Paolo; Rebaudengo, M.; Sonza Reorda, Matteo; Raik, Jaan; Ubar, Raimund-Johannes1997 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Paris, October 20-22, 19971997 / p. 212-216

book article

248

book article

Explorations in low area overhead DfT techniques for sequential BISTRaik, Jaan; Raidma, Rein; Ubar, Raimund-JohannesIEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings2003 / p. 220-223 : ill

book article

249

book article

An external diagnosis method for network-on-a-chipRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIEEE/ACM Design Automation and Test in Europe, Workshop on Diagnostic Services in Networks-on-Chips - Test, Debug and On-line Monitoring : April 16-20, 2007, Nice, France2007 / [2] p. : ill

book article

250

book article

Fast and efficient static compaction of test sequences based on greedy algorithmsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 117-122

book article

Ubar, Raimund-Johannes (author)

types of item

CV 61

author 57

name of the person 28

subject term 1