Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

fault localization (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 3
Vaata veel.. (1/113)
Ekspordi

ekspordi kõik päringu tulemused (3)
Salvesta TXT fail

Salvesta PDF fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel ajakirjas

Directional calibration of rogowski coil for localization of partial discharges in smart distribution networksShafiq, Muhammad; Kütt, Lauri; Isa, M.; Hashmi, M.; Lehtonen, MattiInternational review of electrical engineering2012 / p. 5881-5890 https://www.researchgate.net/publication/262703688_Directional_Calibration_of_Rogowski_Coil_for_Localization_of_Partial_Discharges_in_Smart_Distribution_Networks

artikkel ajakirjas
2

artikkel kogumikus

From online fault detection to fault management in network-on-chips : a ground-up approachAzad, Siavoosh Payandeh; Niazmand, Behrad; Janson, Karl; Nevin, George; Oyeniran, Adeboye Stephen; Putkaradze, Tsotne; Apneet Kaur; Raik, Jaan; Jervan, Gert; Ubar, Raimund-Johannes; Hollstein, ThomasProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 48-53 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus
3

artikkel kogumikus EST / artikkel kogumikus ENG

Special session: in-field ML-assisted intermittent fault localization and management in RISC-V SoCsSelg, Hardi; Shibin, Konstantin; Tsertov, Anton; Jenihhin, Maksim; Ellervee, Peeter; Raik, Jaan2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)2024 https://doi.org/10.1109/DFT63277.2024.10753541 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

Kirjeid leitud 3, kuvan 1 - 3

1. fault localization
2. spectrum-based fault localization
3. localization of faults
4. accurate localization
5. acoustic localization
6. acoustic source localization
7. carrier localization
8. design error localization
9. energy localization
10. error localization
11. gunshot acoustic localization
12. IoT localization applications
13. localization
14. localization in sheet metal
15. map-based localization
16. multiple source localization
17. nuclear localization
18. RNA localization
19. shooter acoustic localization
20. simultaneous localization and mapping (SLAM)
21. source localization
22. subcellular localization
23. vessel localization
24. asynchronous fault detection
25. automatic fault diagnosis
26. bearing fault diagnosis
27. bi-directional fault monitoring devices
28. conditional fault collapsing
29. control fault models
30. critical path fault tracing
31. cross-layer fault tolerance
32. cross-layered fault management
33. extended fault class
34. fault currents
35. fault analysis
36. fault analysis model
37. fault classification
38. fault classification
39. fault collapsing
40. fault compensation
41. fault coverage
42. fault current and voltage measurements
43. Fault current limite
44. fault current limiter
45. fault detection
46. fault detection and diagnoses
47. fault detection and diagnosis
48. fault diagnosis
49. fault diagnostic
50. fault diagnostic resolution
51. fault diagnostics
52. fault dignosis
53. fault effects
54. fault emulation
55. fault equivalence and dominance
56. fault handling
57. fault handling strategy
58. fault indicator
59. fault injection
60. Fault Injection Simulation
61. fault Interruption
62. fault location
63. fault management
64. fault masking
65. fault modeling
66. fault models
67. fault monitoring
68. fault prediction
69. fault protection
70. fault redundancy
71. fault resilience
72. fault ride through
73. Fault ride through enhancement
74. fault signal
75. fault simulastion
76. fault simulation
77. fault simulation with critical path tracing
78. fault tolerance
79. fault tolerant
80. fault tolerant control
81. fault tolerant operation
82. fault tolerant router design
83. fault tolerant systems
84. fault tree analysis
85. fault-injection attack
86. fault-plane solution
87. fault-resilience
88. fault-resistant
89. fault-ride-through (FRT)
90. fault-tolerance
91. fault-tolerant
92. Fault-tolerant (FT) converters
93. fault-tolerant control
94. fault-tolerant converter
95. functional fault model
96. high-level control fault model
97. high-level fault coverage
98. high-level fault model
99. high-level fault simulation
100. high-level functional fault model
101. Katun fault
102. low-level fault redundancy
103. no fault found
104. No-Fault-Found
105. open circuit fault
106. Parallel Fault Simulation with Critical Path Backtracing
107. parallel fault-simulation
108. short circuit fault
109. stacking fault
110. stuck-at fault model
111. test generation and fault diagnosis
112. transient fault mitigation
113. transmission lines fault

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu