Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

fault masking (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 5
Vaata veel.. (1/96)
Ekspordi

ekspordi kõik päringu tulemused (5)
Salvesta TXT fail

Salvesta PDF fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel kogumikus

How to prove that a circuit is fault-free?Ubar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey2012 / p. 427-430 : ill https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free

artikkel kogumikus
2

artikkel kogumikus

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

artikkel kogumikus
3

artikkel kogumikus

Multiple fault testing in systems-on-chip with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen; Schölzel, Mario; Vierhaus, Heinrich TheodorProceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 20152015 / p. 66-71 : ill http://dx.doi.org/10.1109/IDT.2015.7396738

artikkel kogumikus
4

artikkel kogumikus

Multiple stuck-at-fault detection theoremUbar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia2012 / p. 236-241 : ill

artikkel kogumikus
5

artikkel kogumikus

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

artikkel kogumikus

Kirjeid leitud 5, kuvan 1 - 5

1. fault masking
2. Avoiding Mutual Masking of Multiple Faults
3. auditory masking
4. masking
5. military masking colour
6. asynchronous fault detection
7. automatic fault diagnosis
8. bearing fault diagnosis
9. bi-directional fault monitoring devices
10. conditional fault collapsing
11. control fault models
12. critical path fault tracing
13. cross-layer fault tolerance
14. cross-layered fault management
15. extended fault class
16. fault currents
17. fault analysis
18. fault analysis model
19. fault classification
20. fault classification
21. fault collapsing
22. fault compensation
23. fault coverage
24. fault current and voltage measurements
25. Fault current limite
26. fault current limiter
27. fault detection
28. fault detection and diagnoses
29. fault detection and diagnosis
30. fault diagnosis
31. fault diagnostic
32. fault diagnostic resolution
33. fault diagnostics
34. fault dignosis
35. fault effects
36. fault emulation
37. fault equivalence and dominance
38. fault handling
39. fault handling strategy
40. fault indicator
41. fault injection
42. Fault Injection Simulation
43. fault Interruption
44. fault localization
45. fault location
46. fault management
47. fault modeling
48. fault models
49. fault monitoring
50. fault prediction
51. fault protection
52. fault redundancy
53. fault resilience
54. fault ride through
55. Fault ride through enhancement
56. fault signal
57. fault simulastion
58. fault simulation
59. fault simulation with critical path tracing
60. fault tolerance
61. fault tolerant
62. fault tolerant control
63. fault tolerant operation
64. fault tolerant router design
65. fault tolerant systems
66. Fault Tree Analysis
67. fault-injection attack
68. fault-plane solution
69. fault-resilience
70. fault-resistant
71. fault-ride-through (FRT)
72. fault-tolerance
73. fault-tolerant
74. Fault-tolerant (FT) converters
75. fault-tolerant control
76. fault-tolerant converter
77. functional fault model
78. high-level control fault model
79. high-level fault coverage
80. high-level fault model
81. high-level fault simulation
82. high-level functional fault model
83. Katun fault
84. low-level fault redundancy
85. no fault found
86. No-Fault-Found
87. open circuit fault
88. Parallel Fault Simulation with Critical Path Backtracing
89. parallel fault-simulation
90. short circuit fault
91. spectrum-based fault localization
92. stacking fault
93. stuck-at fault model
94. test generation and fault diagnosis
95. transient fault mitigation
96. transmission lines fault

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu