Toggle navigation
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English
Intranet
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
English
Intranet
Andmebaasid
Publikatsioonid
Otsing
Valitud kirjed
0
fault simulation (võtmesõna)
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Lisa tingimus
Liitotsing
filter
Tühista
×
teaviku laadid
raamat
..
artikkel ajakirjas
..
artikkel ajalehes
..
artikkel kogumikus
..
dissertatsioon
..
Open Access
..
Teaduspublikatsioon
..
aasta
ilmumisaasta
Toon andmeid..
autor
Toon andmeid..
TTÜ struktuuriüksus
Toon andmeid..
märksõna
Toon andmeid..
seeria-sari
Toon andmeid..
tema kohta
Toon andmeid..
võtmesõna
Toon andmeid..
Tühista
Kirjeid leitud
14
Vaata veel..
(1/181)
Ekspordi
ekspordi kõik päringu tulemused
(14)
Salvesta TXT fail
Salvesta PDF fail
prindi
Märgitud kirjetega toimetamiseks ava
valitud kirjed
kuva
Bibliokirje
Lühikirje
reasta
autor kasvavalt
autor kahanevalt
ilmumisaasta kasvavalt
ilmumisaasta kahanevalt
pealkiri kasvavalt
pealkiri kahanevalt
1
artikkel kogumikus
Accelerating transient fault injection campaigns by using Dynamic HDL Slicing
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore
2019
/
7 p. : ill
https://doi.org/10.1109/NORCHIP.2019.8906932
artikkel kogumikus
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2
artikkel kogumikus
Conditional fault collapsing in digital circuits with shared structurally synthesized BDDs [Online resource]
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p. : ill
https://doi.org/10.1109/BEC.2018.8600967
artikkel kogumikus
3
artikkel ajakirjas
DeepAxe : a framework for exploration of approximation and reliability trade-offs in DNN accelerators
Taheri, Mahdi
;
Riazati, Mohamad
;
Ahmadilivani, Mohammad Hasan
;
Jenihhin, Maksim
;
Daneshtalab, Masoud
;
Raik, Jaan
;
Sjödin, Mikael
;
Lisper, Björn
arXiv.org
2023
/
8 p. : ill
https://doi.org/10.48550/arXiv.2303.08226
artikkel ajakirjas
4
artikkel ajakirjas
Distributed approach for parallel exact critical path tracing fault simulation
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
International journal of microelectronics and computer science
2010
/
p. 165-174 : ill
artikkel ajakirjas
5
artikkel ajakirjas
Distributed fault simulation with collaborative load balancing for VLSI circuits
Ivask, Eero
;
Devadze, Sergei
;
Ubar, Raimund-Johannes
Scalable computing : practice and experience
2011
/
p. 153-163 : ill
artikkel ajakirjas
6
artikkel kogumikus
Efficient fault injection based on dynamic HDL slicing technique
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Raik, Jaan
;
Sauer, Christian
2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece
2019
/
p. 52-53 : ill
https://doi.org/10.1109/IOLTS.2019.8854419
artikkel kogumikus
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
7
artikkel kogumikus
Fast RTL fault simulation using decision diagrams and bitwise set operations
Reinsalu, Uljana
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 3-5 October 2011, Vancouver, Canada
2011
/
p. 164-170
https://ieeexplore.ieee.org/document/6104440
artikkel kogumikus
8
artikkel ajakirjas
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
artikkel ajakirjas
9
artikkel kogumikus
High-level test data generation for software based self-test in microprocessors
Oyeniran, Adeboye Stephen
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 2017
2017
/
p. 86-91 : ill
https://doi.org/10.1109/MECO.2017.7977167
artikkel kogumikus
10
artikkel kogumikus
Modeling sequential circuits with shared structurally synthesized BDDs
Ubar, Raimund-Johannes
;
Marenkov, Mihhail
;
Mironov, Dmitri
;
Viies, Vladimir
Proceedings of 2014 9th International Design & Test Symposium (IDT) : Sheraton Club des Pins Hotel, Algiers, Algeria, December 16-18, 2014
2014
/
p. 130-135 : ill
artikkel kogumikus
11
artikkel kogumikus
Shared Structurally Synthesized BDDs for speeding-up parallel pattern simulation in digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Raik, Jaan
2015 Nordic Circuits and Systems Conference (NORCAS) : NORCHIP & International Symposium on System-on-Chip (SoC) : 1st IEEE NORCAS Conference : 26-28 October 2015, Oslo, Norway
2015
/
[4] p. : ill
http://dx.doi.org/10.1109/NORCHIP.2015.7364406
artikkel kogumikus
12
artikkel kogumikus EST
/
artikkel kogumikus ENG
Special session: reliability assessment recipes for DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Bosio, Alberto
;
Deveautour, Bastien
;
Dos Santos, Fernando Fernandes
;
Guerrero-Balaguera, Juan-David
;
Jenihhin, Maksim
;
Kritikakou, Angeliki
;
Sierra, Robert Limas
;
Raik, Jaan
;
Taheri, Mahdi
42nd IEEE VLSI Test Symposium, VTS 2024
2024
/
11 p. : ill
https://doi.org/10.1109/VTS60656.2024.10538707
Conference proceedings at Scopus
Article at Scopus
Article at WOS
artikkel kogumikus EST
/
artikkel kogumikus ENG
13
artikkel kogumikus
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
artikkel kogumikus
14
artikkel kogumikus
A tool set for teaching design-for-testability of digital circuits
Kostin, Sergei
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
EWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK
2016
/
[6] p. : ill
https://doi.org/10.1109/EWME.2016.7496466
artikkel kogumikus
Kirjeid leitud 14, kuvan
1 - 14
võtmesõna
181
1.
fault simulation
2.
fault simulation with critical path tracing
3.
high-level fault simulation
4.
parallel fault-simulation
5.
Fault Injection Simulation
6.
asynchronous fault detection
7.
automatic fault diagnosis
8.
bearing fault diagnosis
9.
bi-directional fault monitoring devices
10.
conditional fault collapsing
11.
control fault models
12.
critical path fault tracing
13.
cross-layer fault tolerance
14.
cross-layered fault management
15.
extended fault class
16.
fault currents
17.
fault analysis
18.
fault analysis model
19.
fault classification
20.
fault classification
21.
fault collapsing
22.
fault compensation
23.
fault coverage
24.
fault current and voltage measurements
25.
Fault current limite
26.
fault current limiter
27.
fault detection
28.
fault detection and diagnoses
29.
fault detection and diagnosis
30.
fault diagnosis
31.
fault diagnostic
32.
fault diagnostic resolution
33.
fault diagnostics
34.
fault dignosis
35.
fault effects
36.
fault emulation
37.
fault equivalence and dominance
38.
fault handling
39.
fault handling strategy
40.
fault indicator
41.
fault injection
42.
fault Interruption
43.
fault localization
44.
fault location
45.
fault management
46.
fault masking
47.
fault modeling
48.
fault models
49.
fault monitoring
50.
fault prediction
51.
fault protection
52.
fault redundancy
53.
fault resilience
54.
fault ride through
55.
Fault ride through enhancement
56.
fault signal
57.
fault simulastion
58.
fault tolerance
59.
fault tolerant
60.
fault tolerant control
61.
fault tolerant operation
62.
fault tolerant router design
63.
fault tolerant systems
64.
Fault Tree Analysis
65.
fault-injection attack
66.
fault-plane solution
67.
fault-resilience
68.
fault-resistant
69.
fault-ride-through (FRT)
70.
fault-tolerance
71.
fault-tolerant
72.
Fault-tolerant (FT) converters
73.
fault-tolerant control
74.
fault-tolerant converter
75.
functional fault model
76.
high-level control fault model
77.
high-level fault coverage
78.
high-level fault model
79.
high-level functional fault model
80.
Katun fault
81.
low-level fault redundancy
82.
no fault found
83.
No-Fault-Found
84.
open circuit fault
85.
short circuit fault
86.
spectrum-based fault localization
87.
stacking fault
88.
stuck-at fault model
89.
test generation and fault diagnosis
90.
transient fault mitigation
91.
transmission lines fault
92.
annual energy simulation
93.
back traced simulation
94.
building energy simulation
95.
building simulation
96.
casting simulation
97.
CFD simulation
98.
circuit simulation
99.
CoCoViLa simulation environment
100.
computer simulation
101.
computer simulation environments
102.
cooling simulation
103.
co-simulation
104.
data simulation
105.
digital real time simulation
106.
dynamic simulation
107.
electric field simulation
108.
emergency simulation
109.
energy simulation
110.
energy simulation software
111.
environmental performance assessment and simulation
112.
finite element method (FEM) simulation
113.
finite element simulation
114.
fluid flow simulation
115.
FMS modelling and simulation
116.
fullscale simulation
117.
gait simulation
118.
hardware-in-the loop simulation
119.
Hardware-in-the-Loop simulation
120.
hospital simulation
121.
hot/cold pressing and finite element model simulation
122.
hygrothermal simulation
123.
impact-abrasive simulation
124.
intelligent simulation
125.
intelligent simulation environment
126.
LES (large eddy simulation) method
127.
logic models and simulation
128.
logic simulation
129.
magnetics field simulation
130.
Mathematical simulation
131.
MATLAB simulation
132.
medical simulation
133.
meso-scale simulation
134.
MICA2 simulation
135.
modeling and simulation
136.
modelling and simulation
137.
Monte Carlo simulation
138.
Monte Carlo simulation (MCS)
139.
multi agent simulation
140.
multiscale simulation
141.
numerical simulation
142.
parallel simulation
143.
phase diagram simulation
144.
power system simulation
145.
ray-tracing simulation
146.
real time simulation
147.
real-time simulation
148.
register transfer and gate level simulation
149.
response simulation
150.
rheology simulation
151.
signal simulation
152.
signal simulation and modeling
153.
similar material simulation test
154.
simulation
155.
simulation analysis
156.
simulation applications
157.
simulation based static optimization
158.
simulation based TMY
159.
simulation model
160.
simulation modeling
161.
simulation models
162.
simulation of air change
163.
simulation of energy consumption
164.
simulation software "Delphin"
165.
simulation training
166.
simulationbased decision support
167.
simulation-based verification
168.
spinach simulation
169.
SUMO simulation
170.
supply chain simulation
171.
systems simulation
172.
TD-DFT simulation
173.
urban simulation
174.
validation of simulation model
175.
wear simulation
176.
vehicle simulation
177.
whole building simulation
178.
visual simulation
179.
3D simulation
180.
5G New Radio simulation
181.
(co-)simulation
×
vaste
algab
lõpeb
sisaldab
reasta
Relevantsuse alusel
kasvavalt
kahanevalt
ilmumisaasta
autor
TTÜ struktuuriüksus
märksõna
seeria-sari
tema kohta
võtmesõna
Otsing
Valikud
0
ilmumisaasta
AND
OR
NOT
autor
AND
OR
NOT
TTÜ struktuuriüksus
AND
OR
NOT
märksõna
AND
OR
NOT
seeria-sari
AND
OR
NOT
tema kohta
AND
OR
NOT
võtmesõna
AND
OR
NOT