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fault injection (võtmesõna)

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Kirjeid leitud 12
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ekspordi kõik päringu tulemused (12)
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artikkel kogumikus

Accelerating transient fault injection campaigns by using Dynamic HDL SlicingBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE Nordic Circuits and Systems Conference (NORCAS) : NORCHIP and International Symposium of System-on-Chip (SoC), 29-30 October 2019, Helsinki, Finland : proceedings in IEEE Xplore2019 / 7 p. : ill https://doi.org/10.1109/NORCHIP.2019.8906932

artikkel kogumikus
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
2

artikkel ajakirjas EST / artikkel ajakirjas ENG

Automated identification of application-dependent safe faults in automotive systems-on-a-chipsBagbaba, Ahmet Cagri; Augusto da Silva, Felipe; Sonza Reorda, Matteo; Hamdioui, Said; Jenihhin, Maksim; Sauer, ChristianElectronics2022 / art. 319 https://doi.org/10.3390/electronics11030319 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
3

artikkel kogumikus

Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

artikkel kogumikus
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
4

artikkel kogumikus

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

artikkel kogumikus
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
5

artikkel kogumikus

Efficient fault injection based on dynamic HDL slicing techniqueBagbaba, Ahmet Cagri; Jenihhin, Maksim; Raik, Jaan; Sauer, Christian2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS 2019) : 1-3 July 2019, Greece2019 / p. 52-53 : ill https://doi.org/10.1109/IOLTS.2019.8854419

artikkel kogumikus
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6

artikkel ajakirjas EST / artikkel ajakirjas ENG

EFIC-ME : a fast emulation based fault injection control and monitoring enhancementAbideen, Zain Ul; Rashid, Muhammad HaroonIEEE Access2020 / p. 207705-207716 https://doi.org/10.1109/ACCESS.2020.3038198 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
7

artikkel kogumikus

Machine learning to tackle the challenges of transient and soft errors in complex circuitsLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS), 1-3 July 2019, Greece2019 / p. 7-14 : ill https://doi.org/10.1109/IOLTS.2019.8854423

artikkel kogumikus
8

artikkel kogumikus

On the estimation of complex circuits functional failure rate by machine learning techniquesLange, Thomas; Balakrishnan, Aneesh; Glorieux, Maximilien; Alexandrescu, Dan; Sterpone, Luca49th Annual IEEE/IFIP International Conference on Dependable Systems and Networks - DSN 2019 : Supplemental Volume : proceedings2019 / p. 35-41 : ill https://doi.org/10.1109/DSN-S.2019.00021

artikkel kogumikus
Seotud publikatsioonid 1
- A synthetic, hierarchical approach for modelling and managing complex systems' quality and reliability = Sünteetiline, hierarhiline lähenemine keerukate süsteemide kvaliteedi ja töökindluse modelleerimiseks ja haldamiseks
9

artikkel kogumikus

Representing gate-level SET faults by multiple SEU faults on RT-levelBagbaba, Ahmet Cagri; Jenihhin, Maksim; Ubar, Raimund-Johannes; Sauer, Christian2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings2020 / art. 19889351, 6 p. : ill https://doi.org/10.1109/IOLTS50870.2020.9159715

artikkel kogumikus
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
10

artikkel ajakirjas

SALSy : security-aware layout synthesisEslami, Mohammad; Perez, Tiago Diadami; Pagliarini, Samuel NascimentoarXiv.org2024 / 13 p. : ill https://doi.org/10.48550/arXiv.2308.06201

artikkel ajakirjas
Seotud publikatsioonid 1
- On the use of defensive schemes for hardware security = Kaitseskeemid riistvara turvalisuse tagamiseks
11

artikkel ajakirjas EST / artikkel ajakirjas ENG

A systematic literature review on hardware reliability assessment methods for deep neural networksAhmadilivani, Mohammad Hasan; Taheri, Mahdi; Raik, Jaan; Daneshtalab, Masoud; Jenihhin, MaksimACM Computing Surveys2024 / art. 141 https://doi.org/10.1145/3638242 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
12

artikkel kogumikus

Use of formal methods for verification and optimization of fault lists in the scope of ISO26262Augusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2018 Design and Verification Conference (DVCON) Europe : [proceedings]2018 / 6 p. : ill https://repository.tudelft.nl/islandora/object/uuid%3Adbd7f22d-0324-45f5-9180-8fe3fc95a9ce

artikkel kogumikus
Seotud publikatsioonid 1
- Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

Kirjeid leitud 12, kuvan 1 - 12

1. fault injection
2. Fault Injection Simulation
3. fault-injection attack
4. false data injection attack
5. fiber-reinforced composites and injection molding
6. Gate Injection Transistor (GIT)
7. gating-aware error injection
8. ghost injection attack
9. injection molding
10. injection of technical water
11. manual hydrodynamic injection
12. power injection
13. reactive power injection
14. zero injection phase
15. asynchronous fault detection
16. automatic fault diagnosis
17. bearing fault diagnosis
18. bi-directional fault monitoring devices
19. conditional fault collapsing
20. control fault models
21. critical path fault tracing
22. cross-layer fault tolerance
23. cross-layered fault management
24. extended fault class
25. fault currents
26. fault analysis
27. fault analysis model
28. fault classification
29. fault classification
30. fault collapsing
31. fault compensation
32. fault coverage
33. fault current and voltage measurements
34. Fault current limite
35. fault current limiter
36. fault detection
37. fault detection and diagnoses
38. fault detection and diagnosis
39. fault diagnosis
40. fault diagnostic
41. fault diagnostic resolution
42. fault diagnostics
43. fault dignosis
44. fault effects
45. fault emulation
46. fault equivalence and dominance
47. fault handling
48. fault handling strategy
49. fault indicator
50. fault Interruption
51. fault localization
52. fault location
53. fault management
54. fault masking
55. fault modeling
56. fault models
57. fault monitoring
58. fault prediction
59. fault protection
60. fault redundancy
61. fault resilience
62. fault ride through
63. Fault ride through enhancement
64. fault signal
65. fault simulastion
66. fault simulation
67. fault simulation with critical path tracing
68. fault tolerance
69. fault tolerant
70. fault tolerant control
71. fault tolerant operation
72. fault tolerant router design
73. fault tolerant systems
74. Fault Tree Analysis
75. fault-plane solution
76. fault-resilience
77. fault-resistant
78. fault-ride-through (FRT)
79. fault-tolerance
80. fault-tolerant
81. Fault-tolerant (FT) converters
82. fault-tolerant control
83. fault-tolerant converter
84. functional fault model
85. high-level control fault model
86. high-level fault coverage
87. high-level fault model
88. high-level fault simulation
89. high-level functional fault model
90. Katun fault
91. low-level fault redundancy
92. no fault found
93. No-Fault-Found
94. open circuit fault
95. Parallel Fault Simulation with Critical Path Backtracing
96. parallel fault-simulation
97. short circuit fault
98. spectrum-based fault localization
99. stacking fault
100. stuck-at fault model
101. test generation and fault diagnosis
102. transient fault mitigation
103. transmission lines fault

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