Otsing - TalTech teadusportaal

Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English

Publikatsioonid

Publikatsioonid

Otsing

Valitud kirjed 0

high-level fault coverage (võtmesõna)

—

—

—

—

Lisa tingimus Liitotsing filter

Tühista

teaviku laadid

raamat ..

artikkel ajakirjas ..

artikkel ajalehes ..

artikkel kogumikus ..

dissertatsioon ..

Open Access ..

Teaduspublikatsioon ..

aasta

Toon andmeid..

Toon andmeid..

TTÜ struktuuriüksus

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Toon andmeid..

Tühista

Kirjeid leitud 4
Vaata veel.. (1/113)
Ekspordi

ekspordi kõik päringu tulemused (4)
Salvesta TXT fail

Salvesta PDF fail

prindi
Märgitud kirjetega toimetamiseks ava valitud kirjed

kuva

reasta
1

artikkel ajakirjas

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

artikkel ajakirjas
2

artikkel kogumikus

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

artikkel kogumikus
3

artikkel kogumikus

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

artikkel kogumikus
4

artikkel kogumikus EST / artikkel kogumikus ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

Kirjeid leitud 4, kuvan 1 - 4

1. high-level fault coverage
2. high-level control fault model
3. high-level fault model
4. high-level fault simulation
5. high-level functional fault model
6. fault coverage
7. logic level and high level BDDs
8. low-level fault redundancy
9. high level DD (HLDD)
10. high level synthesis
11. high-level control faults
12. high-level decision diagram
13. high-level decision diagrams
14. high-level decision diagrams (HLDD) synthesis
15. high-level expert group on AI
16. High-Level Synthesis (HLS)
17. high-level synthesis for test
18. high-level test data generation
19. High-Pressure High-Temperature Spark Plasma Sintering
20. code coverage
21. code-coverage
22. conceptual coverage
23. coverage
24. coverage factor
25. diagnostic coverage
26. gaps in coverage
27. insurance coverage
28. NB-IoT coverage
29. Security Coverage
30. stress coverage
31. test coverage
32. 5G coverage
33. asynchronous fault detection
34. automatic fault diagnosis
35. bearing fault diagnosis
36. bi-directional fault monitoring devices
37. conditional fault collapsing
38. control fault models
39. critical path fault tracing
40. cross-layer fault tolerance
41. cross-layered fault management
42. extended fault class
43. fault currents
44. fault analysis
45. fault analysis model
46. fault classification
47. fault classification
48. fault collapsing
49. fault compensation
50. fault current and voltage measurements
51. Fault current limite
52. fault current limiter
53. fault detection
54. fault detection and diagnoses
55. fault detection and diagnosis
56. fault diagnosis
57. fault diagnostic
58. fault diagnostic resolution
59. fault diagnostics
60. fault dignosis
61. fault effects
62. fault emulation
63. fault equivalence and dominance
64. fault handling
65. fault handling strategy
66. fault indicator
67. fault injection
68. Fault Injection Simulation
69. fault Interruption
70. fault localization
71. fault management
72. fault masking
73. fault modeling
74. fault models
75. fault monitoring
76. fault prediction
77. fault protection
78. fault redundancy
79. fault resilience
80. fault ride through
81. Fault ride through enhancement
82. fault signal
83. fault simulastion
84. fault simulation
85. fault simulation with critical path tracing
86. fault tolerance
87. fault tolerant
88. fault tolerant control
89. fault tolerant operation
90. fault tolerant router design
91. fault tolerant systems
92. Fault Tree Analysis
93. fault-injection attack
94. fault-plane solution
95. fault-resilience
96. fault-resistant
97. fault-ride-through (FRT)
98. fault-tolerance
99. fault-tolerant
100. Fault-tolerant (FT) converters
101. fault-tolerant control
102. fault-tolerant converter
103. functional fault model
104. Katun fault
105. no fault found
106. No-Fault-Found
107. open circuit fault
108. parallel fault-simulation
109. short circuit fault
110. stuck-at fault model
111. test generation and fault diagnosis
112. transient fault mitigation
113. transmission lines fault

vaste

reasta

Otsing
Valikud 0

ilmumisaasta

autor

TTÜ struktuuriüksus

märksõna

seeria-sari

tema kohta

võtmesõna

TalTech Raamatukogu

Akadeemia tee 1

13519

TalTech koduleht TalTech Raamatukogu koduleht Digikogu Digiteek Teadusandmed

6203551

data@taltech.ee

TalTech Raamatukogu