Toggle navigation
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
Switch to English
Intranet
Publikatsioonid
Profiilid
Uurimisrühmad
Registrid
Abi ja info
English
Intranet
Andmebaasid
Publikatsioonid
Otsing
Valitud kirjed
0
high-level fault model (võtmesõna)
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Kõikidelt väljadelt
Allika otsing
Autori otsing
Märksõna otsing
Pealkirja otsing
algab
sisaldab
täpne vaste
—
Lisa tingimus
Liitotsing
filter
Tühista
×
teaviku laadid
raamat
..
artikkel ajakirjas
..
artikkel ajalehes
..
artikkel kogumikus
..
dissertatsioon
..
Open Access
..
Teaduspublikatsioon
..
aasta
ilmumisaasta
Toon andmeid..
autor
Toon andmeid..
TTÜ struktuuriüksus
Toon andmeid..
märksõna
Toon andmeid..
seeria-sari
Toon andmeid..
tema kohta
Toon andmeid..
võtmesõna
Toon andmeid..
Tühista
Kirjeid leitud
2
Vaata veel..
(1/244)
Ekspordi
ekspordi kõik päringu tulemused
(2)
Salvesta TXT fail
prindi
Märgitud kirjetega toimetamiseks ava
valitud kirjed
kuva
Bibliokirje
Lühikirje
reasta
autor kasvavalt
autor kahanevalt
ilmumisaasta kasvavalt
ilmumisaasta kahanevalt
pealkiri kasvavalt
pealkiri kahanevalt
1
artikkel kogumikus
High-level combined deterministic and pseudo-exhuastive test generation for RISC processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
artikkel kogumikus
2
artikkel kogumikus
High-Level Combined Deterministic and Pseudo-exhuastive Test Generation for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
2019 IEEE European Test Symposium (ETS) : ETS 2019, May 27-31, 2019, Baden-Baden, Germany : Proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/ETS.2019.8791526
artikkel kogumikus
Kirjeid leitud 2, kuvan
1 - 2
võtmesõna
244
1.
high-level fault model
2.
high-level control fault model
3.
high-level functional fault model
4.
high-level fault coverage
5.
high-level fault simulation
6.
logic level and high level BDDs
7.
low-level fault redundancy
8.
fault analysis model
9.
functional fault model
10.
stuck-at fault model
11.
high level DD (HLDD)
12.
high level of security
13.
high level synthesis
14.
high-level control faults
15.
high-level decision diagram
16.
high-level decision diagrams
17.
high-level decision diagrams (HLDD) synthesis
18.
High-level Decision Diagrams for Modeling Digital Systems
19.
high-level expert group on AI
20.
high-level synthesis
21.
High-Level Synthesis (HLS)
22.
high-level synthesis for test
23.
high-level test data generation
24.
high-frequency model
25.
High-Pressure High-Temperature Spark Plasma Sintering
26.
AI-based fault detection
27.
asynchronous fault detection
28.
automatic fault diagnosis
29.
bearing fault diagnosis
30.
bi-directional fault monitoring devices
31.
conditional fault collapsing
32.
control fault models
33.
critical path fault tracing
34.
cross-layer fault tolerance
35.
cross-layered fault management
36.
extended fault class
37.
fault currents
38.
fault analysis
39.
fault classification
40.
fault classification
41.
fault collapsing
42.
fault compensation
43.
fault coverage
44.
fault current and voltage measurements
45.
Fault current limite
46.
fault current limiter
47.
fault detection
48.
fault detection and classification
49.
fault detection and diagnoses
50.
fault detection and diagnosis
51.
fault detection and diagnostics (FDD)
52.
fault diagnosis
53.
fault diagnostic
54.
fault diagnostic resolution
55.
fault diagnostics
56.
fault dignosis
57.
fault effects
58.
fault emulation
59.
fault equivalence and dominance
60.
fault handling
61.
fault handling strategy
62.
fault indicator
63.
fault injection
64.
Fault Injection Simulation
65.
fault Interruption
66.
fault localization
67.
fault location
68.
fault management
69.
fault masking
70.
fault modeling
71.
fault models
72.
fault monitoring
73.
fault prediction
74.
fault protection
75.
fault redundancy
76.
fault resilience
77.
fault ride through
78.
Fault ride through enhancement
79.
fault signal
80.
fault simulastion
81.
fault simulation
82.
fault simulation with critical path tracing
83.
fault tolerance
84.
fault tolerant
85.
fault tolerant control
86.
fault tolerant operation
87.
fault tolerant router design
88.
fault tolerant systems
89.
fault tree analysis
90.
fault-injection attack
91.
fault-plane solution
92.
fault-resilience
93.
fault-resistant
94.
fault-ride-through (FRT)
95.
fault-tolerance
96.
fault-tolerant
97.
Fault-tolerant (FT) converters
98.
fault-tolerant control
99.
fault-tolerant converter
100.
hybrid fault detection
101.
Katun fault
102.
no fault found
103.
No-Fault-Found
104.
open circuit fault
105.
Parallel Fault Simulation with Critical Path Backtracing
106.
parallel fault-simulation
107.
photovoltaic fault detection algorithms
108.
PV fault classification
109.
short circuit fault
110.
spectrum-based fault localization
111.
stacking fault
112.
test generation and fault diagnosis
113.
transient fault mitigation
114.
transmission lines fault
115.
absolute sea level
116.
airport level of service
117.
arousal level
118.
assurance level
119.
behaviour level test generation
120.
bi-level optimization
121.
CO2 level in classrooms
122.
CO2 level in classrooms and kindergartens
123.
confidence level
124.
country-level logistics
125.
Cross-level Modeling of Faults in Digital Systems
126.
customer compatibility level
127.
deep level
128.
deep level traps
129.
determination of the CO2 level
130.
determining the level of creatine
131.
digitalisation level
132.
distribution-level phasor measurement units (D-PMUs)
133.
education level
134.
exposure level
135.
extreme penetration level of non synchronous generation
136.
extreme sea-level prediction
137.
extreme water level
138.
gate-level analysis
139.
gate-level circuit abstraction
140.
gate-level netlist
141.
graduate level
142.
Hierarchical Multi-level Test Generation
143.
hierarchical two-level analysis
144.
improvement of safety level at enterprises
145.
improvement of safety level at SMEs
146.
initial level of security
147.
lake level
148.
level control
149.
level crossing
150.
level ice
151.
Level of paranoia
152.
level set
153.
level(s) methodology
154.
level-crossing ADC
155.
level-crossing analog-to-digital converters
156.
level-crossing analogue-to-digital converters (ADC)
157.
logic level
158.
lower trophic level models
159.
low-level control system transportation
160.
low-level radiation
161.
Low-level RF EMF
162.
macro-level industry influences
163.
mean sea level
164.
medium level of security
165.
module level power electronics (MLPE)
166.
module-level power electronics (MLPE)
167.
multi-level governance
168.
multi-level inverter
169.
multi-level leadership
170.
multi-level modeling
171.
multi-level perspective
172.
multi-level perspective of sustainability transitions
173.
multi-level selection and processing environment
174.
noise level
175.
operational level (OL)
176.
Price level
177.
Process/Product Sigma Performance Level (PSPL)
178.
PV module level power electronics
179.
register transfer and gate level simulation
180.
Register Transfer Level - RTL
181.
register transfer level modeling decision diagams
182.
register-transfer level
183.
Register-Transfer Level (RTL)
184.
relative sea level
185.
relative sea level changes
186.
relative sea-level change
187.
RH level
188.
school-level policies
189.
sea level
190.
sea level forecasting
191.
sea level prediction
192.
sea level rise
193.
sea level series
194.
sea level trend
195.
sea level: variations and mean
196.
sea-level
197.
sea-level changes
198.
sea-level equation
199.
Sea-level indicator
200.
sea-level prediction
201.
sea-level rise
202.
sea-level trend
203.
Security Level Evaluation
204.
service-level agreements
205.
seven-level multilevel
206.
Sigma performance level
207.
skin conductance level
208.
software level TMR
209.
software security level
210.
steel-level bureaucracy
211.
strategic level decision makers
212.
sufficient level of security
213.
system level
214.
system level hazards
215.
system level simulation
216.
system level test
217.
system planning level
218.
system-level analysis
219.
system-level evaluation
220.
task-level uninterrupted presence
221.
three-level
222.
three-level converter
223.
three-level inverter
224.
three-level neutral-point-clamped inverter
225.
three-level NPC inverter
226.
three-level T-type
227.
three-level T-type inverter
228.
three-level T-type quasi-impedance-source inverter (3L-T-type qZSI)
229.
three-level voltage inverter
230.
Tool Confidence Level
231.
top-level domain
232.
transaction-level modeling
233.
treatment level
234.
two-level inverter
235.
undergraduate level
236.
university level informatics education
237.
water level
238.
water level fluctuation
239.
water level measurements
240.
water level reconstruction
241.
water-level changes
242.
voltage level
243.
voltage level optimisation
244.
3-level T-type inverter
×
vaste
algab
lõpeb
sisaldab
reasta
Relevantsuse alusel
kasvavalt
kahanevalt
ilmumisaasta
autor
TTÜ struktuuriüksus
märksõna
seeria-sari
tema kohta
võtmesõna
Otsing
Valikud
0
ilmumisaasta
AND
OR
NOT
autor
AND
OR
NOT
TTÜ struktuuriüksus
AND
OR
NOT
märksõna
AND
OR
NOT
seeria-sari
AND
OR
NOT
tema kohta
AND
OR
NOT
võtmesõna
AND
OR
NOT