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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
79
1.
microprocessor testing
2.
microprocessor
3.
microprocessor chips
4.
microprocessor systems
5.
microprocessor test
6.
shakti microprocessor
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
at-speed testing
12.
benchmark testing
13.
Berridge testing
14.
cancer genomic testing
15.
compliance testing
16.
compositional testing
17.
computer aided testing
18.
conformance testing
19.
courses on electronic testing and design
20.
cybersecurity testing
21.
D. non-destructive testing
22.
design field testing
23.
destructive testing
24.
eddy current testing
25.
erosion testing
26.
fatigue testing
27.
fire testing
28.
hierarchical testing
29.
hypotheses testing
30.
integration testing
31.
laboratory scale testing
32.
load testing
33.
macro mechanical testing and green surface tribology
34.
material testing
35.
materials testing
36.
measurement and testing
37.
mechanical testing
38.
memory testing
39.
metamorphic testing
40.
model based testing
41.
model-based mutation testing
42.
model-based testing
43.
mutation testing
44.
network-testing
45.
non destructive testing
46.
nondestructive testing
47.
non-destructive testing
48.
on-site testing
49.
pin on disc wear testing
50.
PMU calibration testing
51.
PMU testing
52.
point-of-care testing
53.
processor core testing
54.
processor testing
55.
real-time HiL testing
56.
regression testing
57.
RISC processor testing
58.
robustness testing
59.
scenario testing
60.
scratch testing
61.
security testing
62.
small-scale fire testing
63.
software testing
64.
software-in-the-loop (SIL) testing
65.
stand-alone testing
66.
stress-testing
67.
substation testing methods
68.
system testing
69.
tensile testing
70.
testing
71.
testing methods
72.
testing of digital devices
73.
testing of generator
74.
testing of phasor measurement units
75.
two-dimensional array testing
76.
wafer testing
77.
wear testing
78.
vibration testing
79.
virtual testing
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