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fault redundancy (keyword)
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1
journal article EST
/
journal article ENG
Calculation of probabilistic testability measures for digital circuits with Structurally Synthesized BDDs
Jürimägi, Lembit
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Microprocessors and microsystems
2020
/
art. 103117, 12 p
https://doi.org/10.1016/j.micpro.2020.103117
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
2
book article
High-level test generation for processing elements in many-core systems
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Azad, Siavoosh Payandeh
;
Raik, Jaan
12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings
2017
/
8 p. : ill
http://dx.doi.org/10.1109/ReCoSoC.2017.8016156
book article
3
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
4
book article
Mixed-level identification of fault redundancy in microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Gürsoy, Cemil Cem
;
Raik, Jaan
LATS 2019 : 20th IEEE Latin American Test Symposium : Santiago, Chile, March 11th - 13th 2019
2019
/
6 p. : ill
https://doi.org/10.1109/LATW.2019.8704591
book article
5
book article
True path tracing in structurally synthesized BDDs for testability analysis of digital circuits
Ubar, Raimund-Johannes
;
Jürimägi, Lembit
;
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
Euromicro Conference on Digital System Design : DSD 2019 : 28 - 30 August 2019 Kallithea, Chalkidiki, Greece : proceedings
2019
/
p. 492-499 : ill
https://doi.org/10.1109/DSD.2019.00077
book article
Number of records 5, displaying
1 - 5
keyword
87
1.
fault redundancy
2.
low-level fault redundancy
3.
redundancy
4.
triple modular redundancy
5.
(N+1) redundancy
6.
asynchronous fault detection
7.
automatic fault diagnosis
8.
bearing fault diagnosis
9.
bi-directional fault monitoring devices
10.
conditional fault collapsing
11.
control fault models
12.
critical path fault tracing
13.
cross-layer fault tolerance
14.
cross-layered fault management
15.
extended fault class
16.
fault currents
17.
fault analysis
18.
fault analysis model
19.
fault classification
20.
fault classification
21.
fault collapsing
22.
fault compensation
23.
fault coverage
24.
fault current and voltage measurements
25.
Fault current limite
26.
fault detection
27.
fault detection and diagnoses
28.
fault detection and diagnosis
29.
fault diagnosis
30.
fault diagnostic
31.
fault diagnostic resolution
32.
fault diagnostics
33.
fault dignosis
34.
fault effects
35.
fault equivalence and dominance
36.
fault handling
37.
fault handling strategy
38.
fault indicator
39.
fault injection
40.
Fault Injection Simulation
41.
fault Interruption
42.
fault localization
43.
fault management
44.
fault masking
45.
fault modeling
46.
fault models
47.
fault monitoring
48.
fault prediction
49.
fault protection
50.
fault resilience
51.
fault ride through
52.
Fault ride through enhancement
53.
fault signal
54.
fault simulastion
55.
fault simulation
56.
fault simulation with critical path tracing
57.
fault tolerance
58.
fault tolerant
59.
fault tolerant control
60.
fault tolerant operation
61.
fault tolerant router design
62.
fault tolerant systems
63.
Fault Tree Analysis
64.
fault-injection attack
65.
fault-plane solution
66.
fault-resilience
67.
fault-resistant
68.
fault-ride-through (FRT)
69.
fault-tolerance
70.
fault-tolerant
71.
Fault-tolerant (FT) converters
72.
fault-tolerant control
73.
fault-tolerant converter
74.
functional fault model
75.
high-level control fault model
76.
high-level fault coverage
77.
high-level fault model
78.
high-level fault simulation
79.
high-level functional fault model
80.
Katun fault
81.
no fault found
82.
No-Fault-Found
83.
parallel fault-simulation
84.
stuck-at fault model
85.
test generation and fault diagnosis
86.
transient fault mitigation
87.
transmission lines fault
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