Otsing - TalTech teadusportaal

1. IEEE 9 bus test system
2. European and European Union Patents Court (EEUPC)
3. European Federation of National Academies of Sciences and Humanities All European Academies, (ALLEA)
4. accelerated shelf-life test
5. adaptive test strategy generation
6. antigen test
7. ASTM G65 dry sand rubber wheel abrasion test
8. automated test environment
9. automated test pattern generation
10. automatic test case generation
11. automatic test pattern generation
12. automatic test program generation
13. Auvergne test-bed
14. battery test
15. behavioral test
16. behaviour level test generation
17. bending test
18. bit-error rate test
19. Board and System Test
20. board test
21. bounds test
22. built-in self-test
23. capillary condensation redistribution test
24. chi-square test
25. closed bottle test
26. cognitive screening test
27. compartment fire test
28. compartment test
29. cone penetration test (CPT)
30. COVID-19 antigen test
31. cutting test
32. cybersecurity test bed
33. DDR4 interconnect test
34. design and test
35. design-for-test
36. deterministic test sequences
37. diagnostic test
38. digital test
39. Digital test and testable design
40. double-pulse test
41. drawing test
42. dry droplet antimicrobial test
43. embedded test
44. fan pressurisation test
45. final test result prediction
46. four-point bending test
47. FPGA based test
48. FPGA-Assisted Test
49. FPGA-centric test
50. functional self-test
51. functional test generation
52. Granger causality test
53. hardness test
54. high-level synthesis for test
55. high-level test data generation
56. highlevel test generation
57. high-speed serial link test
58. IEEE 1149.1
59. IEEE 1687
60. IEEE 802.15.6
61. IEEE 802156
62. IEEE C37.118.1
63. IEEE P1687
64. IEEE Std. 1687
65. implementation-independent test generation
66. in situ tensile test in SEM
67. industrial field test
68. in-situ tensile test in SEM
69. Johansen cointegration test
70. Kolmogorov-Smirnov test
71. load test
72. logic built-in self-test
73. Luria alternating series test
74. Mann–Kendall test
75. memory interconnect test
76. microprocessor test
77. Model test
78. multiplier test
79. offline test generation
80. orthogonal test
81. package test analysis
82. parallel design and test
83. performance test
84. piezocone penetration test (CPTu)
85. Point Load Test index
86. pressurisation test
87. processor-centric board test
88. progressive damage test
89. provably correct test generation
90. pseudo-exhaustive test
91. purity test
92. rtioco-based timed test sequences
93. seasonal Mann Kendall test
94. seismic piezocone penetration test
95. self-test
96. self-test architectures
97. sentence writing test
98. serial sevens test
99. ship towing test tank
100. similar material simulation test
101. small-scale fire test
102. small‐scale test
103. software based self-test
104. software-based self-test
105. software-based self-test (SBST)
106. soil phosphorus (P) test
107. standard test method
108. static load test
109. static-dynamic probing test (SDT)
110. stress test
111. system level test
112. teaching design and test of systems
113. tensile test
114. test
115. test and evaluation platform
116. test bench
117. test coverage
118. test driven development
119. test driven modelling
120. test embankment
121. test equipment
122. test generation
123. test generation and fault diagnosis
124. test groups
125. test model design
126. test optimization
127. test packets
128. test path synthesis
129. test patterns
130. test point insertion
131. test program generation
132. test reference year
133. test replication
134. test scenario description language
135. test-bed
136. test-chips
137. test-house
138. test-pattern
139. test-suite reduction
140. Three-point bending test
141. unit root test
142. 1995 ECC benchmark test
143. 24th IEEE International Conference on Industrial Technology 2023

1. European Test Symposium (ETS)
2. AI in business, workshop (2022 : Tallinn)
3. IEEE
4. 16PF (test)

1. IEEE

IEEE European Test Workshop (allikas)

teaviku laadid

võtmesõna 143

märksõna 4

TTÜ märksõna 1