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test program generation (võtmesõna)
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1
artikkel kogumikus
A new measure for calculating multiple fault coverage of microprocessor self-test
Oyeniran, Adeboye Stephen
;
Odozi, Uzochukwu Eddie
;
Ubar, Raimund-Johannes
BEC 2016 : 2016 15th Biennial Baltic Electronics Conference : proceedings of the 15th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 3-5, 2016, Tallinn, Estonia
2016
/
p. 75-78 : ill
http://www.ester.ee/record=b2150914*est
artikkel kogumikus
2
artikkel kogumikus
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
artikkel kogumikus
3
artikkel ajakirjas
Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Brik, Marina
Proceedings of the Estonian Academy of Sciences
2014
/
p. 48-61 : ill
artikkel ajakirjas
4
artikkel kogumikus
Software-based self-test generation for microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Jasnetski, Artjom
;
Brik, Marina
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
artikkel kogumikus
Kirjeid leitud 4, kuvan
1 - 4
võtmesõna
214
1.
automatic test program generation
2.
test program generation
3.
adaptive test strategy generation
4.
automated test pattern generation
5.
automatic test case generation
6.
automatic test pattern generation
7.
behaviour level test generation
8.
functional test generation
9.
high-level test data generation
10.
highlevel test generation
11.
implementation-independent test generation
12.
offline test generation
13.
provably correct test generation
14.
test generation
15.
test generation and fault diagnosis
16.
Alternative Transient Program-Electromagnetic Transient Program (ATP-EMTP)
17.
Apollo program
18.
automatic program synthesis
19.
Baltic-wide HELCOM COMBINE monitoring program
20.
college program
21.
master program
22.
monitoring program
23.
NATO. Science for Peace and Security Program
24.
program
25.
program analysis
26.
program equivalence
27.
program management
28.
program packages
29.
program transformation
30.
program verification
31.
SNAP program
32.
stufy program
33.
Activity-based demand generation
34.
automatic code generation
35.
Automatic generation control
36.
automatic GUI model generation
37.
building and urban form generation
38.
business model generation
39.
code generation
40.
disaster alert generation
41.
distributed electricity generation
42.
distributed generation
43.
Distributed Generation (DG)
44.
distributed power generation
45.
distrubuted power generation
46.
droplet generation
47.
droplet generation rate control
48.
electric power generation
49.
electricity generation
50.
energy generation
51.
extreme penetration level of non synchronous generation
52.
feasible path generation
53.
fifth generation computer
54.
fourth generation district heating
55.
frequent item generation
56.
generation
57.
generation and transmission expansion planning
58.
Generation Costs
59.
generation of electric energy
60.
generation succession
61.
heat generation
62.
hydroelectric power generation
63.
hydrogen generation
64.
I–III generation
65.
job generation
66.
multisine generation
67.
next generation 4D printing
68.
next generation sequencing
69.
Next-generation probiotics
70.
next-generation sequencing
71.
oil-shale power generation
72.
pattern Generation
73.
photovoltaic (PV) generation
74.
photovoltaic generation dispatch
75.
power generation
76.
power generation dispatch
77.
power generation economics
78.
power generation planning
79.
PV generation
80.
PV power generation
81.
Renewable energy generation
82.
renewable generation
83.
residual generation
84.
Second generation bioethanol
85.
second generation of tribology models
86.
second generation sequencing
87.
silver generation
88.
solar power generation
89.
space generation advisory council
90.
template based sql generation
91.
trajectory generation
92.
waste generation
93.
wave generation
94.
white light generation
95.
wind energy generation
96.
wind generation
97.
wind power generation
98.
4GDH (4th generation district heating)
99.
4th generation district heating
100.
5th generation district heating
101.
accelerated shelf-life test
102.
antigen test
103.
ASTM G65 dry sand rubber wheel abrasion test
104.
automated test environment
105.
Auvergne test-bed
106.
battery test
107.
behavioral test
108.
bending test
109.
bit-error rate test
110.
Board and System Test
111.
board test
112.
bounds test
113.
built-in self-test
114.
capillary condensation redistribution test
115.
chi-square test
116.
closed bottle test
117.
cognitive screening test
118.
compartment fire test
119.
compartment test
120.
cone penetration test (CPT)
121.
COVID-19 antigen test
122.
cutting test
123.
cybersecurity test bed
124.
DDR4 interconnect test
125.
design and test
126.
design-for-test
127.
deterministic test sequences
128.
diagnostic test
129.
digital test
130.
Digital test and testable design
131.
double-pulse test
132.
drawing test
133.
dry droplet antimicrobial test
134.
embedded test
135.
fan pressurisation test
136.
final test result prediction
137.
four-point bending test
138.
FPGA based test
139.
FPGA-Assisted Test
140.
FPGA-centric test
141.
functional self-test
142.
Granger causality test
143.
hardness test
144.
high-level synthesis for test
145.
high-speed serial link test
146.
IEEE 9 bus test system
147.
in situ tensile test in SEM
148.
industrial field test
149.
in-situ tensile test in SEM
150.
Johansen cointegration test
151.
Kolmogorov-Smirnov test
152.
load test
153.
logic built-in self-test
154.
Luria alternating series test
155.
Mann–Kendall test
156.
memory interconnect test
157.
microprocessor test
158.
Model test
159.
multiplier test
160.
orthogonal test
161.
package test analysis
162.
parallel design and test
163.
performance test
164.
piezocone penetration test (CPTu)
165.
Point Load Test index
166.
pressurisation test
167.
processor-centric board test
168.
pseudo-exhaustive test
169.
purity test
170.
rtioco-based timed test sequences
171.
seasonal Mann Kendall test
172.
self-test
173.
self-test architectures
174.
sentence writing test
175.
serial sevens test
176.
ship towing test tank
177.
similar material simulation test
178.
small‐scale test
179.
software based self-test
180.
software-based self-test
181.
software-based self-test (SBST)
182.
soil phosphorus (P) test
183.
standard test method
184.
static load test
185.
static-dynamic probing test (SDT)
186.
stress test
187.
system level test
188.
teaching design and test of systems
189.
tensile test
190.
test
191.
test and evaluation platform
192.
test bench
193.
test coverage
194.
test driven development
195.
test driven modelling
196.
test embankment
197.
test equipment
198.
test groups
199.
test model design
200.
test optimization
201.
test packets
202.
test path synthesis
203.
test patterns
204.
test point insertion
205.
test reference year
206.
test replication
207.
test scenario description language
208.
test-bed
209.
test-house
210.
test-pattern
211.
test-suite reduction
212.
Three-point bending test
213.
unit root test
214.
1995 ECC benchmark test
märksõna
3
1.
PHARE (programm). Farm Environmental Managing Program projekt)
2.
European Test Symposium (ETS)
3.
16PF (test)
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