Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

test equipment (keyword)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publication ..

year

year of publication

Loading..

Loading..

TTÜ department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 4
Look more.. (2/154)
Export

export all inquiry results (4)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

book article

Dynamic control system for electric motor drive testing on the test benchRassõlkin, Anton; Kallaste, Ants; Vaimann, Toomas2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 20152015 / p. 252-257 : ill http://dx.doi.org/10.1109/CPE.2015.7231082

book article
2

book article

A library of samples for testing variable load electric drivesLiivik, Liisa; Vodovozov, Valery; Rassõlkin, AntonDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 12.1-12.6 : ill

book article
3

journal article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

journal article
4

book article

Study of e-vehicle drive behaviour under changeable controlRassõlkin, Anton; Vodovozov, Valery; Raud, ZojaDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 13.1-13.5 : ill

book article

Number of records 4, displaying 1 - 4

1. test equipment
2. bakery equipment
3. electric control equipment
4. hydraulic equipment
5. manufacturing equipment
6. material handling equipment
7. optical communication equipment
8. overall equipment effectiveness
9. overall equipment effectiveness (OEE)
10. overall equipment efficiency
11. power quality measurement equipment
12. price-sensitive model of flexible equipment
13. technological equipment
14. used equipment
15. used industrial equipment
16. waste from electrical and electronic equipment
17. virtual equipment
18. accelerated shelf-life test
19. adaptive test strategy generation
20. antigen test
21. ASTM G65 dry sand rubber wheel abrasion test
22. automated test environment
23. automated test pattern generation
24. automatic test case generation
25. automatic test pattern generation
26. automatic test program generation
27. Auvergne test-bed
28. battery test
29. behavioral test
30. behaviour level test generation
31. bending test
32. bit-error rate test
33. Board and System Test
34. board test
35. bounds test
36. built-in self-test
37. capillary condensation redistribution test
38. chi-square test
39. closed bottle test
40. cognitive screening test
41. compartment fire test
42. compartment test
43. cone penetration test (CPT)
44. COVID-19 antigen test
45. cutting test
46. cybersecurity test bed
47. DDR4 interconnect test
48. design and test
49. design-for-test
50. deterministic test sequences
51. diagnostic test
52. digital test
53. Digital test and testable design
54. double-pulse test
55. drawing test
56. dry droplet antimicrobial test
57. embedded test
58. fan pressurisation test
59. final test result prediction
60. four-point bending test
61. FPGA based test
62. FPGA-Assisted Test
63. FPGA-centric test
64. functional self-test
65. functional test generation
66. Granger causality test
67. hardness test
68. high-level synthesis for test
69. high-level test data generation
70. highlevel test generation
71. high-speed serial link test
72. IEEE 9 bus test system
73. implementation-independent test generation
74. in situ tensile test in SEM
75. industrial field test
76. in-situ tensile test in SEM
77. Johansen cointegration test
78. Kolmogorov-Smirnov test
79. load test
80. logic built-in self-test
81. Luria alternating series test
82. Mann–Kendall test
83. memory interconnect test
84. microprocessor test
85. Model test
86. multiplier test
87. offline test generation
88. orthogonal test
89. package test analysis
90. parallel design and test
91. performance test
92. piezocone penetration test (CPTu)
93. Point Load Test index
94. pressurisation test
95. processor-centric board test
96. progressive damage test
97. provably correct test generation
98. pseudo-exhaustive test
99. purity test
100. rolling thin film oven test
101. rtioco-based timed test sequences
102. seasonal Mann Kendall test
103. seismic piezocone penetration test
104. self-test
105. self-test architectures
106. sentence writing test
107. serial sevens test
108. ship towing test tank
109. similar material simulation test
110. small-scale fire test
111. small‐scale test
112. software based self-test
113. software-based self-test
114. software-based self-test (SBST)
115. soil phosphorus (P) test
116. standard test method
117. static load test
118. static-dynamic probing test (SDT)
119. stress test
120. system level test
121. teaching design and test of systems
122. tensile test
123. test
124. test and evaluation platform
125. test automation
126. test bench
127. test coverage
128. test driven development
129. test driven modelling
130. test embankment
131. test generation
132. test generation and fault diagnosis
133. test groups
134. test model design
135. test optimization
136. test packets
137. test path synthesis
138. test patterns
139. test point insertion
140. test program generation
141. test reference year
142. test replication
143. test scenario description language
144. test-bed
145. test-chips
146. test-house
147. test-pattern
148. test-suite reduction
149. Three-point bending test
150. unit root test
151. usability platform test
152. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

match

sort

Otsing
Valikud 0

year of publication

author

TTÜ department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu