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1
book article
Dynamic control system for electric motor drive testing on the test bench
Rassõlkin, Anton
;
Kallaste, Ants
;
Vaimann, Toomas
2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 2015
2015
/
p. 252-257 : ill
http://dx.doi.org/10.1109/CPE.2015.7231082
book article
2
book article
A library of samples for testing variable load electric drives
Liivik, Liisa
;
Vodovozov, Valery
;
Rassõlkin, Anton
Digest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering
2013
/
p. 12.1-12.6 : ill
book article
3
journal article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE instrumentation & measurement magazine
2017
/
p. 23-30 : ill
https://doi.org/10.1109/MIM.2017.8006390
journal article
4
book article
Study of e-vehicle drive behaviour under changeable control
Rassõlkin, Anton
;
Vodovozov, Valery
;
Raud, Zoja
Digest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering
2013
/
p. 13.1-13.5 : ill
book article
Number of records 4, displaying
1 - 4
keyword
143
1.
test equipment
2.
bakery equipment
3.
hydraulic equipment
4.
manufacturing equipment
5.
material handling equipment
6.
optical communication equipment
7.
overall equipment effectiveness
8.
overall equipment efficiency
9.
power quality measurement equipment
10.
price-sensitive model of flexible equipment
11.
technological equipment
12.
used equipment
13.
used industrial equipment
14.
accelerated shelf-life test
15.
adaptive test strategy generation
16.
antigen test
17.
ASTM G65 dry sand rubber wheel abrasion test
18.
automated test environment
19.
automated test pattern generation
20.
automatic test case generation
21.
automatic test pattern generation
22.
automatic test program generation
23.
Auvergne test-bed
24.
battery test
25.
behavioral test
26.
behaviour level test generation
27.
bending test
28.
bit-error rate test
29.
Board and System Test
30.
board test
31.
bounds test
32.
built-in self-test
33.
capillary condensation redistribution test
34.
chi-square test
35.
closed bottle test
36.
cognitive screening test
37.
compartment fire test
38.
compartment test
39.
cone penetration test (CPT)
40.
COVID-19 antigen test
41.
cutting test
42.
cybersecurity test bed
43.
DDR4 interconnect test
44.
design and test
45.
design-for-test
46.
deterministic test sequences
47.
diagnostic test
48.
digital test
49.
Digital test and testable design
50.
double-pulse test
51.
drawing test
52.
dry droplet antimicrobial test
53.
embedded test
54.
fan pressurisation test
55.
final test result prediction
56.
four-point bending test
57.
FPGA based test
58.
FPGA-Assisted Test
59.
FPGA-centric test
60.
functional self-test
61.
functional test generation
62.
Granger causality test
63.
hardness test
64.
high-level synthesis for test
65.
high-level test data generation
66.
highlevel test generation
67.
high-speed serial link test
68.
IEEE 9 bus test system
69.
implementation-independent test generation
70.
in situ tensile test in SEM
71.
industrial field test
72.
in-situ tensile test in SEM
73.
Johansen cointegration test
74.
Kolmogorov-Smirnov test
75.
load test
76.
logic built-in self-test
77.
Luria alternating series test
78.
Mann–Kendall test
79.
memory interconnect test
80.
microprocessor test
81.
Model test
82.
multiplier test
83.
offline test generation
84.
orthogonal test
85.
package test analysis
86.
parallel design and test
87.
performance test
88.
piezocone penetration test (CPTu)
89.
Point Load Test index
90.
pressurisation test
91.
processor-centric board test
92.
progressive damage test
93.
provably correct test generation
94.
pseudo-exhaustive test
95.
purity test
96.
rtioco-based timed test sequences
97.
seasonal Mann Kendall test
98.
self-test
99.
self-test architectures
100.
sentence writing test
101.
serial sevens test
102.
ship towing test tank
103.
similar material simulation test
104.
small‐scale test
105.
software based self-test
106.
software-based self-test
107.
software-based self-test (SBST)
108.
soil phosphorus (P) test
109.
standard test method
110.
static load test
111.
static-dynamic probing test (SDT)
112.
stress test
113.
system level test
114.
teaching design and test of systems
115.
tensile test
116.
test
117.
test and evaluation platform
118.
test bench
119.
test coverage
120.
test driven development
121.
test driven modelling
122.
test embankment
123.
test generation
124.
test generation and fault diagnosis
125.
test groups
126.
test model design
127.
test optimization
128.
test packets
129.
test path synthesis
130.
test patterns
131.
test point insertion
132.
test program generation
133.
test reference year
134.
test replication
135.
test scenario description language
136.
test-bed
137.
test-chips
138.
test-house
139.
test-pattern
140.
test-suite reduction
141.
Three-point bending test
142.
unit root test
143.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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