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book article

Dynamic control system for electric motor drive testing on the test benchRassõlkin, Anton; Kallaste, Ants; Vaimann, Toomas2015 9th International Conference on Compatibility and Power Electronics (CPE) : proceedings : Faculty of Science and Technology (FCT), Caparica, Lisbon, Portugal, 24-26 June, 20152015 / p. 252-257 : ill http://dx.doi.org/10.1109/CPE.2015.7231082

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book article

A library of samples for testing variable load electric drivesLiivik, Liisa; Vodovozov, Valery; Rassõlkin, AntonDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 12.1-12.6 : ill

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journal article

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

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book article

Study of e-vehicle drive behaviour under changeable controlRassõlkin, Anton; Vodovozov, Valery; Raud, ZojaDigest book and electronic proceedings : 54th International Scientific Conference of Riga Technical University : Section of Power and Electrical Engineering2013 / p. 13.1-13.5 : ill

book article

Number of records 4, displaying 1 - 4

1. test equipment
2. bakery equipment
3. hydraulic equipment
4. manufacturing equipment
5. material handling equipment
6. optical communication equipment
7. overall equipment effectiveness
8. overall equipment effectiveness (OEE)
9. overall equipment efficiency
10. power quality measurement equipment
11. price-sensitive model of flexible equipment
12. technological equipment
13. used equipment
14. used industrial equipment
15. waste from electrical and electronic equipment
16. virtual equipment
17. accelerated shelf-life test
18. adaptive test strategy generation
19. antigen test
20. ASTM G65 dry sand rubber wheel abrasion test
21. automated test environment
22. automated test pattern generation
23. automatic test case generation
24. automatic test pattern generation
25. automatic test program generation
26. Auvergne test-bed
27. battery test
28. behavioral test
29. behaviour level test generation
30. bending test
31. bit-error rate test
32. Board and System Test
33. board test
34. bounds test
35. built-in self-test
36. capillary condensation redistribution test
37. chi-square test
38. closed bottle test
39. cognitive screening test
40. compartment fire test
41. compartment test
42. cone penetration test (CPT)
43. COVID-19 antigen test
44. cutting test
45. cybersecurity test bed
46. DDR4 interconnect test
47. design and test
48. design-for-test
49. deterministic test sequences
50. diagnostic test
51. digital test
52. Digital test and testable design
53. double-pulse test
54. drawing test
55. dry droplet antimicrobial test
56. embedded test
57. fan pressurisation test
58. final test result prediction
59. four-point bending test
60. FPGA based test
61. FPGA-Assisted Test
62. FPGA-centric test
63. functional self-test
64. functional test generation
65. Granger causality test
66. hardness test
67. high-level synthesis for test
68. high-level test data generation
69. highlevel test generation
70. high-speed serial link test
71. IEEE 9 bus test system
72. implementation-independent test generation
73. in situ tensile test in SEM
74. industrial field test
75. in-situ tensile test in SEM
76. Johansen cointegration test
77. Kolmogorov-Smirnov test
78. load test
79. logic built-in self-test
80. Luria alternating series test
81. Mann–Kendall test
82. memory interconnect test
83. microprocessor test
84. Model test
85. multiplier test
86. offline test generation
87. orthogonal test
88. package test analysis
89. parallel design and test
90. performance test
91. piezocone penetration test (CPTu)
92. Point Load Test index
93. pressurisation test
94. processor-centric board test
95. progressive damage test
96. provably correct test generation
97. pseudo-exhaustive test
98. purity test
99. rtioco-based timed test sequences
100. seasonal Mann Kendall test
101. seismic piezocone penetration test
102. self-test
103. self-test architectures
104. sentence writing test
105. serial sevens test
106. ship towing test tank
107. similar material simulation test
108. small-scale fire test
109. small‐scale test
110. software based self-test
111. software-based self-test
112. software-based self-test (SBST)
113. soil phosphorus (P) test
114. standard test method
115. static load test
116. static-dynamic probing test (SDT)
117. stress test
118. system level test
119. teaching design and test of systems
120. tensile test
121. test
122. test and evaluation platform
123. test automation
124. test bench
125. test coverage
126. test driven development
127. test driven modelling
128. test embankment
129. test generation
130. test generation and fault diagnosis
131. test groups
132. test model design
133. test optimization
134. test packets
135. test path synthesis
136. test patterns
137. test point insertion
138. test program generation
139. test reference year
140. test replication
141. test scenario description language
142. test-bed
143. test-chips
144. test-house
145. test-pattern
146. test-suite reduction
147. Three-point bending test
148. unit root test
149. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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