Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Searching

test reference year (keyword)

—

—

—

—

Add criteria Advanced search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publication ..

year

year of publication

Loading..

Loading..

TTÜ department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 2
Look more.. (2/162)
Export

export all inquiry results (2)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

journal article

Development of weighting factors for climate variables for selecting the energy reference year according to the EN ISO 15927-4 standardKalamees, Targo; Jylhä, Kirsti; Tietäväinen, Hanna; Jokisalo, Juha; Ilomets, Simo; Hyvönen, Reijo; Saku, SeppoEnergy and buildings2012 / p. 53-60 https://www.sciencedirect.com/science/article/abs/pii/S0378778811005779

journal article
2

journal article

New typical meteorological year generation method based on long-term building energy simulationsSeyed Salehi, Seyed Shahabaldin; Kalamees, Targo; Kurnitski, Jarek; Thalfeldt, MartinBuilding and environment2024 / art. 111504 https://doi.org/10.1016/j.buildenv.2024.111504

journal article

Number of records 2, displaying 1 - 2

1. test reference year
2. Common European Framework of Reference for Languages
3. digital reference
4. dq reference frame
5. European reference room
6. European Vertical Reference System (EVRS)
7. GNSS virtual reference station
8. gravity reference frame
9. height reference systems
10. HL7 Version 3: Reference Information Model (RIM)
11. model reference adaptive control
12. model reference controller
13. multi-loop model reference control
14. openEHR RM (Reference Model)
15. reference
16. reference architecture
17. reference architecture for global health data space
18. reference discovery
19. reference images
20. reference intervals
21. reference lakes
22. reference model
23. supply chain operations reference (SCOR)
24. supply chain operations reference (SCOR) model
25. synchronous reference frame theory
26. vertical reference
27. vertical reference datum
28. Vertical reference surface
29. accelerated shelf-life test
30. adaptive test strategy generation
31. antigen test
32. ASTM G65 dry sand rubber wheel abrasion test
33. automated test environment
34. automated test pattern generation
35. automatic test case generation
36. automatic test pattern generation
37. automatic test program generation
38. Auvergne test-bed
39. battery test
40. behavioral test
41. behaviour level test generation
42. bending test
43. bit-error rate test
44. Board and System Test
45. board test
46. bounds test
47. built-in self-test
48. capillary condensation redistribution test
49. chi-square test
50. closed bottle test
51. cognitive screening test
52. compartment fire test
53. compartment test
54. cone penetration test (CPT)
55. COVID-19 antigen test
56. cutting test
57. cybersecurity test bed
58. DDR4 interconnect test
59. design and test
60. design-for-test
61. deterministic test sequences
62. diagnostic test
63. digital test
64. Digital test and testable design
65. double-pulse test
66. drawing test
67. dry droplet antimicrobial test
68. embedded test
69. fan pressurisation test
70. final test result prediction
71. four-point bending test
72. FPGA based test
73. FPGA-Assisted Test
74. FPGA-centric test
75. functional self-test
76. functional test generation
77. Granger causality test
78. hardness test
79. high-level synthesis for test
80. high-level test data generation
81. highlevel test generation
82. high-speed serial link test
83. IEEE 9 bus test system
84. implementation-independent test generation
85. in situ tensile test in SEM
86. industrial field test
87. in-situ tensile test in SEM
88. Johansen cointegration test
89. Kolmogorov-Smirnov test
90. load test
91. logic built-in self-test
92. Luria alternating series test
93. Mann–Kendall test
94. memory interconnect test
95. microprocessor test
96. Model test
97. multiplier test
98. offline test generation
99. orthogonal test
100. package test analysis
101. parallel design and test
102. performance test
103. piezocone penetration test (CPTu)
104. Point Load Test index
105. pressurisation test
106. processor-centric board test
107. progressive damage test
108. provably correct test generation
109. pseudo-exhaustive test
110. purity test
111. rtioco-based timed test sequences
112. seasonal Mann Kendall test
113. seismic piezocone penetration test
114. self-test
115. self-test architectures
116. sentence writing test
117. serial sevens test
118. ship towing test tank
119. similar material simulation test
120. small-scale fire test
121. small‐scale test
122. software based self-test
123. software-based self-test
124. software-based self-test (SBST)
125. soil phosphorus (P) test
126. standard test method
127. static load test
128. static-dynamic probing test (SDT)
129. stress test
130. system level test
131. teaching design and test of systems
132. tensile test
133. test
134. test and evaluation platform
135. test bench
136. test coverage
137. test driven development
138. test driven modelling
139. test embankment
140. test equipment
141. test generation
142. test generation and fault diagnosis
143. test groups
144. test model design
145. test optimization
146. test packets
147. test path synthesis
148. test patterns
149. test point insertion
150. test program generation
151. test replication
152. test scenario description language
153. test-bed
154. test-chips
155. test-house
156. test-pattern
157. test-suite reduction
158. Three-point bending test
159. unit root test
160. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

match

sort

Otsing
Valikud 0

year of publication

author

TTÜ department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu