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journal article EST
/
journal article ENG
Deep CNN based classification of the Archimedes spiral drawing tests to support diagnostics of the Parkinson’s disease
Nõmm, Sven
;
Zarembo, Sergei
;
Medijainen, Kadri
;
Taba, Pille
;
Toomela, Aaro
IFAC-Papers OnLine
2020
/
p. 260-264
https://doi.org/10.1016/j.ifacol.2021.04.185
Conference proceedings at Scopus
Article at Scopus
Article at WOS
journal article EST
/
journal article ENG
2
journal article EST
/
journal article ENG
Machine learning based analysis of the upper limb freezing during handwriting in Parkinson's disease patients
Gorbatšov, Vassili
;
Valla, Elli
;
Nõmm, Sven
;
Medijainen, Kadri
;
Taba, Pille
;
Toomela, Aaro
IFAC-PapersOnLine
2022
/
p. 91-95
https://doi.org/10.1016/j.ifacol.2022.10.237
Conference Proceeding metrics at Scopus
Article at Scopus
Article at WOS
journal article EST
/
journal article ENG
Number of records 2, displaying
1 - 2
keyword
137
1.
drawing test
2.
computer-aided drawing (CAD)
3.
drawing
4.
drawing properties
5.
drawing rationality
6.
handmade and CAD drawing
7.
technical drawing
8.
accelerated shelf-life test
9.
adaptive test strategy generation
10.
antigen test
11.
ASTM G65 dry sand rubber wheel abrasion test
12.
automated test environment
13.
automated test pattern generation
14.
automatic test case generation
15.
automatic test pattern generation
16.
automatic test program generation
17.
Auvergne test-bed
18.
battery test
19.
behavioral test
20.
behaviour level test generation
21.
bending test
22.
bit-error rate test
23.
Board and System Test
24.
board test
25.
bounds test
26.
built-in self-test
27.
capillary condensation redistribution test
28.
chi-square test
29.
closed bottle test
30.
cognitive screening test
31.
compartment fire test
32.
compartment test
33.
cone penetration test (CPT)
34.
COVID-19 antigen test
35.
cutting test
36.
cybersecurity test bed
37.
DDR4 interconnect test
38.
design and test
39.
design-for-test
40.
deterministic test sequences
41.
diagnostic test
42.
digital test
43.
Digital test and testable design
44.
double-pulse test
45.
dry droplet antimicrobial test
46.
embedded test
47.
fan pressurisation test
48.
final test result prediction
49.
four-point bending test
50.
FPGA based test
51.
FPGA-Assisted Test
52.
FPGA-centric test
53.
functional self-test
54.
functional test generation
55.
Granger causality test
56.
hardness test
57.
high-level synthesis for test
58.
high-level test data generation
59.
highlevel test generation
60.
high-speed serial link test
61.
IEEE 9 bus test system
62.
implementation-independent test generation
63.
in situ tensile test in SEM
64.
industrial field test
65.
in-situ tensile test in SEM
66.
Johansen cointegration test
67.
Kolmogorov-Smirnov test
68.
load test
69.
logic built-in self-test
70.
Luria alternating series test
71.
Mann–Kendall test
72.
memory interconnect test
73.
microprocessor test
74.
Model test
75.
multiplier test
76.
offline test generation
77.
orthogonal test
78.
package test analysis
79.
parallel design and test
80.
performance test
81.
piezocone penetration test (CPTu)
82.
Point Load Test index
83.
pressurisation test
84.
processor-centric board test
85.
progressive damage test
86.
provably correct test generation
87.
pseudo-exhaustive test
88.
purity test
89.
rtioco-based timed test sequences
90.
seasonal Mann Kendall test
91.
self-test
92.
self-test architectures
93.
sentence writing test
94.
serial sevens test
95.
ship towing test tank
96.
similar material simulation test
97.
small‐scale test
98.
software based self-test
99.
software-based self-test
100.
software-based self-test (SBST)
101.
soil phosphorus (P) test
102.
standard test method
103.
static load test
104.
static-dynamic probing test (SDT)
105.
stress test
106.
system level test
107.
teaching design and test of systems
108.
tensile test
109.
test
110.
test and evaluation platform
111.
test bench
112.
test coverage
113.
test driven development
114.
test driven modelling
115.
test embankment
116.
test equipment
117.
test generation
118.
test generation and fault diagnosis
119.
test groups
120.
test model design
121.
test optimization
122.
test packets
123.
test path synthesis
124.
test patterns
125.
test point insertion
126.
test program generation
127.
test reference year
128.
test replication
129.
test scenario description language
130.
test-bed
131.
test-chips
132.
test-house
133.
test-pattern
134.
test-suite reduction
135.
Three-point bending test
136.
unit root test
137.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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