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16PF (test) (subject term)
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1
book
Küsimustik 16 PF
1993
https://www.ester.ee/record=b1065014*est
book
2
book
Küsimustik 16 PF
1992
https://www.ester.ee/record=b1062546*est
book
Number of records 2, displaying
1 - 2
keyword
131
1.
accelerated shelf-life test
2.
adaptive test strategy generation
3.
antigen test
4.
ASTM G65 dry sand rubber wheel abrasion test
5.
automated test environment
6.
automated test pattern generation
7.
automatic test case generation
8.
automatic test pattern generation
9.
automatic test program generation
10.
Auvergne test-bed
11.
battery test
12.
behavioral test
13.
behaviour level test generation
14.
bending test
15.
bit-error rate test
16.
Board and System Test
17.
board test
18.
bounds test
19.
built-in self-test
20.
capillary condensation redistribution test
21.
chi-square test
22.
closed bottle test
23.
cognitive screening test
24.
compartment fire test
25.
compartment test
26.
cone penetration test (CPT)
27.
COVID-19 antigen test
28.
cutting test
29.
cybersecurity test bed
30.
DDR4 interconnect test
31.
design and test
32.
design-for-test
33.
deterministic test sequences
34.
diagnostic test
35.
digital test
36.
Digital test and testable design
37.
double-pulse test
38.
drawing test
39.
dry droplet antimicrobial test
40.
embedded test
41.
fan pressurisation test
42.
final test result prediction
43.
four-point bending test
44.
FPGA based test
45.
FPGA-Assisted Test
46.
FPGA-centric test
47.
functional self-test
48.
functional test generation
49.
Granger causality test
50.
hardness test
51.
high-level synthesis for test
52.
high-level test data generation
53.
highlevel test generation
54.
high-speed serial link test
55.
IEEE 9 bus test system
56.
implementation-independent test generation
57.
in situ tensile test in SEM
58.
industrial field test
59.
in-situ tensile test in SEM
60.
Johansen cointegration test
61.
Kolmogorov-Smirnov test
62.
load test
63.
logic built-in self-test
64.
Luria alternating series test
65.
Mann–Kendall test
66.
memory interconnect test
67.
microprocessor test
68.
Model test
69.
multiplier test
70.
offline test generation
71.
orthogonal test
72.
package test analysis
73.
parallel design and test
74.
performance test
75.
piezocone penetration test (CPTu)
76.
Point Load Test index
77.
pressurisation test
78.
processor-centric board test
79.
progressive damage test
80.
provably correct test generation
81.
pseudo-exhaustive test
82.
purity test
83.
rtioco-based timed test sequences
84.
seasonal Mann Kendall test
85.
self-test
86.
self-test architectures
87.
sentence writing test
88.
serial sevens test
89.
ship towing test tank
90.
similar material simulation test
91.
small‐scale test
92.
software based self-test
93.
software-based self-test
94.
software-based self-test (SBST)
95.
soil phosphorus (P) test
96.
standard test method
97.
static load test
98.
static-dynamic probing test (SDT)
99.
stress test
100.
system level test
101.
teaching design and test of systems
102.
tensile test
103.
test
104.
test and evaluation platform
105.
test bench
106.
test coverage
107.
test driven development
108.
test driven modelling
109.
test embankment
110.
test equipment
111.
test generation
112.
test generation and fault diagnosis
113.
test groups
114.
test model design
115.
test optimization
116.
test packets
117.
test path synthesis
118.
test patterns
119.
test point insertion
120.
test program generation
121.
test reference year
122.
test replication
123.
test scenario description language
124.
test-bed
125.
test-chips
126.
test-house
127.
test-pattern
128.
test-suite reduction
129.
Three-point bending test
130.
unit root test
131.
1995 ECC benchmark test
subject term
2
1.
16PF (test)
2.
European Test Symposium (ETS)
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