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book article

A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

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Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://www.academia.edu/25351525/Re_using_chip_level_DFT_at_board_level

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Number of records 2, displaying 1 - 2

1. board test
2. processor-centric board test
3. Board and System Test
4. across-the-board cuts
5. board
6. board composition
7. board diagnosis
8. board diversity
9. board of directors
10. Estonian Police and Border Guard Board (PPA)
11. laminate embedded printed circuit board
12. off-board charger
13. off-board charger (OBC)
14. off-board chargers
15. on-board charger (OBC)
16. on-board chargers
17. processor-centric board
18. single board computer
19. single-board computer
20. accelerated shelf-life test
21. adaptive test strategy generation
22. antigen test
23. Applications in Test Engineering
24. ASTM G65 dry sand rubber wheel abrasion test
25. Automated Synthesis of Software-based Self-test
26. automated test environment
27. automated test pattern generation
28. automatic test case generation
29. automatic test pattern generation
30. automatic test program generation
31. Auvergne test-bed
32. battery test
33. behavioral test
34. behaviour level test generation
35. bending test
36. bit-error rate test
37. bounds test
38. built-in self-test
39. capillary condensation redistribution test
40. chi-square test
41. closed bottle test
42. cognitive screening test
43. compartment fire test
44. compartment test
45. cone penetration test (CPT)
46. COVID-19 antigen test
47. cutting test
48. cybersecurity test bed
49. DDR4 interconnect test
50. design and test
51. design-for-test
52. deterministic test sequences
53. diagnostic test
54. digital test
55. Digital test and testable design
56. double-pulse test
57. drawing test
58. dry droplet antimicrobial test
59. Embedded figures test
60. embedded test
61. fan pressurisation test
62. final test result prediction
63. four-point bending test
64. FPGA based test
65. FPGA-Assisted Test
66. FPGA-centric test
67. functional self-test
68. functional test generation
69. Granger causality test
70. hardness test
71. Hierarchical Multi-level Test Generation
72. high-level synthesis for test
73. high-level test data generation
74. highlevel test generation
75. high-speed serial link test
76. IEEE 9 bus test system
77. implementation-independent test generation
78. in situ tensile test in SEM
79. industrial field test
80. in-situ tensile test in SEM
81. Johansen cointegration test
82. Kolmogorov-Smirnov test
83. load test
84. logic built-in self-test
85. Luria alternating series test
86. Mann–Kendall test
87. Mann-Kendall trend test
88. memory interconnect test
89. microprocessor test
90. Model test
91. multiplier test
92. offline test generation
93. orthogonal test
94. package test analysis
95. parallel design and test
96. performance test
97. piezocone penetration test (CPTu)
98. Point Load Test index
99. pressurisation test
100. progressive damage test
101. provably correct test generation
102. pseudo-exhaustive test
103. purity test
104. real-time room temperature test
105. rolling thin film oven test
106. rtioco-based timed test sequences
107. seasonal Mann Kendall test
108. seismic piezocone penetration test
109. self-test
110. self-test architectures
111. sentence writing test
112. serial sevens test
113. ship towing test tank
114. similar material simulation test
115. small-scale fire test
116. small‐scale test
117. software based self-test
118. software-based self-test
119. software-based self-test (SBST)
120. soil phosphorus (P) test
121. standard test method
122. static load test
123. static-dynamic probing test (SDT)
124. stress test
125. system level test
126. teaching design and test of systems
127. tensile test
128. tensile test
129. test
130. test and evaluation platform
131. test automation
132. test bench
133. test coverage
134. test driven development
135. test driven modelling
136. test embankment
137. test equipment
138. test generation
139. test generation and fault diagnosis
140. Test Group Generation for Detecting Multiple Faults
141. test groups
142. test model design
143. test optimization
144. test packets
145. test path synthesis
146. test patterns
147. test point insertion
148. test program generation
149. test reference year
150. test replication
151. test scenario description language
152. test-bed
153. test-chips
154. test-house
155. test-pattern
156. test-suite reduction
157. Three-point bending test
158. unit root test
159. usability platform test
160. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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