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A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

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Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p

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Number of records 2, displaying 1 - 2

1. board test
2. processor-centric board test
3. Board and System Test
4. board
5. board composition
6. board diagnosis
7. board diversity
8. board of directors
9. Estonian Police and Border Guard Board (PPA)
10. laminate embedded printed circuit board
11. off-board charger
12. off-board charger (OBC)
13. off-board chargers
14. on-board charger (OBC)
15. on-board chargers
16. processor-centric board
17. single board computer
18. single-board computer
19. accelerated shelf-life test
20. adaptive test strategy generation
21. antigen test
22. Applications in Test Engineering
23. ASTM G65 dry sand rubber wheel abrasion test
24. Automated Synthesis of Software-based Self-test
25. automated test environment
26. automated test pattern generation
27. automatic test case generation
28. automatic test pattern generation
29. automatic test program generation
30. Auvergne test-bed
31. battery test
32. behavioral test
33. behaviour level test generation
34. bending test
35. bit-error rate test
36. bounds test
37. built-in self-test
38. capillary condensation redistribution test
39. chi-square test
40. closed bottle test
41. cognitive screening test
42. compartment fire test
43. compartment test
44. cone penetration test (CPT)
45. COVID-19 antigen test
46. cutting test
47. cybersecurity test bed
48. DDR4 interconnect test
49. design and test
50. design-for-test
51. deterministic test sequences
52. diagnostic test
53. digital test
54. Digital test and testable design
55. double-pulse test
56. drawing test
57. dry droplet antimicrobial test
58. embedded test
59. fan pressurisation test
60. final test result prediction
61. four-point bending test
62. FPGA based test
63. FPGA-Assisted Test
64. FPGA-centric test
65. functional self-test
66. functional test generation
67. Granger causality test
68. hardness test
69. Hierarchical Multi-level Test Generation
70. high-level synthesis for test
71. high-level test data generation
72. highlevel test generation
73. high-speed serial link test
74. IEEE 9 bus test system
75. implementation-independent test generation
76. in situ tensile test in SEM
77. industrial field test
78. in-situ tensile test in SEM
79. Johansen cointegration test
80. Kolmogorov-Smirnov test
81. load test
82. logic built-in self-test
83. Luria alternating series test
84. Mann–Kendall test
85. memory interconnect test
86. microprocessor test
87. Model test
88. multiplier test
89. offline test generation
90. orthogonal test
91. package test analysis
92. parallel design and test
93. performance test
94. piezocone penetration test (CPTu)
95. Point Load Test index
96. pressurisation test
97. progressive damage test
98. provably correct test generation
99. pseudo-exhaustive test
100. purity test
101. rolling thin film oven test
102. rtioco-based timed test sequences
103. seasonal Mann Kendall test
104. seismic piezocone penetration test
105. self-test
106. self-test architectures
107. sentence writing test
108. serial sevens test
109. ship towing test tank
110. similar material simulation test
111. small-scale fire test
112. small‐scale test
113. software based self-test
114. software-based self-test
115. software-based self-test (SBST)
116. soil phosphorus (P) test
117. standard test method
118. static load test
119. static-dynamic probing test (SDT)
120. stress test
121. system level test
122. teaching design and test of systems
123. tensile test
124. test
125. test and evaluation platform
126. test automation
127. test bench
128. test coverage
129. test driven development
130. test driven modelling
131. test embankment
132. test equipment
133. test generation
134. test generation and fault diagnosis
135. Test Group Generation for Detecting Multiple Faults
136. test groups
137. test model design
138. test optimization
139. test packets
140. test path synthesis
141. test patterns
142. test point insertion
143. test program generation
144. test reference year
145. test replication
146. test scenario description language
147. test-bed
148. test-chips
149. test-house
150. test-pattern
151. test-suite reduction
152. Three-point bending test
153. unit root test
154. usability platform test
155. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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