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book article

Design obfuscation versus testFarahmandi, Farimah; Sinanoglu, Ozgur; Blanton, Ronald; Pagliarini, Samuel Nascimento2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia2020 / 10 p https://doi.org/10.1109/ETS48528.2020.9131590

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RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

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Number of records 3, displaying 1 - 3

1. accelerated shelf-life test
2. adaptive test strategy generation
3. antigen test
4. Applications in Test Engineering
5. ASTM G65 dry sand rubber wheel abrasion test
6. Automated Synthesis of Software-based Self-test
7. automated test environment
8. automated test pattern generation
9. automatic test case generation
10. automatic test pattern generation
11. automatic test program generation
12. Auvergne test-bed
13. battery test
14. behavioral test
15. behaviour level test generation
16. bending test
17. bit-error rate test
18. Board and System Test
19. board test
20. bounds test
21. built-in self-test
22. capillary condensation redistribution test
23. chi-square test
24. closed bottle test
25. cognitive screening test
26. compartment fire test
27. compartment test
28. cone penetration test (CPT)
29. COVID-19 antigen test
30. cutting test
31. cybersecurity test bed
32. DDR4 interconnect test
33. design and test
34. design-for-test
35. deterministic test sequences
36. diagnostic test
37. digital test
38. Digital test and testable design
39. double-pulse test
40. drawing test
41. dry droplet antimicrobial test
42. embedded test
43. fan pressurisation test
44. final test result prediction
45. four-point bending test
46. FPGA based test
47. FPGA-Assisted Test
48. FPGA-centric test
49. functional self-test
50. functional test generation
51. Granger causality test
52. hardness test
53. Hierarchical Multi-level Test Generation
54. high-level synthesis for test
55. high-level test data generation
56. highlevel test generation
57. high-speed serial link test
58. IEEE 9 bus test system
59. implementation-independent test generation
60. in situ tensile test in SEM
61. industrial field test
62. in-situ tensile test in SEM
63. Johansen cointegration test
64. Kolmogorov-Smirnov test
65. load test
66. logic built-in self-test
67. Luria alternating series test
68. Mann–Kendall test
69. memory interconnect test
70. microprocessor test
71. Model test
72. multiplier test
73. offline test generation
74. orthogonal test
75. package test analysis
76. parallel design and test
77. performance test
78. piezocone penetration test (CPTu)
79. Point Load Test index
80. pressurisation test
81. processor-centric board test
82. progressive damage test
83. provably correct test generation
84. pseudo-exhaustive test
85. purity test
86. rolling thin film oven test
87. rtioco-based timed test sequences
88. seasonal Mann Kendall test
89. seismic piezocone penetration test
90. self-test
91. self-test architectures
92. sentence writing test
93. serial sevens test
94. ship towing test tank
95. similar material simulation test
96. small-scale fire test
97. small‐scale test
98. software based self-test
99. software-based self-test
100. software-based self-test (SBST)
101. soil phosphorus (P) test
102. standard test method
103. static load test
104. static-dynamic probing test (SDT)
105. stress test
106. system level test
107. teaching design and test of systems
108. tensile test
109. test
110. test and evaluation platform
111. test automation
112. test bench
113. test coverage
114. test driven development
115. test driven modelling
116. test embankment
117. test equipment
118. test generation
119. test generation and fault diagnosis
120. Test Group Generation for Detecting Multiple Faults
121. test groups
122. test model design
123. test optimization
124. test packets
125. test path synthesis
126. test patterns
127. test point insertion
128. test program generation
129. test reference year
130. test replication
131. test scenario description language
132. test-bed
133. test-chips
134. test-house
135. test-pattern
136. test-suite reduction
137. Three-point bending test
138. unit root test
139. usability platform test
140. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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