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embedded test (keyword)
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book article
A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routers
Saltarelli, Pietro
;
Niazmand, Behrad
;
Raik, Jaan
;
Govind, Vineeth
;
Hollstein, Thomas
;
Jervan, Gert
;
Hariharan, Ranganathan
NOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 2015
2015
/
[8] p. : ill
http://dx.doi.org/10.1145/2786572.2788713
book article
Number of records 1, displaying
1 - 1
keyword
150
1.
embedded test
2.
dependable embedded systems
3.
digital embedded work
4.
embedded control
5.
embedded deep learning
6.
embedded devices
7.
embedded electronics
8.
Embedded hardware
9.
embedded instrumentation
10.
embedded instruments
11.
embedded networks/NoC
12.
embedded platform
13.
embedded sensor
14.
embedded sensors
15.
embedded software
16.
embedded system
17.
embedded systems
18.
FPGA-Embedded Instrument
19.
laminate embedded printed circuit board
20.
accelerated shelf-life test
21.
adaptive test strategy generation
22.
antigen test
23.
ASTM G65 dry sand rubber wheel abrasion test
24.
automated test environment
25.
automated test pattern generation
26.
automatic test case generation
27.
automatic test pattern generation
28.
automatic test program generation
29.
Auvergne test-bed
30.
battery test
31.
behavioral test
32.
behaviour level test generation
33.
bending test
34.
bit-error rate test
35.
Board and System Test
36.
board test
37.
bounds test
38.
built-in self-test
39.
capillary condensation redistribution test
40.
chi-square test
41.
closed bottle test
42.
cognitive screening test
43.
compartment fire test
44.
compartment test
45.
cone penetration test (CPT)
46.
COVID-19 antigen test
47.
cutting test
48.
cybersecurity test bed
49.
DDR4 interconnect test
50.
design and test
51.
design-for-test
52.
deterministic test sequences
53.
diagnostic test
54.
digital test
55.
Digital test and testable design
56.
double-pulse test
57.
drawing test
58.
dry droplet antimicrobial test
59.
fan pressurisation test
60.
final test result prediction
61.
four-point bending test
62.
FPGA based test
63.
FPGA-Assisted Test
64.
FPGA-centric test
65.
functional self-test
66.
functional test generation
67.
Granger causality test
68.
hardness test
69.
high-level synthesis for test
70.
high-level test data generation
71.
highlevel test generation
72.
high-speed serial link test
73.
IEEE 9 bus test system
74.
implementation-independent test generation
75.
in situ tensile test in SEM
76.
industrial field test
77.
in-situ tensile test in SEM
78.
Johansen cointegration test
79.
Kolmogorov-Smirnov test
80.
load test
81.
logic built-in self-test
82.
Luria alternating series test
83.
Mann–Kendall test
84.
memory interconnect test
85.
microprocessor test
86.
Model test
87.
multiplier test
88.
offline test generation
89.
orthogonal test
90.
package test analysis
91.
parallel design and test
92.
performance test
93.
piezocone penetration test (CPTu)
94.
Point Load Test index
95.
pressurisation test
96.
processor-centric board test
97.
progressive damage test
98.
provably correct test generation
99.
pseudo-exhaustive test
100.
purity test
101.
rtioco-based timed test sequences
102.
seasonal Mann Kendall test
103.
seismic piezocone penetration test
104.
self-test
105.
self-test architectures
106.
sentence writing test
107.
serial sevens test
108.
ship towing test tank
109.
similar material simulation test
110.
small‐scale test
111.
software based self-test
112.
software-based self-test
113.
software-based self-test (SBST)
114.
soil phosphorus (P) test
115.
standard test method
116.
static load test
117.
static-dynamic probing test (SDT)
118.
stress test
119.
system level test
120.
teaching design and test of systems
121.
tensile test
122.
test
123.
test and evaluation platform
124.
test bench
125.
test coverage
126.
test driven development
127.
test driven modelling
128.
test embankment
129.
test equipment
130.
test generation
131.
test generation and fault diagnosis
132.
test groups
133.
test model design
134.
test optimization
135.
test packets
136.
test path synthesis
137.
test patterns
138.
test point insertion
139.
test program generation
140.
test reference year
141.
test replication
142.
test scenario description language
143.
test-bed
144.
test-chips
145.
test-house
146.
test-pattern
147.
test-suite reduction
148.
Three-point bending test
149.
unit root test
150.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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