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Hybrid built-in self-test and test generation techniques for digital systems (title)
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book
Hybrid built-in self-test and test generation techniques for digital systems
Jervan, Gert
2005
https://www.ester.ee/record=b2177537*est
book
Number of records 1, displaying
1 - 1
keyword
151
1.
built-in self-test
2.
logic built-in self-test
3.
Automated Synthesis of Software-based Self-test
4.
functional self-test
5.
self-test
6.
self-test architectures
7.
software based self-test
8.
software-based self-test
9.
software-based self-test (SBST)
10.
adaptive test strategy generation
11.
automated test pattern generation
12.
automatic test case generation
13.
automatic test pattern generation
14.
automatic test program generation
15.
behaviour level test generation
16.
functional test generation
17.
Hierarchical Multi-level Test Generation
18.
high-level test data generation
19.
highlevel test generation
20.
implementation-independent test generation
21.
offline test generation
22.
provably correct test generation
23.
test generation
24.
test generation and fault diagnosis
25.
Test Group Generation for Detecting Multiple Faults
26.
test program generation
27.
digital test
28.
Digital test and testable design
29.
teaching design and test of systems
30.
hybrid digital twins
31.
hybrid digital-twins
32.
digital self-determination
33.
digital self-efficacy
34.
digital self-interference cancellation
35.
accelerated shelf-life test
36.
antigen test
37.
Applications in Test Engineering
38.
ASTM G65 dry sand rubber wheel abrasion test
39.
automated test environment
40.
Auvergne test-bed
41.
battery test
42.
behavioral test
43.
bending test
44.
bit-error rate test
45.
Board and System Test
46.
board test
47.
bounds test
48.
capillary condensation redistribution test
49.
chi-square test
50.
closed bottle test
51.
cognitive screening test
52.
compartment fire test
53.
compartment test
54.
cone penetration test (CPT)
55.
COVID-19 antigen test
56.
cutting test
57.
cybersecurity test bed
58.
DDR4 interconnect test
59.
design and test
60.
design-for-test
61.
deterministic test sequences
62.
diagnostic test
63.
double-pulse test
64.
drawing test
65.
dry droplet antimicrobial test
66.
dynamic hybrid switched systems
67.
embedded test
68.
fan pressurisation test
69.
final test result prediction
70.
four-point bending test
71.
FPGA based test
72.
FPGA-Assisted Test
73.
FPGA-centric test
74.
Granger causality test
75.
hardness test
76.
high-level synthesis for test
77.
high-speed serial link test
78.
Hybrid Energy Storage Systems
79.
hybrid systems
80.
IEEE 9 bus test system
81.
in situ tensile test in SEM
82.
industrial field test
83.
in-situ tensile test in SEM
84.
Johansen cointegration test
85.
Kolmogorov-Smirnov test
86.
load test
87.
Luria alternating series test
88.
Mann–Kendall test
89.
Mann-Kendall trend test
90.
memory interconnect test
91.
microprocessor test
92.
Model test
93.
multiplier test
94.
orthogonal test
95.
package test analysis
96.
parallel design and test
97.
performance test
98.
piezocone penetration test (CPTu)
99.
Point Load Test index
100.
pressurisation test
101.
processor-centric board test
102.
progressive damage test
103.
pseudo-exhaustive test
104.
purity test
105.
real-time room temperature test
106.
rolling thin film oven test
107.
rtioco-based timed test sequences
108.
seasonal Mann Kendall test
109.
seismic piezocone penetration test
110.
sentence writing test
111.
serial sevens test
112.
ship towing test tank
113.
similar material simulation test
114.
small-scale fire test
115.
small‐scale test
116.
soil phosphorus (P) test
117.
standard test method
118.
static load test
119.
static-dynamic probing test (SDT)
120.
stress test
121.
system level test
122.
tensile test
123.
tensile test
124.
test
125.
test and evaluation platform
126.
test automation
127.
test bench
128.
test coverage
129.
test driven development
130.
test driven modelling
131.
test embankment
132.
test equipment
133.
test groups
134.
test model design
135.
test optimization
136.
test packets
137.
test path synthesis
138.
test patterns
139.
test point insertion
140.
test reference year
141.
test replication
142.
test scenario description language
143.
test-bed
144.
test-chips
145.
test-house
146.
test-pattern
147.
test-suite reduction
148.
Three-point bending test
149.
unit root test
150.
usability platform test
151.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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