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FPGA based test (keyword)
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book article
A new FPGA-based detection method for spurious variations in PCBA power distribution network
Odintsov, Sergei
;
Bozzoli, Ludovica
;
De Sio, Corrado
;
Sterpone, Luca
;
Jutman, Artur
2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings
2019
/
6 p. : ill
https://doi.org/10.1109/DDECS.2019.8724662
book article
Number of records 1, displaying
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keyword
145
1.
FPGA based test
2.
FPGA-Assisted Test
3.
FPGA-centric test
4.
FPGA based lab kit
5.
FPGA-based development boards
6.
FPGA-based prototyping
7.
rtioco-based timed test sequences
8.
software based self-test
9.
software-based self-test
10.
software-based self-test (SBST)
11.
Field Programmable Gate Array (FPGA)
12.
Field-Programmable Gate Array (FPGA)
13.
FPGA
14.
FPGA (field-programmable gate array)
15.
FPGA implementation
16.
FPGA redaction
17.
FPGA/PSoC design
18.
FPGA-Embedded Instrument
19.
Opal Kelly field programmable gate array (FPGA)
20.
recycled FPGA detection
21.
accelerated shelf-life test
22.
adaptive test strategy generation
23.
antigen test
24.
ASTM G65 dry sand rubber wheel abrasion test
25.
automated test environment
26.
automated test pattern generation
27.
automatic test case generation
28.
automatic test pattern generation
29.
automatic test program generation
30.
Auvergne test-bed
31.
battery test
32.
behavioral test
33.
behaviour level test generation
34.
bending test
35.
bit-error rate test
36.
Board and System Test
37.
board test
38.
bounds test
39.
built-in self-test
40.
capillary condensation redistribution test
41.
chi-square test
42.
closed bottle test
43.
cognitive screening test
44.
compartment fire test
45.
compartment test
46.
cone penetration test (CPT)
47.
COVID-19 antigen test
48.
cutting test
49.
cybersecurity test bed
50.
DDR4 interconnect test
51.
design and test
52.
design-for-test
53.
deterministic test sequences
54.
diagnostic test
55.
digital test
56.
Digital test and testable design
57.
double-pulse test
58.
drawing test
59.
dry droplet antimicrobial test
60.
embedded test
61.
fan pressurisation test
62.
final test result prediction
63.
four-point bending test
64.
functional self-test
65.
functional test generation
66.
Granger causality test
67.
hardness test
68.
high-level synthesis for test
69.
high-level test data generation
70.
highlevel test generation
71.
high-speed serial link test
72.
IEEE 9 bus test system
73.
implementation-independent test generation
74.
in situ tensile test in SEM
75.
industrial field test
76.
in-situ tensile test in SEM
77.
Johansen cointegration test
78.
Kolmogorov-Smirnov test
79.
load test
80.
logic built-in self-test
81.
Luria alternating series test
82.
Mann–Kendall test
83.
memory interconnect test
84.
microprocessor test
85.
Model test
86.
multiplier test
87.
offline test generation
88.
orthogonal test
89.
package test analysis
90.
parallel design and test
91.
performance test
92.
piezocone penetration test (CPTu)
93.
Point Load Test index
94.
pressurisation test
95.
processor-centric board test
96.
progressive damage test
97.
provably correct test generation
98.
pseudo-exhaustive test
99.
purity test
100.
seasonal Mann Kendall test
101.
seismic piezocone penetration test
102.
self-test
103.
self-test architectures
104.
sentence writing test
105.
serial sevens test
106.
ship towing test tank
107.
similar material simulation test
108.
small‐scale test
109.
soil phosphorus (P) test
110.
standard test method
111.
static load test
112.
static-dynamic probing test (SDT)
113.
stress test
114.
system level test
115.
teaching design and test of systems
116.
tensile test
117.
test
118.
test and evaluation platform
119.
test bench
120.
test coverage
121.
test driven development
122.
test driven modelling
123.
test embankment
124.
test equipment
125.
test generation
126.
test generation and fault diagnosis
127.
test groups
128.
test model design
129.
test optimization
130.
test packets
131.
test path synthesis
132.
test patterns
133.
test point insertion
134.
test program generation
135.
test reference year
136.
test replication
137.
test scenario description language
138.
test-bed
139.
test-chips
140.
test-house
141.
test-pattern
142.
test-suite reduction
143.
Three-point bending test
144.
unit root test
145.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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