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cutting test (keyword)
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journal article EST
/
journal article ENG
Performance of Al2O3-cBN materials and the perspective of using hyperspectral imaging during cutting tests
Antonov, Maksim
;
Zahavi, Ali
;
Kumar, Rahul, 1993-
;
Tamre, Mart
;
Klimczyk, Piotr
Proceedings of the Estonian Academy of Sciences
2021
/
p. 524-532 : ill
https://doi.org/10.3176/proc.2021.4.21
Journal Metrics at Scopus
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journal article EST
/
journal article ENG
Number of records 1, displaying
1 - 1
keyword
140
1.
cutting test
2.
abrasive cutting
3.
cutting
4.
cutting tools
5.
metal cutting
6.
ozone cutting
7.
steel cutting
8.
wearingand cutting
9.
wood cutting
10.
accelerated shelf-life test
11.
adaptive test strategy generation
12.
antigen test
13.
ASTM G65 dry sand rubber wheel abrasion test
14.
automated test environment
15.
automated test pattern generation
16.
automatic test case generation
17.
automatic test pattern generation
18.
automatic test program generation
19.
Auvergne test-bed
20.
battery test
21.
behavioral test
22.
behaviour level test generation
23.
bending test
24.
bit-error rate test
25.
Board and System Test
26.
board test
27.
bounds test
28.
built-in self-test
29.
capillary condensation redistribution test
30.
chi-square test
31.
closed bottle test
32.
cognitive screening test
33.
compartment fire test
34.
compartment test
35.
cone penetration test (CPT)
36.
COVID-19 antigen test
37.
cybersecurity test bed
38.
DDR4 interconnect test
39.
design and test
40.
design-for-test
41.
deterministic test sequences
42.
diagnostic test
43.
digital test
44.
Digital test and testable design
45.
double-pulse test
46.
drawing test
47.
dry droplet antimicrobial test
48.
embedded test
49.
fan pressurisation test
50.
final test result prediction
51.
four-point bending test
52.
FPGA based test
53.
FPGA-Assisted Test
54.
FPGA-centric test
55.
functional self-test
56.
functional test generation
57.
Granger causality test
58.
hardness test
59.
high-level synthesis for test
60.
high-level test data generation
61.
highlevel test generation
62.
high-speed serial link test
63.
IEEE 9 bus test system
64.
implementation-independent test generation
65.
in situ tensile test in SEM
66.
industrial field test
67.
in-situ tensile test in SEM
68.
Johansen cointegration test
69.
Kolmogorov-Smirnov test
70.
load test
71.
logic built-in self-test
72.
Luria alternating series test
73.
Mann–Kendall test
74.
memory interconnect test
75.
microprocessor test
76.
Model test
77.
multiplier test
78.
offline test generation
79.
orthogonal test
80.
package test analysis
81.
parallel design and test
82.
performance test
83.
piezocone penetration test (CPTu)
84.
Point Load Test index
85.
pressurisation test
86.
processor-centric board test
87.
progressive damage test
88.
provably correct test generation
89.
pseudo-exhaustive test
90.
purity test
91.
rtioco-based timed test sequences
92.
seasonal Mann Kendall test
93.
seismic piezocone penetration test
94.
self-test
95.
self-test architectures
96.
sentence writing test
97.
serial sevens test
98.
ship towing test tank
99.
similar material simulation test
100.
small‐scale test
101.
software based self-test
102.
software-based self-test
103.
software-based self-test (SBST)
104.
soil phosphorus (P) test
105.
standard test method
106.
static load test
107.
static-dynamic probing test (SDT)
108.
stress test
109.
system level test
110.
teaching design and test of systems
111.
tensile test
112.
test
113.
test and evaluation platform
114.
test bench
115.
test coverage
116.
test driven development
117.
test driven modelling
118.
test embankment
119.
test equipment
120.
test generation
121.
test generation and fault diagnosis
122.
test groups
123.
test model design
124.
test optimization
125.
test packets
126.
test path synthesis
127.
test patterns
128.
test point insertion
129.
test program generation
130.
test reference year
131.
test replication
132.
test scenario description language
133.
test-bed
134.
test-chips
135.
test-house
136.
test-pattern
137.
test-suite reduction
138.
Three-point bending test
139.
unit root test
140.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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