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serial sevens test (keyword)
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1
book article EST
/
book article ENG
Electroencephalography as an objective indicator of stress
Gavriljuk, Marietta
;
Uudeberg, Tuuli
;
Pilt, Kristjan
;
Karai, Deniss
;
Fridolin, Ivo
;
Bachmann, Maie
19th Nordic-Baltic Conference on Biomedical Engineering and Medical Physics : Proceedings of NBC 2023, June 12–14, 2023, Liepaja, Latvia
2023
/
p. 221–226
https://doi.org/10.1007/978-3-031-37132-5_28
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 1, displaying
1 - 1
keyword
138
1.
serial sevens test
2.
high-speed serial link test
3.
offsite serial renovation
4.
prefabricated off-site serial renovation
5.
prefabricated serial renovation
6.
serial batch
7.
serial renovation
8.
serial resistance
9.
accelerated shelf-life test
10.
adaptive test strategy generation
11.
antigen test
12.
ASTM G65 dry sand rubber wheel abrasion test
13.
automated test environment
14.
automated test pattern generation
15.
automatic test case generation
16.
automatic test pattern generation
17.
automatic test program generation
18.
Auvergne test-bed
19.
battery test
20.
behavioral test
21.
behaviour level test generation
22.
bending test
23.
bit-error rate test
24.
Board and System Test
25.
board test
26.
bounds test
27.
built-in self-test
28.
capillary condensation redistribution test
29.
chi-square test
30.
closed bottle test
31.
cognitive screening test
32.
compartment fire test
33.
compartment test
34.
cone penetration test (CPT)
35.
COVID-19 antigen test
36.
cutting test
37.
cybersecurity test bed
38.
DDR4 interconnect test
39.
design and test
40.
design-for-test
41.
deterministic test sequences
42.
diagnostic test
43.
digital test
44.
Digital test and testable design
45.
double-pulse test
46.
drawing test
47.
dry droplet antimicrobial test
48.
embedded test
49.
fan pressurisation test
50.
final test result prediction
51.
four-point bending test
52.
FPGA based test
53.
FPGA-Assisted Test
54.
FPGA-centric test
55.
functional self-test
56.
functional test generation
57.
Granger causality test
58.
hardness test
59.
high-level synthesis for test
60.
high-level test data generation
61.
highlevel test generation
62.
IEEE 9 bus test system
63.
implementation-independent test generation
64.
in situ tensile test in SEM
65.
industrial field test
66.
in-situ tensile test in SEM
67.
Johansen cointegration test
68.
Kolmogorov-Smirnov test
69.
load test
70.
logic built-in self-test
71.
Luria alternating series test
72.
Mann–Kendall test
73.
memory interconnect test
74.
microprocessor test
75.
Model test
76.
multiplier test
77.
offline test generation
78.
orthogonal test
79.
package test analysis
80.
parallel design and test
81.
performance test
82.
piezocone penetration test (CPTu)
83.
Point Load Test index
84.
pressurisation test
85.
processor-centric board test
86.
progressive damage test
87.
provably correct test generation
88.
pseudo-exhaustive test
89.
purity test
90.
rtioco-based timed test sequences
91.
seasonal Mann Kendall test
92.
seismic piezocone penetration test
93.
self-test
94.
self-test architectures
95.
sentence writing test
96.
ship towing test tank
97.
similar material simulation test
98.
small‐scale test
99.
software based self-test
100.
software-based self-test
101.
software-based self-test (SBST)
102.
soil phosphorus (P) test
103.
standard test method
104.
static load test
105.
static-dynamic probing test (SDT)
106.
stress test
107.
system level test
108.
teaching design and test of systems
109.
tensile test
110.
test
111.
test and evaluation platform
112.
test bench
113.
test coverage
114.
test driven development
115.
test driven modelling
116.
test embankment
117.
test equipment
118.
test generation
119.
test generation and fault diagnosis
120.
test groups
121.
test model design
122.
test optimization
123.
test packets
124.
test path synthesis
125.
test patterns
126.
test point insertion
127.
test program generation
128.
test reference year
129.
test replication
130.
test scenario description language
131.
test-bed
132.
test-chips
133.
test-house
134.
test-pattern
135.
test-suite reduction
136.
Three-point bending test
137.
unit root test
138.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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