Searching - TalTech Research Portal

Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles

Research Groups

Help and information

Advanced search

test bench (keyword)

—

—

Add criteria Simple search filter

Clear

types of item

book ..

journal article ..

newspaper article ..

book article ..

dissertation ..

Open Access ..

Scientific publications ..

year

year of publication

Loading..

Loading..

TalTech department

Loading..

Loading..

Loading..

name of the person

Loading..

Loading..

Clear

Number of records 4
Look more.. (2/145)
Export

export all inquiry results (4)
Save TXT fail

Save PDF fail

print
Open for editing with marked entries my bookmarks

display

sort
1

journal article

Design of an experimental setup to study the drives of battery electric vehiclesVodovozov, Valery; Raud, Zoja; Lehtla, TõnuWorld Academy of Science, Engineering and Technology2013 / p. 816-823 : ill

journal article
2

book article

Design of rotors for synchronous reluctance motor : analytical treatment and optimizationOrlova, Svetlana; Pugachov, Vladislav; Rassõlkin, Anton; Kallaste, Ants; Vaimann, Toomas2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe), 3-5 Sept. 2019, Genova, Italy : proceedings2019 / 9 p. : ill https://doi.org/10.23919/EPE.2019.8914760

book article
3

book article

A test bench to study propulsion drives of electric vehicles with a supercapacitor storage system [Electronic resource]Rassõlkin, Anton; Vodovozov, ValeryМеждународная Научно-Техническая Конференция "Силовая Электроника и Энергоэффективность" : 23-27.IX 2013, Алушта, Крым2013 / [3] p. : ill [CD-ROM]

book article
4

journal article

To study propulsion drives : test bench with supercapacitor storageRassõlkin, Anton; Vodovozov, ValeryЭнергосбережение, энергетика, энергоаудит = Energy saving, power engineering, energy audit2013 / p. 65-70 : ill

journal article

Number of records 4, displaying 1 - 4

1. test bench
2. 1995 ECC benchmark test
3. accelerated shelf-life test
4. adaptive test strategy generation
5. antigen test
6. Applications in Test Engineering
7. ASTM G65 dry sand rubber wheel abrasion test
8. Automated Synthesis of Software-based Self-test
9. automated test environment
10. automated test pattern generation
11. automatic test case generation
12. automatic test pattern generation
13. automatic test program generation
14. Auvergne test-bed
15. battery test
16. behavioral test
17. behaviour level test generation
18. bending test
19. bit-error rate test
20. Board and System Test
21. board test
22. bounds test
23. built-in self-test
24. capillary condensation redistribution test
25. chi-square test
26. closed bottle test
27. cognitive screening test
28. compartment fire test
29. compartment test
30. cone penetration test (CPT)
31. COVID-19 antigen test
32. cutting test
33. cybersecurity test bed
34. DDR4 interconnect test
35. design and test
36. design-for-test
37. deterministic test sequences
38. diagnostic test
39. digital test
40. Digital test and testable design
41. double-pulse test
42. drawing test
43. dry droplet antimicrobial test
44. embedded test
45. fan pressurisation test
46. final test result prediction
47. four-point bending test
48. FPGA based test
49. FPGA-Assisted Test
50. FPGA-centric test
51. functional self-test
52. functional test generation
53. Granger causality test
54. hardness test
55. Hierarchical Multi-level Test Generation
56. high-level synthesis for test
57. high-level test data generation
58. highlevel test generation
59. high-speed serial link test
60. IEEE 9 bus test system
61. implementation-independent test generation
62. in situ tensile test in SEM
63. industrial field test
64. in-situ tensile test in SEM
65. Johansen cointegration test
66. Kolmogorov-Smirnov test
67. load test
68. logic built-in self-test
69. Luria alternating series test
70. Mann–Kendall test
71. Mann-Kendall trend test
72. memory interconnect test
73. microprocessor test
74. Model test
75. multiplier test
76. offline test generation
77. orthogonal test
78. package test analysis
79. parallel design and test
80. performance test
81. piezocone penetration test (CPTu)
82. Point Load Test index
83. pressurisation test
84. processor-centric board test
85. progressive damage test
86. provably correct test generation
87. pseudo-exhaustive test
88. purity test
89. real-time room temperature test
90. rolling thin film oven test
91. rtioco-based timed test sequences
92. seasonal Mann Kendall test
93. seismic piezocone penetration test
94. self-test
95. self-test architectures
96. sentence writing test
97. serial sevens test
98. ship towing test tank
99. similar material simulation test
100. small-scale fire test
101. small‐scale test
102. software based self-test
103. software-based self-test
104. software-based self-test (SBST)
105. soil phosphorus (P) test
106. standard test method
107. static load test
108. static-dynamic probing test (SDT)
109. stress test
110. system level test
111. teaching design and test of systems
112. tensile test
113. tensile test
114. test
115. test and evaluation platform
116. test automation
117. test coverage
118. test driven development
119. test driven modelling
120. test embankment
121. test equipment
122. test generation
123. test generation and fault diagnosis
124. Test Group Generation for Detecting Multiple Faults
125. test groups
126. test model design
127. test optimization
128. test packets
129. test path synthesis
130. test patterns
131. test point insertion
132. test program generation
133. test reference year
134. test replication
135. test scenario description language
136. test-bed
137. test-chips
138. test-house
139. test-pattern
140. test-suite reduction
141. Three-point bending test
142. unit root test
143. usability platform test

1. European Test Symposium (ETS)
2. 16PF (test)

match

sort

Otsing
Valikud 0

year of publication

author

TalTech department

subject term

series

name of the person

keyword

TalTech Library

Akadeemia tee 1

13519

TalTech homepage TalTech Library homepage Digital Collection of TalTech Library Digiteek Repository

6203551

data@taltech.ee

TalTech Raamatukogu