Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
test patterns (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(2/166)
Export
export all inquiry results
(1)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
New test patterns to check the hierarchical structure of wordnets
Lohk, Ahti
;
Norta, Alexander
;
Orav, Heili
;
Võhandu, Leo
Information and Software Technologies : 20th International Conference, ICIST 2014, Druskininkai, Lithuania, October 9-10, 2014 : proceedings
2014
/
p. 110-120
book article
Number of records 1, displaying
1 - 1
keyword
164
1.
test patterns
2.
abstract syntax patterns
3.
airflow patterns
4.
analysis patterns
5.
archetype patterns
6.
archetypes and archetype patterns
7.
archetypes and archetype patterns based development
8.
budgeting patterns
9.
business archetypes and archetype patterns
10.
consumer load patterns
11.
Damage patterns
12.
demand patterns
13.
design patterns
14.
dive patterns
15.
dolphin patterns
16.
flow patterns
17.
identification patterns
18.
interaction patterns
19.
layout patterns
20.
mining line patterns from event logs
21.
mining patterns from event logs
22.
model-based patterns
23.
moving patterns
24.
patterns
25.
polysemy patterns
26.
religious patterns
27.
security patterns
28.
sequential patterns
29.
spatial patterns
30.
task knowledge patterns
31.
trends and patterns
32.
trigger-response patterns
33.
3D surface patterns
34.
accelerated shelf-life test
35.
adaptive test strategy generation
36.
antigen test
37.
ASTM G65 dry sand rubber wheel abrasion test
38.
automated test environment
39.
automated test pattern generation
40.
automatic test case generation
41.
automatic test pattern generation
42.
automatic test program generation
43.
Auvergne test-bed
44.
battery test
45.
behavioral test
46.
behaviour level test generation
47.
bending test
48.
bit-error rate test
49.
Board and System Test
50.
board test
51.
bounds test
52.
built-in self-test
53.
capillary condensation redistribution test
54.
chi-square test
55.
closed bottle test
56.
cognitive screening test
57.
compartment fire test
58.
compartment test
59.
cone penetration test (CPT)
60.
COVID-19 antigen test
61.
cutting test
62.
cybersecurity test bed
63.
DDR4 interconnect test
64.
design and test
65.
design-for-test
66.
deterministic test sequences
67.
diagnostic test
68.
digital test
69.
Digital test and testable design
70.
double-pulse test
71.
drawing test
72.
dry droplet antimicrobial test
73.
embedded test
74.
fan pressurisation test
75.
final test result prediction
76.
four-point bending test
77.
FPGA based test
78.
FPGA-Assisted Test
79.
FPGA-centric test
80.
functional self-test
81.
functional test generation
82.
Granger causality test
83.
hardness test
84.
high-level synthesis for test
85.
high-level test data generation
86.
highlevel test generation
87.
high-speed serial link test
88.
IEEE 9 bus test system
89.
implementation-independent test generation
90.
in situ tensile test in SEM
91.
industrial field test
92.
in-situ tensile test in SEM
93.
Johansen cointegration test
94.
Kolmogorov-Smirnov test
95.
load test
96.
logic built-in self-test
97.
Luria alternating series test
98.
Mann–Kendall test
99.
memory interconnect test
100.
microprocessor test
101.
Model test
102.
multiplier test
103.
offline test generation
104.
orthogonal test
105.
package test analysis
106.
parallel design and test
107.
performance test
108.
piezocone penetration test (CPTu)
109.
Point Load Test index
110.
pressurisation test
111.
processor-centric board test
112.
progressive damage test
113.
provably correct test generation
114.
pseudo-exhaustive test
115.
purity test
116.
rtioco-based timed test sequences
117.
seasonal Mann Kendall test
118.
seismic piezocone penetration test
119.
self-test
120.
self-test architectures
121.
sentence writing test
122.
serial sevens test
123.
ship towing test tank
124.
similar material simulation test
125.
small‐scale test
126.
software based self-test
127.
software-based self-test
128.
software-based self-test (SBST)
129.
soil phosphorus (P) test
130.
standard test method
131.
static load test
132.
static-dynamic probing test (SDT)
133.
stress test
134.
system level test
135.
teaching design and test of systems
136.
tensile test
137.
test
138.
test and evaluation platform
139.
test bench
140.
test coverage
141.
test driven development
142.
test driven modelling
143.
test embankment
144.
test equipment
145.
test generation
146.
test generation and fault diagnosis
147.
test groups
148.
test model design
149.
test optimization
150.
test packets
151.
test path synthesis
152.
test point insertion
153.
test program generation
154.
test reference year
155.
test replication
156.
test scenario description language
157.
test-bed
158.
test-chips
159.
test-house
160.
test-pattern
161.
test-suite reduction
162.
Three-point bending test
163.
unit root test
164.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT