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book article EST
/
book article ENG
New test patterns to check the hierarchical structure of wordnets
Lohk, Ahti
;
Norta, Alexander
;
Orav, Heili
;
Võhandu, Leo
Information and Software Technologies : 20th International Conference, ICIST 2014, Druskininkai, Lithuania, October 9-10, 2014 : proceedings
2014
/
p. 110-120
https://doi.org/10.1007/978-3-319-11958-8_9
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
Number of records 1, displaying
1 - 1
keyword
184
1.
test patterns
2.
abstract syntax patterns
3.
airflow patterns
4.
analysis patterns
5.
archetype patterns
6.
archetypes and archetype patterns
7.
archetypes and archetype patterns based development
8.
budgeting patterns
9.
business archetypes and archetype patterns
10.
consumer load patterns
11.
Damage patterns
12.
dark patterns
13.
demand patterns
14.
design patterns
15.
dietary patterns
16.
dive patterns
17.
dolphin patterns
18.
flow patterns
19.
human movement patterns
20.
identification patterns
21.
interaction patterns
22.
layout patterns
23.
Leakage Patterns
24.
mining line patterns from event logs
25.
mining patterns from event logs
26.
model-based patterns
27.
moving patterns
28.
patterns
29.
polysemy patterns
30.
public behavior patterns
31.
religious patterns
32.
river flood patterns
33.
security patterns
34.
sequential patterns
35.
spatial patterns
36.
task knowledge patterns
37.
travel patterns
38.
trends and patterns
39.
trigger-response patterns
40.
urban patterns
41.
user interface patterns
42.
3D surface patterns
43.
accelerated shelf-life test
44.
adaptive test strategy generation
45.
antigen test
46.
Applications in Test Engineering
47.
ASTM G65 dry sand rubber wheel abrasion test
48.
Automated Synthesis of Software-based Self-test
49.
automated test environment
50.
automated test pattern generation
51.
automatic test case generation
52.
automatic test pattern generation
53.
automatic test program generation
54.
Auvergne test-bed
55.
battery test
56.
behavioral test
57.
behaviour level test generation
58.
bending test
59.
bit-error rate test
60.
Board and System Test
61.
board test
62.
bounds test
63.
built-in self-test
64.
capillary condensation redistribution test
65.
chi-square test
66.
closed bottle test
67.
cognitive screening test
68.
compartment fire test
69.
compartment test
70.
cone penetration test (CPT)
71.
COVID-19 antigen test
72.
cutting test
73.
cybersecurity test bed
74.
DDR4 interconnect test
75.
design and test
76.
design-for-test
77.
deterministic test sequences
78.
diagnostic test
79.
digital test
80.
Digital test and testable design
81.
double-pulse test
82.
drawing test
83.
dry droplet antimicrobial test
84.
embedded test
85.
fan pressurisation test
86.
final test result prediction
87.
four-point bending test
88.
FPGA based test
89.
FPGA-Assisted Test
90.
FPGA-centric test
91.
functional self-test
92.
functional test generation
93.
Granger causality test
94.
hardness test
95.
Hierarchical Multi-level Test Generation
96.
high-level synthesis for test
97.
high-level test data generation
98.
highlevel test generation
99.
high-speed serial link test
100.
IEEE 9 bus test system
101.
implementation-independent test generation
102.
in situ tensile test in SEM
103.
industrial field test
104.
in-situ tensile test in SEM
105.
Johansen cointegration test
106.
Kolmogorov-Smirnov test
107.
load test
108.
logic built-in self-test
109.
Luria alternating series test
110.
Mann–Kendall test
111.
Mann-Kendall trend test
112.
memory interconnect test
113.
microprocessor test
114.
Model test
115.
multiplier test
116.
offline test generation
117.
orthogonal test
118.
package test analysis
119.
parallel design and test
120.
performance test
121.
piezocone penetration test (CPTu)
122.
Point Load Test index
123.
pressurisation test
124.
processor-centric board test
125.
progressive damage test
126.
provably correct test generation
127.
pseudo-exhaustive test
128.
purity test
129.
real-time room temperature test
130.
rolling thin film oven test
131.
rtioco-based timed test sequences
132.
seasonal Mann Kendall test
133.
seismic piezocone penetration test
134.
self-test
135.
self-test architectures
136.
sentence writing test
137.
serial sevens test
138.
ship towing test tank
139.
similar material simulation test
140.
small-scale fire test
141.
small‐scale test
142.
software based self-test
143.
software-based self-test
144.
software-based self-test (SBST)
145.
soil phosphorus (P) test
146.
standard test method
147.
static load test
148.
static-dynamic probing test (SDT)
149.
stress test
150.
system level test
151.
teaching design and test of systems
152.
tensile test
153.
tensile test
154.
test
155.
test and evaluation platform
156.
test automation
157.
test bench
158.
test coverage
159.
test driven development
160.
test driven modelling
161.
test embankment
162.
test equipment
163.
test generation
164.
test generation and fault diagnosis
165.
Test Group Generation for Detecting Multiple Faults
166.
test groups
167.
test model design
168.
test optimization
169.
test packets
170.
test path synthesis
171.
test point insertion
172.
test program generation
173.
test reference year
174.
test replication
175.
test scenario description language
176.
test-bed
177.
test-chips
178.
test-house
179.
test-pattern
180.
test-suite reduction
181.
Three-point bending test
182.
unit root test
183.
usability platform test
184.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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