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journal article

Development of airtightness of Estonian wooden buildingsHallik, Jaanus; Kalamees, TargoJournal of sustainable architecture and civil engineering2019 / p. 36-43 : ill https://doi.org/10.5755/j01.sace.24.1.23231

journal article
Seotud publikatsioonid 1
- On design principles and calculation methods related to air leakages and thermal bridges in well-insulated building envelopes = Õhulekete ja külmasildade mõju hindamise ja arvutamise põhimõtted hästi soojustatud piirdetarindite projekteerimisel
2

book article

Development of airtightness of Estonian wooden buildings : [conference paper]Hallik, Jaanus; Kalamees, TargoProceedings of the I Forum Wood Building Baltic, 2019 : [27.02-1.03.2019, Tallinn]2019 / p. 46-47 : ill https://www.ester.ee/record=b5197207*est

book article

Number of records 2, displaying 1 - 2

1. fan pressurisation test
2. pressurisation test
3. accelerated shelf-life test
4. adaptive test strategy generation
5. antigen test
6. ASTM G65 dry sand rubber wheel abrasion test
7. automated test environment
8. automated test pattern generation
9. automatic test case generation
10. automatic test pattern generation
11. automatic test program generation
12. Auvergne test-bed
13. battery test
14. behavioral test
15. behaviour level test generation
16. bending test
17. bit-error rate test
18. Board and System Test
19. board test
20. bounds test
21. built-in self-test
22. capillary condensation redistribution test
23. chi-square test
24. closed bottle test
25. cognitive screening test
26. compartment fire test
27. compartment test
28. cone penetration test (CPT)
29. COVID-19 antigen test
30. cutting test
31. cybersecurity test bed
32. DDR4 interconnect test
33. design and test
34. design-for-test
35. deterministic test sequences
36. diagnostic test
37. digital test
38. Digital test and testable design
39. double-pulse test
40. drawing test
41. dry droplet antimicrobial test
42. embedded test
43. final test result prediction
44. four-point bending test
45. FPGA based test
46. FPGA-Assisted Test
47. FPGA-centric test
48. functional self-test
49. functional test generation
50. Granger causality test
51. hardness test
52. high-level synthesis for test
53. high-level test data generation
54. highlevel test generation
55. high-speed serial link test
56. IEEE 9 bus test system
57. implementation-independent test generation
58. in situ tensile test in SEM
59. industrial field test
60. in-situ tensile test in SEM
61. Johansen cointegration test
62. Kolmogorov-Smirnov test
63. load test
64. logic built-in self-test
65. Luria alternating series test
66. Mann–Kendall test
67. memory interconnect test
68. microprocessor test
69. Model test
70. multiplier test
71. offline test generation
72. orthogonal test
73. package test analysis
74. parallel design and test
75. performance test
76. piezocone penetration test (CPTu)
77. Point Load Test index
78. processor-centric board test
79. progressive damage test
80. provably correct test generation
81. pseudo-exhaustive test
82. purity test
83. rtioco-based timed test sequences
84. seasonal Mann Kendall test
85. seismic piezocone penetration test
86. self-test
87. self-test architectures
88. sentence writing test
89. serial sevens test
90. ship towing test tank
91. similar material simulation test
92. small-scale fire test
93. small‐scale test
94. software based self-test
95. software-based self-test
96. software-based self-test (SBST)
97. soil phosphorus (P) test
98. standard test method
99. static load test
100. static-dynamic probing test (SDT)
101. stress test
102. system level test
103. teaching design and test of systems
104. tensile test
105. test
106. test and evaluation platform
107. test bench
108. test coverage
109. test driven development
110. test driven modelling
111. test embankment
112. test equipment
113. test generation
114. test generation and fault diagnosis
115. test groups
116. test model design
117. test optimization
118. test packets
119. test path synthesis
120. test patterns
121. test point insertion
122. test program generation
123. test reference year
124. test replication
125. test scenario description language
126. test-bed
127. test-chips
128. test-house
129. test-pattern
130. test-suite reduction
131. Three-point bending test
132. unit root test
133. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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