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journal article EST
/
journal article ENG
Tensile analysis and assessment of carbon and alloy steels using FE approach as an idealization of material fractures under collision and grounding
Ridwan
;
Prabowo, Aditya Rio
;
Muhayat, Nurul
;
Putranto, Teguh
;
Sohn, Jung Min
Curved and Layered Structures
2020
/
p. 188-198
https://doi.org/10.1515/cls-2020-0016
Journal metrics at Scopus
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journal article EST
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journal article ENG
Number of records 1, displaying
1 - 1
keyword
137
1.
in situ tensile test in SEM
2.
in-situ tensile test in SEM
3.
tensile test
4.
tensile testing
5.
tensile tests
6.
tensile properties
7.
tensile property
8.
tensile strength
9.
accelerated shelf-life test
10.
adaptive test strategy generation
11.
antigen test
12.
ASTM G65 dry sand rubber wheel abrasion test
13.
automated test environment
14.
automated test pattern generation
15.
automatic test case generation
16.
automatic test pattern generation
17.
automatic test program generation
18.
Auvergne test-bed
19.
battery test
20.
behavioral test
21.
behaviour level test generation
22.
bending test
23.
bit-error rate test
24.
Board and System Test
25.
board test
26.
bounds test
27.
built-in self-test
28.
capillary condensation redistribution test
29.
chi-square test
30.
closed bottle test
31.
cognitive screening test
32.
compartment fire test
33.
compartment test
34.
cone penetration test (CPT)
35.
COVID-19 antigen test
36.
cutting test
37.
cybersecurity test bed
38.
DDR4 interconnect test
39.
design and test
40.
design-for-test
41.
deterministic test sequences
42.
diagnostic test
43.
digital test
44.
Digital test and testable design
45.
double-pulse test
46.
drawing test
47.
dry droplet antimicrobial test
48.
embedded test
49.
fan pressurisation test
50.
final test result prediction
51.
four-point bending test
52.
FPGA based test
53.
FPGA-Assisted Test
54.
FPGA-centric test
55.
functional self-test
56.
functional test generation
57.
Granger causality test
58.
hardness test
59.
high-level synthesis for test
60.
high-level test data generation
61.
highlevel test generation
62.
high-speed serial link test
63.
IEEE 9 bus test system
64.
implementation-independent test generation
65.
industrial field test
66.
Johansen cointegration test
67.
Kolmogorov-Smirnov test
68.
load test
69.
logic built-in self-test
70.
Luria alternating series test
71.
Mann–Kendall test
72.
memory interconnect test
73.
microprocessor test
74.
Model test
75.
multiplier test
76.
offline test generation
77.
orthogonal test
78.
package test analysis
79.
parallel design and test
80.
performance test
81.
piezocone penetration test (CPTu)
82.
Point Load Test index
83.
pressurisation test
84.
processor-centric board test
85.
progressive damage test
86.
provably correct test generation
87.
pseudo-exhaustive test
88.
purity test
89.
rtioco-based timed test sequences
90.
seasonal Mann Kendall test
91.
seismic piezocone penetration test
92.
self-test
93.
self-test architectures
94.
sentence writing test
95.
serial sevens test
96.
ship towing test tank
97.
similar material simulation test
98.
small‐scale test
99.
software based self-test
100.
software-based self-test
101.
software-based self-test (SBST)
102.
soil phosphorus (P) test
103.
standard test method
104.
static load test
105.
static-dynamic probing test (SDT)
106.
stress test
107.
system level test
108.
teaching design and test of systems
109.
test
110.
test and evaluation platform
111.
test bench
112.
test coverage
113.
test driven development
114.
test driven modelling
115.
test embankment
116.
test equipment
117.
test generation
118.
test generation and fault diagnosis
119.
test groups
120.
test model design
121.
test optimization
122.
test packets
123.
test path synthesis
124.
test patterns
125.
test point insertion
126.
test program generation
127.
test reference year
128.
test replication
129.
test scenario description language
130.
test-bed
131.
test-chips
132.
test-house
133.
test-pattern
134.
test-suite reduction
135.
Three-point bending test
136.
unit root test
137.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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