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journal article EST
/
journal article ENG
Molecularly imprinted polymer based electrochemical sensor for quantitative detection of SARS-CoV-2 spike protein
Ayankojo, Akinrinade George
;
Boroznjak, Roman
;
Reut, Jekaterina
;
Öpik, Andres
;
Sõritski, Vitali
Sensors and Actuators B: Chemical
2022
/
Art. 131160
https://doi.org/10.1016/j.snb.2021.131160
Journal metrics at Scopus
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Article at WOS
journal article EST
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journal article ENG
Number of records 1, displaying
1 - 1
keyword
146
1.
antigen test
2.
COVID-19 antigen test
3.
antigen
4.
carcinoembryonic antigen
5.
Thomsen-Friedenreich antigen
6.
accelerated shelf-life test
7.
adaptive test strategy generation
8.
Applications in Test Engineering
9.
ASTM G65 dry sand rubber wheel abrasion test
10.
Automated Synthesis of Software-based Self-test
11.
automated test environment
12.
automated test pattern generation
13.
automatic test case generation
14.
automatic test pattern generation
15.
automatic test program generation
16.
Auvergne test-bed
17.
battery test
18.
behavioral test
19.
behaviour level test generation
20.
bending test
21.
bit-error rate test
22.
Board and System Test
23.
board test
24.
bounds test
25.
built-in self-test
26.
capillary condensation redistribution test
27.
chi-square test
28.
closed bottle test
29.
cognitive screening test
30.
compartment fire test
31.
compartment test
32.
cone penetration test (CPT)
33.
cutting test
34.
cybersecurity test bed
35.
DDR4 interconnect test
36.
design and test
37.
design-for-test
38.
deterministic test sequences
39.
diagnostic test
40.
digital test
41.
Digital test and testable design
42.
double-pulse test
43.
drawing test
44.
dry droplet antimicrobial test
45.
embedded test
46.
fan pressurisation test
47.
final test result prediction
48.
four-point bending test
49.
FPGA based test
50.
FPGA-Assisted Test
51.
FPGA-centric test
52.
functional self-test
53.
functional test generation
54.
Granger causality test
55.
hardness test
56.
Hierarchical Multi-level Test Generation
57.
high-level synthesis for test
58.
high-level test data generation
59.
highlevel test generation
60.
high-speed serial link test
61.
IEEE 9 bus test system
62.
implementation-independent test generation
63.
in situ tensile test in SEM
64.
industrial field test
65.
in-situ tensile test in SEM
66.
Johansen cointegration test
67.
Kolmogorov-Smirnov test
68.
load test
69.
logic built-in self-test
70.
Luria alternating series test
71.
Mann–Kendall test
72.
Mann-Kendall trend test
73.
memory interconnect test
74.
microprocessor test
75.
Model test
76.
multiplier test
77.
offline test generation
78.
orthogonal test
79.
package test analysis
80.
parallel design and test
81.
performance test
82.
piezocone penetration test (CPTu)
83.
Point Load Test index
84.
pressurisation test
85.
processor-centric board test
86.
progressive damage test
87.
provably correct test generation
88.
pseudo-exhaustive test
89.
purity test
90.
real-time room temperature test
91.
rolling thin film oven test
92.
rtioco-based timed test sequences
93.
seasonal Mann Kendall test
94.
seismic piezocone penetration test
95.
self-test
96.
self-test architectures
97.
sentence writing test
98.
serial sevens test
99.
ship towing test tank
100.
similar material simulation test
101.
small-scale fire test
102.
small‐scale test
103.
software based self-test
104.
software-based self-test
105.
software-based self-test (SBST)
106.
soil phosphorus (P) test
107.
standard test method
108.
static load test
109.
static-dynamic probing test (SDT)
110.
stress test
111.
system level test
112.
teaching design and test of systems
113.
tensile test
114.
tensile test
115.
test
116.
test and evaluation platform
117.
test automation
118.
test bench
119.
test coverage
120.
test driven development
121.
test driven modelling
122.
test embankment
123.
test equipment
124.
test generation
125.
test generation and fault diagnosis
126.
Test Group Generation for Detecting Multiple Faults
127.
test groups
128.
test model design
129.
test optimization
130.
test packets
131.
test path synthesis
132.
test patterns
133.
test point insertion
134.
test program generation
135.
test reference year
136.
test replication
137.
test scenario description language
138.
test-bed
139.
test-chips
140.
test-house
141.
test-pattern
142.
test-suite reduction
143.
Three-point bending test
144.
unit root test
145.
usability platform test
146.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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