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journal article EST
/
journal article ENG
Molecularly imprinted polymer based electrochemical sensor for quantitative detection of SARS-CoV-2 spike protein
Ayankojo, Akinrinade George
;
Boroznjak, Roman
;
Reut, Jekaterina
;
Öpik, Andres
;
Sõritski, Vitali
Sensors and Actuators B: Chemical
2022
/
Art. 131160
https://doi.org/10.1016/j.snb.2021.131160
Journal metrics at Scopus
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Article at WOS
journal article EST
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journal article ENG
Number of records 1, displaying
1 - 1
keyword
135
1.
antigen test
2.
COVID-19 antigen test
3.
antigen
4.
carcinoembryonic antigen
5.
Thomsen-Friedenreich antigen
6.
accelerated shelf-life test
7.
adaptive test strategy generation
8.
ASTM G65 dry sand rubber wheel abrasion test
9.
automated test environment
10.
automated test pattern generation
11.
automatic test case generation
12.
automatic test pattern generation
13.
automatic test program generation
14.
Auvergne test-bed
15.
battery test
16.
behavioral test
17.
behaviour level test generation
18.
bending test
19.
bit-error rate test
20.
Board and System Test
21.
board test
22.
bounds test
23.
built-in self-test
24.
capillary condensation redistribution test
25.
chi-square test
26.
closed bottle test
27.
cognitive screening test
28.
compartment fire test
29.
compartment test
30.
cone penetration test (CPT)
31.
cutting test
32.
cybersecurity test bed
33.
DDR4 interconnect test
34.
design and test
35.
design-for-test
36.
deterministic test sequences
37.
diagnostic test
38.
digital test
39.
Digital test and testable design
40.
double-pulse test
41.
drawing test
42.
dry droplet antimicrobial test
43.
embedded test
44.
fan pressurisation test
45.
final test result prediction
46.
four-point bending test
47.
FPGA based test
48.
FPGA-Assisted Test
49.
FPGA-centric test
50.
functional self-test
51.
functional test generation
52.
Granger causality test
53.
hardness test
54.
high-level synthesis for test
55.
high-level test data generation
56.
highlevel test generation
57.
high-speed serial link test
58.
IEEE 9 bus test system
59.
implementation-independent test generation
60.
in situ tensile test in SEM
61.
industrial field test
62.
in-situ tensile test in SEM
63.
Johansen cointegration test
64.
Kolmogorov-Smirnov test
65.
load test
66.
logic built-in self-test
67.
Luria alternating series test
68.
Mann–Kendall test
69.
memory interconnect test
70.
microprocessor test
71.
Model test
72.
multiplier test
73.
offline test generation
74.
orthogonal test
75.
package test analysis
76.
parallel design and test
77.
performance test
78.
piezocone penetration test (CPTu)
79.
Point Load Test index
80.
pressurisation test
81.
processor-centric board test
82.
progressive damage test
83.
provably correct test generation
84.
pseudo-exhaustive test
85.
purity test
86.
rtioco-based timed test sequences
87.
seasonal Mann Kendall test
88.
seismic piezocone penetration test
89.
self-test
90.
self-test architectures
91.
sentence writing test
92.
serial sevens test
93.
ship towing test tank
94.
similar material simulation test
95.
small‐scale test
96.
software based self-test
97.
software-based self-test
98.
software-based self-test (SBST)
99.
soil phosphorus (P) test
100.
standard test method
101.
static load test
102.
static-dynamic probing test (SDT)
103.
stress test
104.
system level test
105.
teaching design and test of systems
106.
tensile test
107.
test
108.
test and evaluation platform
109.
test bench
110.
test coverage
111.
test driven development
112.
test driven modelling
113.
test embankment
114.
test equipment
115.
test generation
116.
test generation and fault diagnosis
117.
test groups
118.
test model design
119.
test optimization
120.
test packets
121.
test path synthesis
122.
test patterns
123.
test point insertion
124.
test program generation
125.
test reference year
126.
test replication
127.
test scenario description language
128.
test-bed
129.
test-chips
130.
test-house
131.
test-pattern
132.
test-suite reduction
133.
Three-point bending test
134.
unit root test
135.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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