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journal article EST
/
journal article ENG
Molecularly imprinted polymer based electrochemical sensor for quantitative detection of SARS-CoV-2 spike protein
Ayankojo, Akinrinade George
;
Boroznjak, Roman
;
Reut, Jekaterina
;
Öpik, Andres
;
Sõritski, Vitali
Sensors and Actuators B: Chemical
2022
/
Art. 131160
https://doi.org/10.1016/j.snb.2021.131160
Journal metrics at Scopus
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Article at WOS
journal article EST
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journal article ENG
Number of records 1, displaying
1 - 1
keyword
136
1.
antigen test
2.
COVID-19 antigen test
3.
antigen
4.
carcinoembryonic antigen
5.
Thomsen-Friedenreich antigen
6.
accelerated shelf-life test
7.
adaptive test strategy generation
8.
ASTM G65 dry sand rubber wheel abrasion test
9.
automated test environment
10.
automated test pattern generation
11.
automatic test case generation
12.
automatic test pattern generation
13.
automatic test program generation
14.
Auvergne test-bed
15.
battery test
16.
behavioral test
17.
behaviour level test generation
18.
bending test
19.
bit-error rate test
20.
Board and System Test
21.
board test
22.
bounds test
23.
built-in self-test
24.
capillary condensation redistribution test
25.
chi-square test
26.
closed bottle test
27.
cognitive screening test
28.
compartment fire test
29.
compartment test
30.
cone penetration test (CPT)
31.
cutting test
32.
cybersecurity test bed
33.
DDR4 interconnect test
34.
design and test
35.
design-for-test
36.
deterministic test sequences
37.
diagnostic test
38.
digital test
39.
Digital test and testable design
40.
double-pulse test
41.
drawing test
42.
dry droplet antimicrobial test
43.
embedded test
44.
fan pressurisation test
45.
final test result prediction
46.
four-point bending test
47.
FPGA based test
48.
FPGA-Assisted Test
49.
FPGA-centric test
50.
functional self-test
51.
functional test generation
52.
Granger causality test
53.
hardness test
54.
high-level synthesis for test
55.
high-level test data generation
56.
highlevel test generation
57.
high-speed serial link test
58.
IEEE 9 bus test system
59.
implementation-independent test generation
60.
in situ tensile test in SEM
61.
industrial field test
62.
in-situ tensile test in SEM
63.
Johansen cointegration test
64.
Kolmogorov-Smirnov test
65.
load test
66.
logic built-in self-test
67.
Luria alternating series test
68.
Mann–Kendall test
69.
memory interconnect test
70.
microprocessor test
71.
Model test
72.
multiplier test
73.
offline test generation
74.
orthogonal test
75.
package test analysis
76.
parallel design and test
77.
performance test
78.
piezocone penetration test (CPTu)
79.
Point Load Test index
80.
pressurisation test
81.
processor-centric board test
82.
progressive damage test
83.
provably correct test generation
84.
pseudo-exhaustive test
85.
purity test
86.
rtioco-based timed test sequences
87.
seasonal Mann Kendall test
88.
seismic piezocone penetration test
89.
self-test
90.
self-test architectures
91.
sentence writing test
92.
serial sevens test
93.
ship towing test tank
94.
similar material simulation test
95.
small-scale fire test
96.
small‐scale test
97.
software based self-test
98.
software-based self-test
99.
software-based self-test (SBST)
100.
soil phosphorus (P) test
101.
standard test method
102.
static load test
103.
static-dynamic probing test (SDT)
104.
stress test
105.
system level test
106.
teaching design and test of systems
107.
tensile test
108.
test
109.
test and evaluation platform
110.
test bench
111.
test coverage
112.
test driven development
113.
test driven modelling
114.
test embankment
115.
test equipment
116.
test generation
117.
test generation and fault diagnosis
118.
test groups
119.
test model design
120.
test optimization
121.
test packets
122.
test path synthesis
123.
test patterns
124.
test point insertion
125.
test program generation
126.
test reference year
127.
test replication
128.
test scenario description language
129.
test-bed
130.
test-chips
131.
test-house
132.
test-pattern
133.
test-suite reduction
134.
Three-point bending test
135.
unit root test
136.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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