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Proceedings : International Test Conference 2012 (source)
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1
book article
FPGA-based synthetic instrumentation for board test
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
;
Odintsov, Sergei
;
Wenzel, Thomas
Proceedings : International Test Conference 2012
2012
/
p. 1-10 : ill
https://ieeexplore.ieee.org/document/6401571
book article
Number of records 1, displaying
1 - 1
keyword
147
1.
conference proceedings
2.
24th IEEE International Conference on Industrial Technology 2023
3.
Regulation 1215/2012 Brussels I Recast
4.
international relations and international political economy
5.
accelerated shelf-life test
6.
adaptive test strategy generation
7.
antigen test
8.
Applications in Test Engineering
9.
ASTM G65 dry sand rubber wheel abrasion test
10.
Automated Synthesis of Software-based Self-test
11.
automated test environment
12.
automated test pattern generation
13.
automatic test case generation
14.
automatic test pattern generation
15.
automatic test program generation
16.
Auvergne test-bed
17.
battery test
18.
behavioral test
19.
behaviour level test generation
20.
bending test
21.
bit-error rate test
22.
Board and System Test
23.
board test
24.
bounds test
25.
built-in self-test
26.
capillary condensation redistribution test
27.
chi-square test
28.
closed bottle test
29.
cognitive screening test
30.
compartment fire test
31.
compartment test
32.
cone penetration test (CPT)
33.
COVID-19 antigen test
34.
cutting test
35.
cybersecurity test bed
36.
DDR4 interconnect test
37.
design and test
38.
design-for-test
39.
deterministic test sequences
40.
diagnostic test
41.
digital test
42.
Digital test and testable design
43.
double-pulse test
44.
drawing test
45.
dry droplet antimicrobial test
46.
embedded test
47.
fan pressurisation test
48.
final test result prediction
49.
four-point bending test
50.
FPGA based test
51.
FPGA-Assisted Test
52.
FPGA-centric test
53.
functional self-test
54.
functional test generation
55.
Granger causality test
56.
hardness test
57.
Hierarchical Multi-level Test Generation
58.
high-level synthesis for test
59.
high-level test data generation
60.
highlevel test generation
61.
high-speed serial link test
62.
IEEE 9 bus test system
63.
implementation-independent test generation
64.
in situ tensile test in SEM
65.
industrial field test
66.
in-situ tensile test in SEM
67.
Johansen cointegration test
68.
Kolmogorov-Smirnov test
69.
load test
70.
logic built-in self-test
71.
Luria alternating series test
72.
Mann–Kendall test
73.
Mann-Kendall trend test
74.
memory interconnect test
75.
microprocessor test
76.
Model test
77.
multiplier test
78.
offline test generation
79.
orthogonal test
80.
package test analysis
81.
parallel design and test
82.
performance test
83.
piezocone penetration test (CPTu)
84.
Point Load Test index
85.
pressurisation test
86.
processor-centric board test
87.
progressive damage test
88.
provably correct test generation
89.
pseudo-exhaustive test
90.
purity test
91.
real-time room temperature test
92.
rolling thin film oven test
93.
rtioco-based timed test sequences
94.
seasonal Mann Kendall test
95.
seismic piezocone penetration test
96.
self-test
97.
self-test architectures
98.
sentence writing test
99.
serial sevens test
100.
ship towing test tank
101.
similar material simulation test
102.
small-scale fire test
103.
small‐scale test
104.
software based self-test
105.
software-based self-test
106.
software-based self-test (SBST)
107.
soil phosphorus (P) test
108.
standard test method
109.
static load test
110.
static-dynamic probing test (SDT)
111.
stress test
112.
system level test
113.
teaching design and test of systems
114.
tensile test
115.
tensile test
116.
test
117.
test and evaluation platform
118.
test automation
119.
test bench
120.
test coverage
121.
test driven development
122.
test driven modelling
123.
test embankment
124.
test equipment
125.
test generation
126.
test generation and fault diagnosis
127.
Test Group Generation for Detecting Multiple Faults
128.
test groups
129.
test model design
130.
test optimization
131.
test packets
132.
test path synthesis
133.
test patterns
134.
test point insertion
135.
test program generation
136.
test reference year
137.
test replication
138.
test scenario description language
139.
test-bed
140.
test-chips
141.
test-house
142.
test-pattern
143.
test-suite reduction
144.
Three-point bending test
145.
unit root test
146.
usability platform test
147.
1995 ECC benchmark test
name of the person
24
1.
Armstrong, Neil, 1930-2012
2.
Budig, Peter-Klaus, 1928-2012
3.
Hagelberg, Raimund, 1927-2012
4.
Kaasik, Imbi, 1933-2012
5.
Kaselaan, Hugo, 1924-2012
6.
Kellik, Vlady, pseud., 1928-2012
7.
Kikas, Konrad, 1928-2012
8.
Koslov, Vladimir, 1928-2012
9.
Lavrov, Anatoli, 1930-2012
10.
Loday, Jean-Louis, 1936-2012
11.
Lääne, Ain, 1941-2012
12.
Parmasto, Erast, 1928-2012
13.
Pool, Ain-Matt, 1926-2012
14.
Port, Mart, 1922-2012
15.
Ranniku, Veljo,1934-2012
16.
Saarend, Kalle, 1925-2012
17.
Siimer, Enn, 1936-2012
18.
Tamkivi, Raivo, 1953-2012
19.
Uuemõis, Haljand, 1928-2012
20.
Uusen, Enn, 1941-2012
21.
Vall, Elvi, 1928-2012
22.
Velner, Harald-Adam, 1923-2012
23.
Veski, Ants, 1939-2012
24.
Üksti, Lembit, 1927-2012
CV
24
1.
Arro, Voldemar 1936-2012
2.
Kaselaan, Hugo 1924-2012
3.
Koslov, Vladimir 1928-2012
4.
Laanso, Ines-Reet 1950-2012
5.
Lavrov, Anatoli 1930-2012
6.
Lootus, Eveline 1929-2012
7.
Lääne, Ain 1941-2012
8.
Moon, Hele-Riin (2005-2012)
9.
Männil, Aino 1926-2012
10.
Pool, Ain-Matt 1926-2012
11.
Rannat, Erich 1928-2012
12.
Rüütelmaa, Uno 1936-2012
13.
Saarend, Kalle 1925-2012
14.
Siimer, Enn 1936-2012
15.
Suurna, Margit (kuni juuni 2012)
16.
Tamkivi, Raivo 1953-2012
17.
Treimann, Aksel 1944-2012
18.
Uuemõis, Haljand 1928-2012
19.
Uusen, Enn 1941-2012
20.
Velner, Harald-Adam 1923-2012
21.
Vesiloo, Paul 1930-2012
22.
Veski, Ants 1939-2012
23.
Viiroja, Andres 1951-2012
24.
Üksti, Lembit 1927-2012
subject term
12
1.
International Baltic conference on engineering materials and tribology (24 : 2015 : Tallinn)
2.
Aasta Betoonehitis, konkurss (2012)
3.
Aasta Insener, konkurss (2012)
4.
Aasta kolleeg, konkurss 2006-2012
5.
Aasta tehnikaüliõpilane, konkurss (2012)
6.
Eesti Geoloogiakeskus. Aprillikonverents (2012 : Tallinn)
7.
Eesti Konservatiivne Rahvaerakond (2012-)
8.
Tallinna visioonikonverentsid (2004-2012)
9.
2004-2012
10.
2005-2012
11.
European Test Symposium (ETS)
12.
16PF (test)
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