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book article

A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

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Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p

book article

Number of records 2, displaying 1 - 2

1. board test
2. processor-centric board test
3. Board and System Test
4. board
5. board composition
6. board diagnosis
7. board diversity
8. board of directors
9. Estonian Police and Border Guard Board (PPA)
10. laminate embedded printed circuit board
11. off-board charger
12. off-board charger (OBC)
13. off-board chargers
14. on-board charger (OBC)
15. on-board chargers
16. processor-centric board
17. single board computer
18. single-board computer
19. accelerated shelf-life test
20. adaptive test strategy generation
21. antigen test
22. ASTM G65 dry sand rubber wheel abrasion test
23. automated test environment
24. automated test pattern generation
25. automatic test case generation
26. automatic test pattern generation
27. automatic test program generation
28. Auvergne test-bed
29. battery test
30. behavioral test
31. behaviour level test generation
32. bending test
33. bit-error rate test
34. bounds test
35. built-in self-test
36. capillary condensation redistribution test
37. chi-square test
38. closed bottle test
39. cognitive screening test
40. compartment fire test
41. compartment test
42. cone penetration test (CPT)
43. COVID-19 antigen test
44. cutting test
45. cybersecurity test bed
46. DDR4 interconnect test
47. design and test
48. design-for-test
49. deterministic test sequences
50. diagnostic test
51. digital test
52. Digital test and testable design
53. double-pulse test
54. drawing test
55. dry droplet antimicrobial test
56. embedded test
57. fan pressurisation test
58. final test result prediction
59. four-point bending test
60. FPGA based test
61. FPGA-Assisted Test
62. FPGA-centric test
63. functional self-test
64. functional test generation
65. Granger causality test
66. hardness test
67. high-level synthesis for test
68. high-level test data generation
69. highlevel test generation
70. high-speed serial link test
71. IEEE 9 bus test system
72. implementation-independent test generation
73. in situ tensile test in SEM
74. industrial field test
75. in-situ tensile test in SEM
76. Johansen cointegration test
77. Kolmogorov-Smirnov test
78. load test
79. logic built-in self-test
80. Luria alternating series test
81. Mann–Kendall test
82. memory interconnect test
83. microprocessor test
84. Model test
85. multiplier test
86. offline test generation
87. orthogonal test
88. package test analysis
89. parallel design and test
90. performance test
91. piezocone penetration test (CPTu)
92. Point Load Test index
93. pressurisation test
94. progressive damage test
95. provably correct test generation
96. pseudo-exhaustive test
97. purity test
98. rtioco-based timed test sequences
99. seasonal Mann Kendall test
100. seismic piezocone penetration test
101. self-test
102. self-test architectures
103. sentence writing test
104. serial sevens test
105. ship towing test tank
106. similar material simulation test
107. small-scale fire test
108. small‐scale test
109. software based self-test
110. software-based self-test
111. software-based self-test (SBST)
112. soil phosphorus (P) test
113. standard test method
114. static load test
115. static-dynamic probing test (SDT)
116. stress test
117. system level test
118. teaching design and test of systems
119. tensile test
120. test
121. test and evaluation platform
122. test bench
123. test coverage
124. test driven development
125. test driven modelling
126. test embankment
127. test equipment
128. test generation
129. test generation and fault diagnosis
130. test groups
131. test model design
132. test optimization
133. test packets
134. test path synthesis
135. test patterns
136. test point insertion
137. test program generation
138. test reference year
139. test replication
140. test scenario description language
141. test-bed
142. test-chips
143. test-house
144. test-pattern
145. test-suite reduction
146. Three-point bending test
147. unit root test
148. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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