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test groups (keyword)
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book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
Number of records 1, displaying
1 - 1
keyword
156
1.
test groups
2.
Diagnosis-Related Groups (DRGs)
3.
ethnic groups
4.
focus groups
5.
functional groups
6.
geometric realizations of representations of real Lie groups
7.
industry trade groups
8.
methyl groups
9.
protective groups
10.
public research groups
11.
quantum groups
12.
size of functional groups
13.
sofic groups
14.
staff groups
15.
accelerated shelf-life test
16.
adaptive test strategy generation
17.
antigen test
18.
Applications in Test Engineering
19.
ASTM G65 dry sand rubber wheel abrasion test
20.
Automated Synthesis of Software-based Self-test
21.
automated test environment
22.
automated test pattern generation
23.
automatic test case generation
24.
automatic test pattern generation
25.
automatic test program generation
26.
Auvergne test-bed
27.
battery test
28.
behavioral test
29.
behaviour level test generation
30.
bending test
31.
bit-error rate test
32.
Board and System Test
33.
board test
34.
bounds test
35.
built-in self-test
36.
capillary condensation redistribution test
37.
chi-square test
38.
closed bottle test
39.
cognitive screening test
40.
compartment fire test
41.
compartment test
42.
cone penetration test (CPT)
43.
COVID-19 antigen test
44.
cutting test
45.
cybersecurity test bed
46.
DDR4 interconnect test
47.
design and test
48.
design-for-test
49.
deterministic test sequences
50.
diagnostic test
51.
digital test
52.
Digital test and testable design
53.
double-pulse test
54.
drawing test
55.
dry droplet antimicrobial test
56.
embedded test
57.
fan pressurisation test
58.
final test result prediction
59.
four-point bending test
60.
FPGA based test
61.
FPGA-Assisted Test
62.
FPGA-centric test
63.
functional self-test
64.
functional test generation
65.
Granger causality test
66.
hardness test
67.
Hierarchical Multi-level Test Generation
68.
high-level synthesis for test
69.
high-level test data generation
70.
highlevel test generation
71.
high-speed serial link test
72.
IEEE 9 bus test system
73.
implementation-independent test generation
74.
in situ tensile test in SEM
75.
industrial field test
76.
in-situ tensile test in SEM
77.
Johansen cointegration test
78.
Kolmogorov-Smirnov test
79.
load test
80.
logic built-in self-test
81.
Luria alternating series test
82.
Mann–Kendall test
83.
Mann-Kendall trend test
84.
memory interconnect test
85.
microprocessor test
86.
Model test
87.
multiplier test
88.
offline test generation
89.
orthogonal test
90.
package test analysis
91.
parallel design and test
92.
performance test
93.
piezocone penetration test (CPTu)
94.
Point Load Test index
95.
pressurisation test
96.
processor-centric board test
97.
progressive damage test
98.
provably correct test generation
99.
pseudo-exhaustive test
100.
purity test
101.
real-time room temperature test
102.
rolling thin film oven test
103.
rtioco-based timed test sequences
104.
seasonal Mann Kendall test
105.
seismic piezocone penetration test
106.
self-test
107.
self-test architectures
108.
sentence writing test
109.
serial sevens test
110.
ship towing test tank
111.
similar material simulation test
112.
small-scale fire test
113.
small‐scale test
114.
software based self-test
115.
software-based self-test
116.
software-based self-test (SBST)
117.
soil phosphorus (P) test
118.
standard test method
119.
static load test
120.
static-dynamic probing test (SDT)
121.
stress test
122.
system level test
123.
teaching design and test of systems
124.
tensile test
125.
tensile test
126.
test
127.
test and evaluation platform
128.
test automation
129.
test bench
130.
test coverage
131.
test driven development
132.
test driven modelling
133.
test embankment
134.
test equipment
135.
test generation
136.
test generation and fault diagnosis
137.
Test Group Generation for Detecting Multiple Faults
138.
test model design
139.
test optimization
140.
test packets
141.
test path synthesis
142.
test patterns
143.
test point insertion
144.
test program generation
145.
test reference year
146.
test replication
147.
test scenario description language
148.
test-bed
149.
test-chips
150.
test-house
151.
test-pattern
152.
test-suite reduction
153.
Three-point bending test
154.
unit root test
155.
usability platform test
156.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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