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book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
Number of records 1, displaying
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keyword
141
1.
test groups
2.
functional groups
3.
geometric realizations of representations of real Lie groups
4.
industry trade groups
5.
methyl groups
6.
public research groups
7.
quantum groups
8.
size of functional groups
9.
sofic groups
10.
staff groups
11.
accelerated shelf-life test
12.
adaptive test strategy generation
13.
antigen test
14.
ASTM G65 dry sand rubber wheel abrasion test
15.
automated test environment
16.
automated test pattern generation
17.
automatic test case generation
18.
automatic test pattern generation
19.
automatic test program generation
20.
Auvergne test-bed
21.
battery test
22.
behavioral test
23.
behaviour level test generation
24.
bending test
25.
bit-error rate test
26.
Board and System Test
27.
board test
28.
bounds test
29.
built-in self-test
30.
capillary condensation redistribution test
31.
chi-square test
32.
closed bottle test
33.
cognitive screening test
34.
compartment fire test
35.
compartment test
36.
cone penetration test (CPT)
37.
COVID-19 antigen test
38.
cutting test
39.
cybersecurity test bed
40.
DDR4 interconnect test
41.
design and test
42.
design-for-test
43.
deterministic test sequences
44.
diagnostic test
45.
digital test
46.
Digital test and testable design
47.
double-pulse test
48.
drawing test
49.
dry droplet antimicrobial test
50.
embedded test
51.
fan pressurisation test
52.
final test result prediction
53.
four-point bending test
54.
FPGA based test
55.
FPGA-Assisted Test
56.
FPGA-centric test
57.
functional self-test
58.
functional test generation
59.
Granger causality test
60.
hardness test
61.
high-level synthesis for test
62.
high-level test data generation
63.
highlevel test generation
64.
high-speed serial link test
65.
IEEE 9 bus test system
66.
implementation-independent test generation
67.
in situ tensile test in SEM
68.
industrial field test
69.
in-situ tensile test in SEM
70.
Johansen cointegration test
71.
Kolmogorov-Smirnov test
72.
load test
73.
logic built-in self-test
74.
Luria alternating series test
75.
Mann–Kendall test
76.
memory interconnect test
77.
microprocessor test
78.
Model test
79.
multiplier test
80.
offline test generation
81.
orthogonal test
82.
package test analysis
83.
parallel design and test
84.
performance test
85.
piezocone penetration test (CPTu)
86.
Point Load Test index
87.
pressurisation test
88.
processor-centric board test
89.
progressive damage test
90.
provably correct test generation
91.
pseudo-exhaustive test
92.
purity test
93.
rtioco-based timed test sequences
94.
seasonal Mann Kendall test
95.
seismic piezocone penetration test
96.
self-test
97.
self-test architectures
98.
sentence writing test
99.
serial sevens test
100.
ship towing test tank
101.
similar material simulation test
102.
small‐scale test
103.
software based self-test
104.
software-based self-test
105.
software-based self-test (SBST)
106.
soil phosphorus (P) test
107.
standard test method
108.
static load test
109.
static-dynamic probing test (SDT)
110.
stress test
111.
system level test
112.
teaching design and test of systems
113.
tensile test
114.
test
115.
test and evaluation platform
116.
test bench
117.
test coverage
118.
test driven development
119.
test driven modelling
120.
test embankment
121.
test equipment
122.
test generation
123.
test generation and fault diagnosis
124.
test model design
125.
test optimization
126.
test packets
127.
test path synthesis
128.
test patterns
129.
test point insertion
130.
test program generation
131.
test reference year
132.
test replication
133.
test scenario description language
134.
test-bed
135.
test-chips
136.
test-house
137.
test-pattern
138.
test-suite reduction
139.
Three-point bending test
140.
unit root test
141.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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