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double-pulse test (keyword)
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1
journal article
Experimental evaluation of GaN gate injection transistors
Rabkowski, Jacek
;
Barlik, Roman
Przeglad elektrotechniczny = Electrical review
2015
/
p. 9-12 : ill
http://dx.doi.org/10.15199/48.2015.03.03
journal article
Number of records 1, displaying
1 - 1
keyword
215
1.
double-pulse test
2.
double bootstrap DEA
3.
double bottom damage
4.
Double categories
5.
double category
6.
double deep Q-network
7.
double diamond model
8.
double forged tungsten
9.
double interceptor system
10.
double ML
11.
double negation shift
12.
double positivity
13.
double power-law
14.
double pushout (DPO) rewriting
15.
double Q-learning
16.
double seam
17.
double sequence
18.
double skin facade
19.
double sparsity
20.
double-cabled system
21.
double-frequency ripple
22.
double-layer capacitance
23.
double-pushout rewriting
24.
Double-stepped planing hull
25.
Double-well potential
26.
electric double-layer
27.
minimization by double reversal
28.
aortic pulse wave velocity
29.
arterial pulse wave
30.
cardiac pulse
31.
cardiac pulse variability
32.
complementary pulse wave velocity
33.
differential pulse voltammetry
34.
hybrid pulse width modulation
35.
nerve pulse
36.
partial discharge (PD) pulse
37.
pulse
38.
pulse analysis
39.
pulse arrival time
40.
pulse control
41.
pulse density modulation
42.
Pulse electrodeposition
43.
pulse features
44.
pulse inverters
45.
pulse measurements
46.
pulse propagation
47.
pulse rate
48.
Pulse shape analysis
49.
pulse shaping
50.
pulse shaping filters
51.
pulse transformers
52.
pulse wave
53.
pulse wave analysis
54.
pulse wave velocity
55.
pulse waveform analysis
56.
pulse width modulated converters
57.
pulse width modulated inverters
58.
pulse width modulated power converters
59.
pulse width modulation
60.
pulse width modulation (PWM)
61.
pulse width modulation (PWM) inverters
62.
pulse width modulation converter
63.
pulse width modulation converters
64.
pulse width modulation inverters
65.
Pulse-Amplitude-Modulation (PAM)
66.
pulse-width modulation
67.
pulse-width modulation (PWM)
68.
pulse-width modulations
69.
rectangular pulse
70.
sinusoidal pulse width modulator (SPWM)
71.
space vector pulse width modulation
72.
space vector pulse width modulation (SVPWM)
73.
space vector pulse-width modulation
74.
accelerated shelf-life test
75.
adaptive test strategy generation
76.
antigen test
77.
Applications in Test Engineering
78.
ASTM G65 dry sand rubber wheel abrasion test
79.
Automated Synthesis of Software-based Self-test
80.
automated test environment
81.
automated test pattern generation
82.
automatic test case generation
83.
automatic test pattern generation
84.
automatic test program generation
85.
Auvergne test-bed
86.
battery test
87.
behavioral test
88.
behaviour level test generation
89.
bending test
90.
bit-error rate test
91.
Board and System Test
92.
board test
93.
bounds test
94.
built-in self-test
95.
capillary condensation redistribution test
96.
chi-square test
97.
closed bottle test
98.
cognitive screening test
99.
compartment fire test
100.
compartment test
101.
cone penetration test (CPT)
102.
COVID-19 antigen test
103.
cutting test
104.
cybersecurity test bed
105.
DDR4 interconnect test
106.
design and test
107.
design-for-test
108.
deterministic test sequences
109.
diagnostic test
110.
digital test
111.
Digital test and testable design
112.
drawing test
113.
dry droplet antimicrobial test
114.
embedded test
115.
fan pressurisation test
116.
final test result prediction
117.
four-point bending test
118.
FPGA based test
119.
FPGA-Assisted Test
120.
FPGA-centric test
121.
functional self-test
122.
functional test generation
123.
Granger causality test
124.
hardness test
125.
Hierarchical Multi-level Test Generation
126.
high-level synthesis for test
127.
high-level test data generation
128.
highlevel test generation
129.
high-speed serial link test
130.
IEEE 9 bus test system
131.
implementation-independent test generation
132.
in situ tensile test in SEM
133.
industrial field test
134.
in-situ tensile test in SEM
135.
Johansen cointegration test
136.
Kolmogorov-Smirnov test
137.
load test
138.
logic built-in self-test
139.
Luria alternating series test
140.
Mann–Kendall test
141.
Mann-Kendall trend test
142.
memory interconnect test
143.
microprocessor test
144.
Model test
145.
multiplier test
146.
offline test generation
147.
orthogonal test
148.
package test analysis
149.
parallel design and test
150.
performance test
151.
piezocone penetration test (CPTu)
152.
Point Load Test index
153.
pressurisation test
154.
processor-centric board test
155.
progressive damage test
156.
provably correct test generation
157.
pseudo-exhaustive test
158.
purity test
159.
real-time room temperature test
160.
rolling thin film oven test
161.
rtioco-based timed test sequences
162.
seasonal Mann Kendall test
163.
seismic piezocone penetration test
164.
self-test
165.
self-test architectures
166.
sentence writing test
167.
serial sevens test
168.
ship towing test tank
169.
similar material simulation test
170.
small-scale fire test
171.
small‐scale test
172.
software based self-test
173.
software-based self-test
174.
software-based self-test (SBST)
175.
soil phosphorus (P) test
176.
standard test method
177.
static load test
178.
static-dynamic probing test (SDT)
179.
stress test
180.
system level test
181.
teaching design and test of systems
182.
tensile test
183.
tensile test
184.
test
185.
test and evaluation platform
186.
test automation
187.
test bench
188.
test coverage
189.
test driven development
190.
test driven modelling
191.
test embankment
192.
test equipment
193.
test generation
194.
test generation and fault diagnosis
195.
Test Group Generation for Detecting Multiple Faults
196.
test groups
197.
test model design
198.
test optimization
199.
test packets
200.
test path synthesis
201.
test patterns
202.
test point insertion
203.
test program generation
204.
test reference year
205.
test replication
206.
test scenario description language
207.
test-bed
208.
test-chips
209.
test-house
210.
test-pattern
211.
test-suite reduction
212.
Three-point bending test
213.
unit root test
214.
usability platform test
215.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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