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1
journal article
Experimental evaluation of GaN gate injection transistors
Rabkowski, Jacek
;
Barlik, Roman
Przeglad elektrotechniczny = Electrical review
2015
/
p. 9-12 : ill
http://dx.doi.org/10.15199/48.2015.03.03
journal article
Number of records 1, displaying
1 - 1
keyword
210
1.
double-pulse test
2.
double bootstrap DEA
3.
double bottom damage
4.
Double categories
5.
double category
6.
double diamond model
7.
double forged tungsten
8.
double interceptor system
9.
double ML
10.
double negation shift
11.
double positivity
12.
double power-law
13.
double pushout (DPO) rewriting
14.
double Q-learning
15.
double seam
16.
double sequence
17.
double sparsity
18.
double-cabled system
19.
double-frequency ripple
20.
double-layer capacitance
21.
double-pushout rewriting
22.
Double-stepped planing hull
23.
Double-well potential
24.
electric double-layer
25.
minimization by double reversal
26.
arterial pulse wave
27.
cardiac pulse
28.
cardiac pulse variability
29.
complementary pulse wave velocity
30.
differential pulse voltammetry
31.
hybrid pulse width modulation
32.
nerve pulse
33.
pulse
34.
pulse analysis
35.
pulse arrival time
36.
pulse control
37.
Pulse electrodeposition
38.
pulse features
39.
pulse inverters
40.
pulse measurements
41.
pulse propagation
42.
pulse rate
43.
Pulse shape analysis
44.
pulse shaping
45.
pulse shaping filters
46.
pulse transformers
47.
pulse wave
48.
pulse wave analysis
49.
pulse wave velocity
50.
pulse waveform analysis
51.
pulse width modulated converters
52.
pulse width modulated inverters
53.
pulse width modulated power converters
54.
pulse width modulation
55.
pulse width modulation (PWM)
56.
pulse width modulation (PWM) inverters
57.
pulse width modulation converter
58.
pulse width modulation converters
59.
pulse width modulation inverters
60.
Pulse-Amplitude-Modulation (PAM)
61.
pulse-width modulation
62.
pulse-width modulation (PWM)
63.
pulse-width modulations
64.
rectangular pulse
65.
sinusoidal pulse width modulator (SPWM)
66.
space vector pulse width modulation
67.
space vector pulse width modulation (SVPWM)
68.
space vector pulse-width modulation
69.
accelerated shelf-life test
70.
adaptive test strategy generation
71.
antigen test
72.
Applications in Test Engineering
73.
ASTM G65 dry sand rubber wheel abrasion test
74.
Automated Synthesis of Software-based Self-test
75.
automated test environment
76.
automated test pattern generation
77.
automatic test case generation
78.
automatic test pattern generation
79.
automatic test program generation
80.
Auvergne test-bed
81.
battery test
82.
behavioral test
83.
behaviour level test generation
84.
bending test
85.
bit-error rate test
86.
Board and System Test
87.
board test
88.
bounds test
89.
built-in self-test
90.
capillary condensation redistribution test
91.
chi-square test
92.
closed bottle test
93.
cognitive screening test
94.
compartment fire test
95.
compartment test
96.
cone penetration test (CPT)
97.
COVID-19 antigen test
98.
cutting test
99.
cybersecurity test bed
100.
DDR4 interconnect test
101.
design and test
102.
design-for-test
103.
deterministic test sequences
104.
diagnostic test
105.
digital test
106.
Digital test and testable design
107.
drawing test
108.
dry droplet antimicrobial test
109.
embedded test
110.
fan pressurisation test
111.
final test result prediction
112.
four-point bending test
113.
FPGA based test
114.
FPGA-Assisted Test
115.
FPGA-centric test
116.
functional self-test
117.
functional test generation
118.
Granger causality test
119.
hardness test
120.
Hierarchical Multi-level Test Generation
121.
high-level synthesis for test
122.
high-level test data generation
123.
highlevel test generation
124.
high-speed serial link test
125.
IEEE 9 bus test system
126.
implementation-independent test generation
127.
in situ tensile test in SEM
128.
industrial field test
129.
in-situ tensile test in SEM
130.
Johansen cointegration test
131.
Kolmogorov-Smirnov test
132.
load test
133.
logic built-in self-test
134.
Luria alternating series test
135.
Mann–Kendall test
136.
Mann-Kendall trend test
137.
memory interconnect test
138.
microprocessor test
139.
Model test
140.
multiplier test
141.
offline test generation
142.
orthogonal test
143.
package test analysis
144.
parallel design and test
145.
performance test
146.
piezocone penetration test (CPTu)
147.
Point Load Test index
148.
pressurisation test
149.
processor-centric board test
150.
progressive damage test
151.
provably correct test generation
152.
pseudo-exhaustive test
153.
purity test
154.
real-time room temperature test
155.
rolling thin film oven test
156.
rtioco-based timed test sequences
157.
seasonal Mann Kendall test
158.
seismic piezocone penetration test
159.
self-test
160.
self-test architectures
161.
sentence writing test
162.
serial sevens test
163.
ship towing test tank
164.
similar material simulation test
165.
small-scale fire test
166.
small‐scale test
167.
software based self-test
168.
software-based self-test
169.
software-based self-test (SBST)
170.
soil phosphorus (P) test
171.
standard test method
172.
static load test
173.
static-dynamic probing test (SDT)
174.
stress test
175.
system level test
176.
teaching design and test of systems
177.
tensile test
178.
tensile test
179.
test
180.
test and evaluation platform
181.
test automation
182.
test bench
183.
test coverage
184.
test driven development
185.
test driven modelling
186.
test embankment
187.
test equipment
188.
test generation
189.
test generation and fault diagnosis
190.
Test Group Generation for Detecting Multiple Faults
191.
test groups
192.
test model design
193.
test optimization
194.
test packets
195.
test path synthesis
196.
test patterns
197.
test point insertion
198.
test program generation
199.
test reference year
200.
test replication
201.
test scenario description language
202.
test-bed
203.
test-chips
204.
test-house
205.
test-pattern
206.
test-suite reduction
207.
Three-point bending test
208.
unit root test
209.
usability platform test
210.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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