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Board and System Test (keyword)
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1
book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
Number of records 1, displaying
1 - 1
keyword
148
1.
Board and System Test
2.
board test
3.
processor-centric board test
4.
IEEE 9 bus test system
5.
system level test
6.
board
7.
board composition
8.
board diagnosis
9.
board diversity
10.
board of directors
11.
Estonian Police and Border Guard Board (PPA)
12.
laminate embedded printed circuit board
13.
off-board charger
14.
off-board charger (OBC)
15.
off-board chargers
16.
on-board charger (OBC)
17.
on-board chargers
18.
processor-centric board
19.
single board computer
20.
single-board computer
21.
accelerated shelf-life test
22.
adaptive test strategy generation
23.
antigen test
24.
ASTM G65 dry sand rubber wheel abrasion test
25.
automated test environment
26.
automated test pattern generation
27.
automatic test case generation
28.
automatic test pattern generation
29.
automatic test program generation
30.
Auvergne test-bed
31.
battery test
32.
behavioral test
33.
behaviour level test generation
34.
bending test
35.
bit-error rate test
36.
bounds test
37.
built-in self-test
38.
capillary condensation redistribution test
39.
chi-square test
40.
closed bottle test
41.
cognitive screening test
42.
compartment fire test
43.
compartment test
44.
cone penetration test (CPT)
45.
COVID-19 antigen test
46.
cutting test
47.
cybersecurity test bed
48.
DDR4 interconnect test
49.
design and test
50.
design-for-test
51.
deterministic test sequences
52.
diagnostic test
53.
digital test
54.
Digital test and testable design
55.
double-pulse test
56.
drawing test
57.
dry droplet antimicrobial test
58.
embedded test
59.
fan pressurisation test
60.
final test result prediction
61.
four-point bending test
62.
FPGA based test
63.
FPGA-Assisted Test
64.
FPGA-centric test
65.
functional self-test
66.
functional test generation
67.
Granger causality test
68.
hardness test
69.
high-level synthesis for test
70.
high-level test data generation
71.
highlevel test generation
72.
high-speed serial link test
73.
implementation-independent test generation
74.
in situ tensile test in SEM
75.
industrial field test
76.
in-situ tensile test in SEM
77.
Johansen cointegration test
78.
Kolmogorov-Smirnov test
79.
load test
80.
logic built-in self-test
81.
Luria alternating series test
82.
Mann–Kendall test
83.
memory interconnect test
84.
microprocessor test
85.
Model test
86.
multiplier test
87.
offline test generation
88.
orthogonal test
89.
package test analysis
90.
parallel design and test
91.
performance test
92.
piezocone penetration test (CPTu)
93.
Point Load Test index
94.
pressurisation test
95.
progressive damage test
96.
provably correct test generation
97.
pseudo-exhaustive test
98.
purity test
99.
rtioco-based timed test sequences
100.
seasonal Mann Kendall test
101.
seismic piezocone penetration test
102.
self-test
103.
self-test architectures
104.
sentence writing test
105.
serial sevens test
106.
ship towing test tank
107.
similar material simulation test
108.
small-scale fire test
109.
small‐scale test
110.
software based self-test
111.
software-based self-test
112.
software-based self-test (SBST)
113.
soil phosphorus (P) test
114.
standard test method
115.
static load test
116.
static-dynamic probing test (SDT)
117.
stress test
118.
teaching design and test of systems
119.
tensile test
120.
test
121.
test and evaluation platform
122.
test bench
123.
test coverage
124.
test driven development
125.
test driven modelling
126.
test embankment
127.
test equipment
128.
test generation
129.
test generation and fault diagnosis
130.
test groups
131.
test model design
132.
test optimization
133.
test packets
134.
test path synthesis
135.
test patterns
136.
test point insertion
137.
test program generation
138.
test reference year
139.
test replication
140.
test scenario description language
141.
test-bed
142.
test-chips
143.
test-house
144.
test-pattern
145.
test-suite reduction
146.
Three-point bending test
147.
unit root test
148.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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